Hierarchical nanotopographies and fractal fingerprints of Anopheles mosquito wing surfaces

IF 2.2 3区工程技术 Q1 MICROSCOPY

Micron Pub Date : 2025-09-02 DOI:10.1016/j.micron.2025.103914

Leandro Caio Correa Pinto , Glenda Quaresma Ramos , Robert Saraiva Matos , Abhijeet Das , Carlos Alberto Rodrigues Costa , Rosa Amélia Gonçalves Santana , Silvia Cássia Brandão Justiniano , Henrique Duarte da Fonseca Filho

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引用次数: 0

Abstract

This study investigates the nanoscale surface morphology of Anopheles darlingi and Anopheles aquasalis mosquito wings using Atomic Force Microscopy (AFM) and fractal analysis. High-resolution 3D AFM imaging revealed pronounced inter- and intra-species differences, with the ventral surface of An. darlingi (V-Ad) exhibiting the greatest roughness (Sq = 45.34 ± 3.20 nm) and height amplitude (Sz = 399.17 ± 65.46 nm), compared to the smoother dorsal surface of An. aquasalis (D-Aa, Sq = 23.54 ± 3.47 nm, Sz = 157.80 ± 17.91 nm). Spectral analysis via Fast Fourier Transform (FFT) and Hough transform identified directional anisotropy in An. darlingi, suggesting aligned nanostructures possibly related to aerodynamic or ecological adaptations. Monofractal analysis revealed that V-Ad surfaces had the highest Hurst coefficient (H = 0.96 ± 0.02), indicating persistent roughness, while dorsal surface of An. aquasalis (D-Aa) showed lower spatial correlation (H = 0.82 ± 0.03). These findings highlight functional nanostructural divergences among malaria vectors and underscore the utility of AFM and fractal descriptors in entomological and bioinspired materials research.

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按蚊翅膀表面的分层纳米形貌和分形指纹图谱

利用原子力显微镜（AFM）和分形分析对达林按蚊和水按蚊翅膀的纳米表面形貌进行了研究。高分辨率3D AFM成像显示了明显的种间和种内差异。与An相比，darlingi （V-Ad）表现出最大的粗糙度（Sq = 45.34 ± 3.20 nm）和高度振幅（Sz = 399.17 ± 65.46 nm）。aquasalis (D-Aa平方= 23.54 ±3.47  nm,深圳= 157.80 ±17.91  海里)。利用快速傅里叶变换（FFT）和霍夫变换进行频谱分析，确定了An的方向各向异性。Darlingi认为，排列的纳米结构可能与空气动力学或生态适应有关。单分形分析显示，V-Ad表面的Hurst系数最高（H = 0.96 ± 0.02），表明其表面持续粗糙；水仙（D-Aa）的空间相关性较低（H = 0.82 ± 0.03）。这些发现突出了疟疾载体之间的功能纳米结构差异，并强调了AFM和分形描述符在昆虫学和生物启发材料研究中的应用。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Micron 工程技术-显微镜技术

CiteScore

4.30

自引率

4.20%

发文量

100

审稿时长

31 days

期刊介绍： Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.