Xuecheng Zhang , Bin Zhang , Wenchao Meng , Yuefei Zhang , Xianjue Ye , Ze Zhang
{"title":"知识提炼的swin变压器在扫描电镜成像中有效去除振动伪影","authors":"Xuecheng Zhang , Bin Zhang , Wenchao Meng , Yuefei Zhang , Xianjue Ye , Ze Zhang","doi":"10.1016/j.micron.2025.103897","DOIUrl":null,"url":null,"abstract":"<div><div>This study addresses the challenge of removing vibration-induced horizontal stripe artifacts in Scanning Electron Microscopy (SEM) images, which degrade image fidelity and compromise quantitative analysis. The main contribution lies in the development of SwinIR-KD, a computationally efficient image restoration framework. This framework synergistically integrates the Swin Transformer architecture with knowledge distillation and a novel Horizontal Stripe Suppress Loss. Specifically, SwinIR-KD employs a lightweight student model, distilled from a larger pre-trained SwinIR teacher model, and incorporates architectural modifications to reduce complexity. A specialized loss function, combining reconstruction, distillation, and stripe suppression components, guides the training. Experimental results on an SEM speckle image dataset demonstrate that SwinIR-KD significantly reduces model parameters and computational complexity by approximately 79% compared to the baseline SwinIR, while achieving comparable or even superior image restoration performance in terms of PSNR, SSIM, FID, and LPIPS. Furthermore, SwinIR-KD effectively processes large-scale SEM images and is complemented by a user-friendly interface for practical application.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"199 ","pages":"Article 103897"},"PeriodicalIF":2.2000,"publicationDate":"2025-08-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Knowledge-distilled swin transformer for efficient vibration artifact removal in SEM imaging\",\"authors\":\"Xuecheng Zhang , Bin Zhang , Wenchao Meng , Yuefei Zhang , Xianjue Ye , Ze Zhang\",\"doi\":\"10.1016/j.micron.2025.103897\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>This study addresses the challenge of removing vibration-induced horizontal stripe artifacts in Scanning Electron Microscopy (SEM) images, which degrade image fidelity and compromise quantitative analysis. The main contribution lies in the development of SwinIR-KD, a computationally efficient image restoration framework. This framework synergistically integrates the Swin Transformer architecture with knowledge distillation and a novel Horizontal Stripe Suppress Loss. Specifically, SwinIR-KD employs a lightweight student model, distilled from a larger pre-trained SwinIR teacher model, and incorporates architectural modifications to reduce complexity. A specialized loss function, combining reconstruction, distillation, and stripe suppression components, guides the training. Experimental results on an SEM speckle image dataset demonstrate that SwinIR-KD significantly reduces model parameters and computational complexity by approximately 79% compared to the baseline SwinIR, while achieving comparable or even superior image restoration performance in terms of PSNR, SSIM, FID, and LPIPS. Furthermore, SwinIR-KD effectively processes large-scale SEM images and is complemented by a user-friendly interface for practical application.</div></div>\",\"PeriodicalId\":18501,\"journal\":{\"name\":\"Micron\",\"volume\":\"199 \",\"pages\":\"Article 103897\"},\"PeriodicalIF\":2.2000,\"publicationDate\":\"2025-08-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Micron\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0968432825001155\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"MICROSCOPY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Micron","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0968432825001155","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MICROSCOPY","Score":null,"Total":0}
Knowledge-distilled swin transformer for efficient vibration artifact removal in SEM imaging
This study addresses the challenge of removing vibration-induced horizontal stripe artifacts in Scanning Electron Microscopy (SEM) images, which degrade image fidelity and compromise quantitative analysis. The main contribution lies in the development of SwinIR-KD, a computationally efficient image restoration framework. This framework synergistically integrates the Swin Transformer architecture with knowledge distillation and a novel Horizontal Stripe Suppress Loss. Specifically, SwinIR-KD employs a lightweight student model, distilled from a larger pre-trained SwinIR teacher model, and incorporates architectural modifications to reduce complexity. A specialized loss function, combining reconstruction, distillation, and stripe suppression components, guides the training. Experimental results on an SEM speckle image dataset demonstrate that SwinIR-KD significantly reduces model parameters and computational complexity by approximately 79% compared to the baseline SwinIR, while achieving comparable or even superior image restoration performance in terms of PSNR, SSIM, FID, and LPIPS. Furthermore, SwinIR-KD effectively processes large-scale SEM images and is complemented by a user-friendly interface for practical application.
期刊介绍:
Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.