知识提炼的swin变压器在扫描电镜成像中有效去除振动伪影

IF 2.2 3区 工程技术 Q1 MICROSCOPY
Xuecheng Zhang , Bin Zhang , Wenchao Meng , Yuefei Zhang , Xianjue Ye , Ze Zhang
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引用次数: 0

摘要

本研究解决了消除扫描电子显微镜(SEM)图像中振动引起的水平条纹伪影的挑战,这些伪影会降低图像保真度并损害定量分析。主要贡献在于swinr - kd的开发,这是一个计算效率高的图像恢复框架。该框架协同集成了Swin变压器结构、知识蒸馏和一种新的水平条纹抑制损耗。具体来说,SwinIR- kd采用了一个轻量级的学生模型,从一个更大的预训练的SwinIR教师模型中提取出来,并结合了架构修改以降低复杂性。一个专门的损失函数,结合了重建,蒸馏和条纹抑制组件,指导训练。SEM散斑图像数据集的实验结果表明,与基线SwinIR相比,SwinIR- kd显著降低了模型参数和计算复杂度约79%,同时在PSNR、SSIM、FID和LPIPS方面实现了相当甚至更好的图像恢复性能。此外,swinr - kd有效地处理大规模SEM图像,并辅以用户友好的实际应用界面。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Knowledge-distilled swin transformer for efficient vibration artifact removal in SEM imaging
This study addresses the challenge of removing vibration-induced horizontal stripe artifacts in Scanning Electron Microscopy (SEM) images, which degrade image fidelity and compromise quantitative analysis. The main contribution lies in the development of SwinIR-KD, a computationally efficient image restoration framework. This framework synergistically integrates the Swin Transformer architecture with knowledge distillation and a novel Horizontal Stripe Suppress Loss. Specifically, SwinIR-KD employs a lightweight student model, distilled from a larger pre-trained SwinIR teacher model, and incorporates architectural modifications to reduce complexity. A specialized loss function, combining reconstruction, distillation, and stripe suppression components, guides the training. Experimental results on an SEM speckle image dataset demonstrate that SwinIR-KD significantly reduces model parameters and computational complexity by approximately 79% compared to the baseline SwinIR, while achieving comparable or even superior image restoration performance in terms of PSNR, SSIM, FID, and LPIPS. Furthermore, SwinIR-KD effectively processes large-scale SEM images and is complemented by a user-friendly interface for practical application.
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来源期刊
Micron
Micron 工程技术-显微镜技术
CiteScore
4.30
自引率
4.20%
发文量
100
审稿时长
31 days
期刊介绍: Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.
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