Bulk uniaxial crystal stray field images modeling based on the magnetic force microscopy experimental data

IF 2.2 3区 工程技术 Q1 MICROSCOPY
A.I. Sinkevich, S.D. Smetannikova, E.M. Semenova
{"title":"Bulk uniaxial crystal stray field images modeling based on the magnetic force microscopy experimental data","authors":"A.I. Sinkevich,&nbsp;S.D. Smetannikova,&nbsp;E.M. Semenova","doi":"10.1016/j.micron.2025.103911","DOIUrl":null,"url":null,"abstract":"<div><div>Magnetic force microscopy is a state-of-the-art high-resolution method of magnetic domain structure stray field investigation. Bulk uniaxial crystals with a branched domain structure are characterized by a stray field that changes rapidly with increasing distance from the sample surface. For such structures, it is most important to obtain magnetic force images at the lowest achievable tip-sample lift height <em>z</em> value. Present paper discusses an algorithm for experimental images processing. The algorithm results in modeled images at any lift height <em>z</em>, including the surface domain structure image (<em>z</em> = 0). It contains new information about additional domains and can be used for the most correct estimation of domain structure parameters and micromagnetic analysis. In addition, the spatial distribution of the tip-sample interaction force and energy can be calculated, and a statistical analysis of the structure complexity can be performed based on the results obtained.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"199 ","pages":"Article 103911"},"PeriodicalIF":2.2000,"publicationDate":"2025-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Micron","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0968432825001295","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MICROSCOPY","Score":null,"Total":0}
引用次数: 0

Abstract

Magnetic force microscopy is a state-of-the-art high-resolution method of magnetic domain structure stray field investigation. Bulk uniaxial crystals with a branched domain structure are characterized by a stray field that changes rapidly with increasing distance from the sample surface. For such structures, it is most important to obtain magnetic force images at the lowest achievable tip-sample lift height z value. Present paper discusses an algorithm for experimental images processing. The algorithm results in modeled images at any lift height z, including the surface domain structure image (z = 0). It contains new information about additional domains and can be used for the most correct estimation of domain structure parameters and micromagnetic analysis. In addition, the spatial distribution of the tip-sample interaction force and energy can be calculated, and a statistical analysis of the structure complexity can be performed based on the results obtained.
基于磁力显微镜实验数据的体单轴晶体杂散场图像建模
磁力显微镜是一种高分辨率的磁畴结构杂散场研究方法。具有支链结构的大块单轴晶体的杂散场随距离样品表面的增加而迅速变化。对于这种结构,最重要的是获得在可达到的最低尖端样品提升高度z值下的磁力图像。本文讨论了一种实验图像处理算法。该算法得到任意升力高度z的模型图像,包括表面域结构图像(z = 0)。它包含了额外畴的新信息,可用于最正确的畴结构参数估计和微磁分析。此外,还可以计算出尖端-样品相互作用力和能量的空间分布,并根据所得结果对结构复杂性进行统计分析。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
Micron
Micron 工程技术-显微镜技术
CiteScore
4.30
自引率
4.20%
发文量
100
审稿时长
31 days
期刊介绍: Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信