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2008 European Conference on Radiation and Its Effects on Components and Systems最新文献

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SEU effects on static and clocked cascade voltage switch logic (CVSL) circuits SEU对静态和时钟级联电压开关逻辑电路的影响
2008 European Conference on Radiation and Its Effects on Components and Systems Pub Date : 2008-09-01 DOI: 10.1109/RADECS.2008.5782699
H. Hatano
{"title":"SEU effects on static and clocked cascade voltage switch logic (CVSL) circuits","authors":"H. Hatano","doi":"10.1109/RADECS.2008.5782699","DOIUrl":"https://doi.org/10.1109/RADECS.2008.5782699","url":null,"abstract":"In order to design radiation-hardened LSIs for space applications, single event transient upset effects on cascade voltage switch logic (CVSL) circuits have been investigated using SPICE. Static and clocked CVSL test circuits have been successfully fabricated utilizing a double polysilicon double metal N-well CMOS technology. The both CVSL circuits have been confirmed to function correctly by the fabricated chip measurements. SET simulation results have confirmed that the CVSL circuits have high SET immunity. SET immunity for the CVSL circuits is compared to that for the conventional CMOS circuits, showing that the CVSL is a candidate for a SET immune spaceborne logic circuit. Furthermore, the static CVSL and clocked CVSL are compared.","PeriodicalId":173369,"journal":{"name":"2008 European Conference on Radiation and Its Effects on Components and Systems","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127219986","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Using FLIPPER to predict irradiation results for VIRTEX 2 devices 使用FLIPPER预测VIRTEX 2装置的辐照结果
2008 European Conference on Radiation and Its Effects on Components and Systems Pub Date : 2008-09-01 DOI: 10.1109/RADECS.2008.5782731
M. Alderighi, F. Casini, M. Citterio, S. D'Angelo, M. Mancini, S. Pastore, G. Sechi, G. Sorrenti
{"title":"Using FLIPPER to predict irradiation results for VIRTEX 2 devices","authors":"M. Alderighi, F. Casini, M. Citterio, S. D'Angelo, M. Mancini, S. Pastore, G. Sechi, G. Sorrenti","doi":"10.1109/RADECS.2008.5782731","DOIUrl":"https://doi.org/10.1109/RADECS.2008.5782731","url":null,"abstract":"The comparison between FLIPPER fault injection experiment and radiation ground-testing on selected SRAM-FPGA designs is presented in the paper. The excellent agreement represents a significant achievement toward the validation of the FLIPPER platform.","PeriodicalId":173369,"journal":{"name":"2008 European Conference on Radiation and Its Effects on Components and Systems","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116004854","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Assessing and mitigating radiation effects in Xilinx SRAM FPGAs Xilinx SRAM fpga中辐射效应的评估和缓解
2008 European Conference on Radiation and Its Effects on Components and Systems Pub Date : 2008-09-01 DOI: 10.1109/RADECS.2008.5782755
P. Adell, G. Allen, G. Swift, S. McClure
{"title":"Assessing and mitigating radiation effects in Xilinx SRAM FPGAs","authors":"P. Adell, G. Allen, G. Swift, S. McClure","doi":"10.1109/RADECS.2008.5782755","DOIUrl":"https://doi.org/10.1109/RADECS.2008.5782755","url":null,"abstract":"This work intends to help designers assess and mitigate radiation effects in systems that use SRAM-based FPGAs. Several methodologies combining experimental procedure, mitigation strategies and technical aspects are discussed.","PeriodicalId":173369,"journal":{"name":"2008 European Conference on Radiation and Its Effects on Components and Systems","volume":"131 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132449097","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 59
Robustness analysis of soft error accumulation in SRAM-FPGAs using FLIPPER and STAR/RoRA 基于FLIPPER和STAR/RoRA的sram - fpga软误差累积鲁棒性分析
2008 European Conference on Radiation and Its Effects on Components and Systems Pub Date : 2008-09-01 DOI: 10.1109/RADECS.2008.5782703
M. Alderighi, F. Casini, S. D'Angelo, M. Mancini, D. Merodio Codinachs, S. Pastore, G. Sorrenti, L. Sterpone, R. Weigand, M. Violante
{"title":"Robustness analysis of soft error accumulation in SRAM-FPGAs using FLIPPER and STAR/RoRA","authors":"M. Alderighi, F. Casini, S. D'Angelo, M. Mancini, D. Merodio Codinachs, S. Pastore, G. Sorrenti, L. Sterpone, R. Weigand, M. Violante","doi":"10.1109/RADECS.2008.5782703","DOIUrl":"https://doi.org/10.1109/RADECS.2008.5782703","url":null,"abstract":"We describe a methodology for analyzing the robustness of circuits implemented by SRAM-based FPGAs against the accumulation of soft errors within the configuration memory. A detailed analysis of the fault injection data is presented.","PeriodicalId":173369,"journal":{"name":"2008 European Conference on Radiation and Its Effects on Components and Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126714887","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Smart behavioral netlist simulation for SEU protection verification 基于SEU保护验证的智能行为网络仿真
2008 European Conference on Radiation and Its Effects on Components and Systems Pub Date : 2008-09-01 DOI: 10.1109/RADECS.2008.5782753
S. Schulz, G. Beltrame, D. Merodio-Codinachs
{"title":"Smart behavioral netlist simulation for SEU protection verification","authors":"S. Schulz, G. Beltrame, D. Merodio-Codinachs","doi":"10.1109/RADECS.2008.5782753","DOIUrl":"https://doi.org/10.1109/RADECS.2008.5782753","url":null,"abstract":"This paper presents a novel approach to verify the correct implementation of Triple Modular Redundancy (TMR) for the memory elements of a given netlist using formal analysis. The purpose is detecting any issues that might incur during the use of automatic tools for TMR insertion, optimization, place and route, etc. Our analysis does not require a testbench and can perform full, exhaustive coverage within less than an hour even for large designs. This is achieved by applying a divide et impera approach, splitting the circuit into smaller submodules without loss of generality, instead of applying formal verification to the whole netlist at once. The methodology has been applied to a production netlist of the LEON2-FT processor that reported errors during radiation testing, successfully showing its TMR implementation issues.","PeriodicalId":173369,"journal":{"name":"2008 European Conference on Radiation and Its Effects on Components and Systems","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129424301","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
2008 update to the ELDRS bipolar linear circuit data compendium 2008年更新的ELDRS双极线性电路数据纲要
2008 European Conference on Radiation and Its Effects on Components and Systems Pub Date : 2008-09-01 DOI: 10.1109/RADECS.2008.5782687
R. Pease
{"title":"2008 update to the ELDRS bipolar linear circuit data compendium","authors":"R. Pease","doi":"10.1109/RADECS.2008.5782687","DOIUrl":"https://doi.org/10.1109/RADECS.2008.5782687","url":null,"abstract":"Enhanced low dose rate sensitive (ELDRS) data on bipolar linear circuits published since 2001 have been reviewed for this update to the ELDRS data compendia published in 1996 and 2001.","PeriodicalId":173369,"journal":{"name":"2008 European Conference on Radiation and Its Effects on Components and Systems","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126836555","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Mitigating soft errors in SRAM-based FPGAs by using large grain TMR with selective partial reconfiguration 采用选择性部分重构的大粒度TMR技术减轻基于sram的fpga软误差
2008 European Conference on Radiation and Its Effects on Components and Systems Pub Date : 2008-09-01 DOI: 10.1109/RADECS.2008.5782729
J. Azambuja, C. Pilotto, F. Kastensmidt
{"title":"Mitigating soft errors in SRAM-based FPGAs by using large grain TMR with selective partial reconfiguration","authors":"J. Azambuja, C. Pilotto, F. Kastensmidt","doi":"10.1109/RADECS.2008.5782729","DOIUrl":"https://doi.org/10.1109/RADECS.2008.5782729","url":null,"abstract":"This work presents a method that allows dynamic partial reconfiguration with triple modular redundancy in SRAM-based FPGAs fault-tolerant designs. Experimental results show reduced time and energy in fault recovery compared to XTMR with scrubbing.","PeriodicalId":173369,"journal":{"name":"2008 European Conference on Radiation and Its Effects on Components and Systems","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116057487","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Session G. Hardness Assurance G.硬度保证
2008 European Conference on Radiation and Its Effects on Components and Systems Pub Date : 2008-09-01 DOI: 10.1109/RADECS.2008.5782747
R. Mangeret
{"title":"Session G. Hardness Assurance","authors":"R. Mangeret","doi":"10.1109/RADECS.2008.5782747","DOIUrl":"https://doi.org/10.1109/RADECS.2008.5782747","url":null,"abstract":"","PeriodicalId":173369,"journal":{"name":"2008 European Conference on Radiation and Its Effects on Components and Systems","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129876915","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Single-Event Upsets in photodiodes for multi-Gb/s data transmission 用于多gb /s数据传输的光电二极管中的单事件干扰
2008 European Conference on Radiation and Its Effects on Components and Systems Pub Date : 2008-09-01 DOI: 10.1109/RADECS.2008.5782696
A. Pacheco, J. Troska, L. Amaral, S. Dris, D. Ricci, C. Sigaud, F. Vasey, P. Vichoudis
{"title":"Single-Event Upsets in photodiodes for multi-Gb/s data transmission","authors":"A. Pacheco, J. Troska, L. Amaral, S. Dris, D. Ricci, C. Sigaud, F. Vasey, P. Vichoudis","doi":"10.1109/RADECS.2008.5782696","DOIUrl":"https://doi.org/10.1109/RADECS.2008.5782696","url":null,"abstract":"A Single-Event Upset study has been carried out on PIN photodiodes from a range of manufacturers. A total of 22 devices of eleven types from six vendors were exposed to a beam of 63 MeV protons. The angle of incidence of the proton beam was varied between normal and grazing incidence for three data-rates (1.5, 2.0 and 2.5 Gb/s). We report on the cross-sections measured as well as on the detailed statistics of the interactions that we measured using novel functionalities in a custom-designed Bit Error Rate Tester. We have observed upsets lasting for multiple bit periods and have measured, over a large range of input optical power, a small fraction of errors in which an upset causes a transmitted zero to be detected as a one at the receiver.","PeriodicalId":173369,"journal":{"name":"2008 European Conference on Radiation and Its Effects on Components and Systems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129471381","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Modeling the effects of broadening and degradation of single event transient pulses in integrated circuits 集成电路中单事件瞬态脉冲的展宽和衰减效应建模
2008 European Conference on Radiation and Its Effects on Components and Systems Pub Date : 2008-09-01 DOI: 10.1109/RADECS.2008.5782710
I. Ribeiro, G. Wirth, F. Kastensmidt
{"title":"Modeling the effects of broadening and degradation of single event transient pulses in integrated circuits","authors":"I. Ribeiro, G. Wirth, F. Kastensmidt","doi":"10.1109/RADECS.2008.5782710","DOIUrl":"https://doi.org/10.1109/RADECS.2008.5782710","url":null,"abstract":"We compare the behavior of transient pulse propagation from laser testing presented in with electrical simulations, and present an analytical model that considers SET broadening and degradation in integrated circuits.","PeriodicalId":173369,"journal":{"name":"2008 European Conference on Radiation and Its Effects on Components and Systems","volume":"323 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132507408","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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