Xilinx SRAM fpga中辐射效应的评估和缓解

2008 European Conference on Radiation and Its Effects on Components and Systems Pub Date : 2008-09-01 DOI:10.1109/RADECS.2008.5782755

P. Adell, G. Allen, G. Swift, S. McClure

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引用次数: 59

摘要

这项工作旨在帮助设计人员评估和减轻使用基于sram的fpga系统中的辐射影响。讨论了结合实验程序、缓解策略和技术方面的几种方法。

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Assessing and mitigating radiation effects in Xilinx SRAM FPGAs

This work intends to help designers assess and mitigate radiation effects in systems that use SRAM-based FPGAs. Several methodologies combining experimental procedure, mitigation strategies and technical aspects are discussed.

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来源期刊

2008 European Conference on Radiation and Its Effects on Components and Systems

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