采用选择性部分重构的大粒度TMR技术减轻基于sram的fpga软误差

2008 European Conference on Radiation and Its Effects on Components and Systems Pub Date : 2008-09-01 DOI:10.1109/RADECS.2008.5782729

J. Azambuja, C. Pilotto, F. Kastensmidt

{"title":"采用选择性部分重构的大粒度TMR技术减轻基于sram的fpga软误差","authors":"J. Azambuja, C. Pilotto, F. Kastensmidt","doi":"10.1109/RADECS.2008.5782729","DOIUrl":null,"url":null,"abstract":"This work presents a method that allows dynamic partial reconfiguration with triple modular redundancy in SRAM-based FPGAs fault-tolerant designs. Experimental results show reduced time and energy in fault recovery compared to XTMR with scrubbing.","PeriodicalId":173369,"journal":{"name":"2008 European Conference on Radiation and Its Effects on Components and Systems","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Mitigating soft errors in SRAM-based FPGAs by using large grain TMR with selective partial reconfiguration\",\"authors\":\"J. Azambuja, C. Pilotto, F. Kastensmidt\",\"doi\":\"10.1109/RADECS.2008.5782729\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work presents a method that allows dynamic partial reconfiguration with triple modular redundancy in SRAM-based FPGAs fault-tolerant designs. Experimental results show reduced time and energy in fault recovery compared to XTMR with scrubbing.\",\"PeriodicalId\":173369,\"journal\":{\"name\":\"2008 European Conference on Radiation and Its Effects on Components and Systems\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 European Conference on Radiation and Its Effects on Components and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RADECS.2008.5782729\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 European Conference on Radiation and Its Effects on Components and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS.2008.5782729","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 6

摘要

这项工作提出了一种在基于sram的fpga容错设计中允许具有三模冗余的动态部分重构的方法。实验结果表明，与带洗涤的XTMR相比，故障恢复的时间和能量大大减少。

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Mitigating soft errors in SRAM-based FPGAs by using large grain TMR with selective partial reconfiguration

This work presents a method that allows dynamic partial reconfiguration with triple modular redundancy in SRAM-based FPGAs fault-tolerant designs. Experimental results show reduced time and energy in fault recovery compared to XTMR with scrubbing.

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来源期刊

2008 European Conference on Radiation and Its Effects on Components and Systems

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