M. Alderighi, F. Casini, M. Citterio, S. D'Angelo, M. Mancini, S. Pastore, G. Sechi, G. Sorrenti
{"title":"使用FLIPPER预测VIRTEX 2装置的辐照结果","authors":"M. Alderighi, F. Casini, M. Citterio, S. D'Angelo, M. Mancini, S. Pastore, G. Sechi, G. Sorrenti","doi":"10.1109/RADECS.2008.5782731","DOIUrl":null,"url":null,"abstract":"The comparison between FLIPPER fault injection experiment and radiation ground-testing on selected SRAM-FPGA designs is presented in the paper. The excellent agreement represents a significant achievement toward the validation of the FLIPPER platform.","PeriodicalId":173369,"journal":{"name":"2008 European Conference on Radiation and Its Effects on Components and Systems","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Using FLIPPER to predict irradiation results for VIRTEX 2 devices\",\"authors\":\"M. Alderighi, F. Casini, M. Citterio, S. D'Angelo, M. Mancini, S. Pastore, G. Sechi, G. Sorrenti\",\"doi\":\"10.1109/RADECS.2008.5782731\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The comparison between FLIPPER fault injection experiment and radiation ground-testing on selected SRAM-FPGA designs is presented in the paper. The excellent agreement represents a significant achievement toward the validation of the FLIPPER platform.\",\"PeriodicalId\":173369,\"journal\":{\"name\":\"2008 European Conference on Radiation and Its Effects on Components and Systems\",\"volume\":\"51 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 European Conference on Radiation and Its Effects on Components and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RADECS.2008.5782731\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 European Conference on Radiation and Its Effects on Components and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RADECS.2008.5782731","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Using FLIPPER to predict irradiation results for VIRTEX 2 devices
The comparison between FLIPPER fault injection experiment and radiation ground-testing on selected SRAM-FPGA designs is presented in the paper. The excellent agreement represents a significant achievement toward the validation of the FLIPPER platform.