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1995 IEEE International SOI Conference Proceedings最新文献

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Automatic statistical determination of dislocation density in production SOI substrates 生产SOI衬底中位错密度的自动统计测定
1995 IEEE International SOI Conference Proceedings Pub Date : 1995-10-03 DOI: 10.1109/SOI.1995.526446
L. Allen, A. Genis, C. Jacobs, S.M. Allen, M. Snorrason, G. Zacharias
{"title":"Automatic statistical determination of dislocation density in production SOI substrates","authors":"L. Allen, A. Genis, C. Jacobs, S.M. Allen, M. Snorrason, G. Zacharias","doi":"10.1109/SOI.1995.526446","DOIUrl":"https://doi.org/10.1109/SOI.1995.526446","url":null,"abstract":"Summarizes a successful prototype demonstration of an automatic etch pit counting system which employs a neural network program for dislocation identification over a wide exponential range required for SOI material analysis. Overall results indicate that the automatic dislocation counting system is feasible to employ in SIMOX manufacturing. The neural network system exhibited sufficient capability for accurate dislocation density analysis of both standard and thin BOX SIMOX material, with clear recognition and classification of enhanced silicon defects.","PeriodicalId":149490,"journal":{"name":"1995 IEEE International SOI Conference Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132161260","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Front and back gate interface-trap generation due to hot carrier stress in fully depleted SOI/MOSFETs 完全耗尽SOI/ mosfet中由于热载流子应力而产生的前后栅极界面陷阱
1995 IEEE International SOI Conference Proceedings Pub Date : 1995-10-03 DOI: 10.1109/SOI.1995.526457
Yujun Li, T. Ma
{"title":"Front and back gate interface-trap generation due to hot carrier stress in fully depleted SOI/MOSFETs","authors":"Yujun Li, T. Ma","doi":"10.1109/SOI.1995.526457","DOIUrl":"https://doi.org/10.1109/SOI.1995.526457","url":null,"abstract":"The analysis of hot-carrier induced degradation of SOI/MOSFETs is a complicated problem due to the dual channel and front-back coupling effect. Opinions vary as to whether hot-carrier stress of the front (or back) channel results in damage of the opposite channel. Most of the previous studies have used channel current or transconductance as the monitor of hot-carrier induced degradation in SOI/MOSFETs, which often does not allow clear separation between interface-trap generation and charge trapping at both interfaces. In this paper, by systematically examining the charge-pumping currents, junction recombination currents, static I/sub d/-V/sub g/ characteristics, and transconductance curves, we will demonstrate that the opposite channel is indeed damaged during channel hot-carrier (HC) stress, and this damage can be separated from the front-back coupling effect.","PeriodicalId":149490,"journal":{"name":"1995 IEEE International SOI Conference Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114193363","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effect of nitrogen and argon anneals on the leakage current of SIMOX TFSOI devices 氮气和氩气退火对SIMOX TFSOI器件泄漏电流的影响
1995 IEEE International SOI Conference Proceedings Pub Date : 1995-10-03 DOI: 10.1109/SOI.1995.526452
H. Shin, T. Wetteroth, S. Wilson, G. Harris, D. Schroder, W. Krull, M. Alles
{"title":"Effect of nitrogen and argon anneals on the leakage current of SIMOX TFSOI devices","authors":"H. Shin, T. Wetteroth, S. Wilson, G. Harris, D. Schroder, W. Krull, M. Alles","doi":"10.1109/SOI.1995.526452","DOIUrl":"https://doi.org/10.1109/SOI.1995.526452","url":null,"abstract":"High temperature annealing treatment is a critical step in SIMOX technology. Inert gases such as Ar or N/sub 2/ can be used during this anneal along with a small amount of oxygen. Characterization of TFSOI near-fully-depleted devices built on Ar and N/sub 2/ annealed SIMOX indicate that, in the N/sub 2/ annealed material, nitrogen atoms may become trapped at the SOI/BOX interface and cause excessive sub-threshold leakage in NMOS devices. This paper will discuss the effect of nitrogen on the device characteristics based on electrical and chemical measurements.","PeriodicalId":149490,"journal":{"name":"1995 IEEE International SOI Conference Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121326595","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Polarity dependence of gate oxide quality with SOI substrates SOI衬底栅氧化物质量的极性依赖性
1995 IEEE International SOI Conference Proceedings Pub Date : 1995-10-03 DOI: 10.1109/SOI.1995.526458
H. Tseng, P. Tobin, S. Hong
{"title":"Polarity dependence of gate oxide quality with SOI substrates","authors":"H. Tseng, P. Tobin, S. Hong","doi":"10.1109/SOI.1995.526458","DOIUrl":"https://doi.org/10.1109/SOI.1995.526458","url":null,"abstract":"Gate oxides grown on SIMOX wafers contain defects originating from the substrate. The defect-induced traps may cause a threshold voltage instability problem for SOI MOSFET devices as well as gate oxide reliability degradation. Therefore it is essential to study the effect of traps on gate oxide quality with SOI substrates. In this paper, different trap behavior near different electrodes is presented. We find that there are high density positive-charged traps near the poly gate electrode. In addition to the rough poly/Si0/sub 2/ interface, the existence of a high density of positive traps close to the poly/SiO/sub 2/ interface could further degrade the gate oxide reliability for gate injection polarity with SOI wafers.","PeriodicalId":149490,"journal":{"name":"1995 IEEE International SOI Conference Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121388730","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Tantalum-gate SOI MOSFET's featuring excellent threshold voltage control in low-power applications 钽栅极SOI MOSFET在低功耗应用中具有出色的阈值电压控制
1995 IEEE International SOI Conference Proceedings Pub Date : 1995-10-03 DOI: 10.1109/SOI.1995.526478
H. Shimada, T. Ushiki, Y. Hirano, T. Ohmi
{"title":"Tantalum-gate SOI MOSFET's featuring excellent threshold voltage control in low-power applications","authors":"H. Shimada, T. Ushiki, Y. Hirano, T. Ohmi","doi":"10.1109/SOI.1995.526478","DOIUrl":"https://doi.org/10.1109/SOI.1995.526478","url":null,"abstract":"In this paper it is successfully demonstrated that Ta-gate SOI MOSFETs have excellent threshold voltage control in 1V applications.","PeriodicalId":149490,"journal":{"name":"1995 IEEE International SOI Conference Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116536789","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Accumulation-type vs. inversion-type: narrow channel effect in VLSI mesa-isolated fully-depleted ultra-thin SOI PMOS devices 累积型与反转型:VLSI平台隔离全耗尽超薄SOI PMOS器件中的窄通道效应
1995 IEEE International SOI Conference Proceedings Pub Date : 1995-10-03 DOI: 10.1109/SOI.1995.526449
K. Su, J. Kuo
{"title":"Accumulation-type vs. inversion-type: narrow channel effect in VLSI mesa-isolated fully-depleted ultra-thin SOI PMOS devices","authors":"K. Su, J. Kuo","doi":"10.1109/SOI.1995.526449","DOIUrl":"https://doi.org/10.1109/SOI.1995.526449","url":null,"abstract":"The paper reports the sidewall-related narrow channel effect in mesa-isolated fully-depleted ultra-thin SOI inversion-type and accumulation-type PMOS devices. Based on the study, contrary to inversion-type devices, the threshold voltage of mesa-isolated ultra-thin SOI accumulation-type PMOS devices shrinks as the channel width scales down as a result of the buried-channel effect influenced by the sidewall via the buried oxide.","PeriodicalId":149490,"journal":{"name":"1995 IEEE International SOI Conference Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128333155","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Highly uniform SOI fabrication by applying voltage during KOH etching of bonded wafers 通过在键合晶圆的KOH蚀刻过程中施加电压来制造高度均匀的SOI
1995 IEEE International SOI Conference Proceedings Pub Date : 1995-10-03 DOI: 10.1109/SOI.1995.526459
A. Ogura
{"title":"Highly uniform SOI fabrication by applying voltage during KOH etching of bonded wafers","authors":"A. Ogura","doi":"10.1109/SOI.1995.526459","DOIUrl":"https://doi.org/10.1109/SOI.1995.526459","url":null,"abstract":"Presents a new technique for thinning SOI bonded wafers by applying voltage during KOH etching. The SOI surface is etched by KOH, and voltage is applied between the supporting substrate and etchant. As a result, etching stops automatically at a certain thickness corresponding to the applied voltage. Conventional MIS etch stopping requires an additional electrode at the SOI surface, and also requires an extra process to provide good ohmic contact at the electrode. Moreover, as it is difficult to apply uniform voltage over a large area SOI active layer, an area with a diameter of only several millimeters can be thinned uniformly. Other techniques, such as scanning of limited area plasma etching and other etch stopping techniques have been proposed to make thin uniform SOI bonded wafers. Most of these techniques, however, involve relatively expensive processes such as plasma thinning, epitaxy and ion implantation. This paper proposes a low-cost etch stopping process for bonded SOI that allows variation of less than /spl plusmn/0.1 /spl mu/m in 150mm /spl phi/ wafers.","PeriodicalId":149490,"journal":{"name":"1995 IEEE International SOI Conference Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130840626","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Buried WSi/sub x/ SOI structures 埋藏的WSi/ subx / SOI结构
1995 IEEE International SOI Conference Proceedings Pub Date : 1995-10-03 DOI: 10.1109/SOI.1995.526498
K. Yallup, R. Wilson, C. Quinn, B. McDonnell, S. Blackstone
{"title":"Buried WSi/sub x/ SOI structures","authors":"K. Yallup, R. Wilson, C. Quinn, B. McDonnell, S. Blackstone","doi":"10.1109/SOI.1995.526498","DOIUrl":"https://doi.org/10.1109/SOI.1995.526498","url":null,"abstract":"Tungsten silicide is a well know material used widely in the semiconductor industry, particularly for reducing the conductivity of polysilicon layers. A similar concept has been proposed for the reduction of buried layer resistance in bipolar and smart power circuits. This paper examines in detail the stability of a buried CVD WSi/sub x/ SOI structure and discusses the silicon microstructure as a function of temperature and doping of the layer, SIMS analysis of the silicon layer on top of the silicide layer, and etchability of the silicide layer. It is found that the silicide layer is stable to high temperature and remains intact. In addition it is shown that the SOI layer is not contaminated by the silicide layer. Electrical contact between the silicide layer is also established. Finally a trench etch process is presented which can pattern the film in a single step.","PeriodicalId":149490,"journal":{"name":"1995 IEEE International SOI Conference Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125550209","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Gettering layer formation in low-dose SIMOX wafers 低剂量SIMOX晶圆中吸积层的形成
1995 IEEE International SOI Conference Proceedings Pub Date : 1995-10-03 DOI: 10.1109/SOI.1995.526447
J. Jabłoński, M. Saito, M. Imai, S. Nakashima
{"title":"Gettering layer formation in low-dose SIMOX wafers","authors":"J. Jabłoński, M. Saito, M. Imai, S. Nakashima","doi":"10.1109/SOI.1995.526447","DOIUrl":"https://doi.org/10.1109/SOI.1995.526447","url":null,"abstract":"The mechanism of SFT generation in low-dose SIMOX wafers was analyzed. It was found that generation of these microdefects inside the top Si layer is strongly suppressed in comparison with those in the BOX. Moreover, both processes occur at different stages of high temperature annealing and thus can be controlled by the proper optimization of annealing conditions. As a result, it seems possible to produce SIMOX wafers with a defect-free top Si film and a gettering layer located beneath the BOX.","PeriodicalId":149490,"journal":{"name":"1995 IEEE International SOI Conference Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125563124","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Surface photovoltage monitoring of the Si-buried oxide interface charges 硅埋氧化物界面电荷的表面光电压监测
1995 IEEE International SOI Conference Proceedings Pub Date : 1995-10-03 DOI: 10.1109/SOI.1995.526456
K. Nauka, M. Cao, F. Assaderaghi
{"title":"Surface photovoltage monitoring of the Si-buried oxide interface charges","authors":"K. Nauka, M. Cao, F. Assaderaghi","doi":"10.1109/SOI.1995.526456","DOIUrl":"https://doi.org/10.1109/SOI.1995.526456","url":null,"abstract":"Shows that SPV can be employed for fast and reliable monitoring ofthe Si-BOX interfacial charges. Simulation ofthe 0.25 pm CMOS-SOI transistor indicated degradation ofthe subthreshold leakage when the charge density exceeded 2 * 10/sup 12/ cm-2. Further MOSFET miniaturization could lower the critical value of Q/sub Si-Box/ to the levels presently observed in SIMOX SOI wafers.","PeriodicalId":149490,"journal":{"name":"1995 IEEE International SOI Conference Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125048906","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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