Ahmad Afif Safwan Mohd Radzi, M. Rusop, S. Abdullah
{"title":"Optical Properties of Multilayer Porous Silicon with Different Fabrication Conditions for Application along Telecom Band","authors":"Ahmad Afif Safwan Mohd Radzi, M. Rusop, S. Abdullah","doi":"10.1109/SMELEC.2018.8481281","DOIUrl":"https://doi.org/10.1109/SMELEC.2018.8481281","url":null,"abstract":"Multilayer porous silicon structure was fabricated to study its optical response along the telecommunication band wavelength. The structure was fabricated using electrochemical etching technique. By modulating the etching parameters., different porosity layers can be achieved which will determine the refractive index value of each layer. Reflectance study was conducted to analyze the optical response for different fabrication thickness. Also the number of layers were set consistent at 40 layers for each sample for optimization. High degree of accuracy from thickness measurements achieved when comparing results from FESEM and Ellipsometer. Thicker layer films were determined to have higher reflectance along the C-band region which is very useful for communication application. Multilayer porous silicon has been studied for multiple optical devices and applications including Bragg grating waveguide., Fabry-Perot interferometers., photonic integrated circuit and optical gas sensor.","PeriodicalId":110608,"journal":{"name":"2018 IEEE International Conference on Semiconductor Electronics (ICSE)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134094027","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Kong Eng Ng, T. Y. Tiong, M. Mohamed, W. Chang, C. Dee, B. Majlis
{"title":"Synthesis of ZnO nanoflakes by 1064 nm Nd:YAG pulsed laser deposition in a horizontal tube furnace","authors":"Kong Eng Ng, T. Y. Tiong, M. Mohamed, W. Chang, C. Dee, B. Majlis","doi":"10.1109/SMELEC.2018.8481292","DOIUrl":"https://doi.org/10.1109/SMELEC.2018.8481292","url":null,"abstract":"In this research., a 1064 nm Nd:YAG laser with pulse duration of 8 ns was used to fire ZnO pellet in a furnace using 6 different energy densities. A substrate was placed above the ZnO target which was positioning at an angle of 45° within the frame of the target holder. ZnO nanoflakes were formed on the surface of ceramic., Al2O3substrate was placed upside down on a substrate holder. This simple modification on the substrate orientation has greatly reduced the deposition of useless debris on the substrate. High crystalline ZnO nanoflakes with diameter ranging from 30 to 100 nm were characterized by Field Emission Scanning Electron Microscope (FESEM). Three sharp peaks (100)., (002) and (101) characterized by X-Ray Diffraction (XRD) confirm the deposition of ZnO nanoflakes on the Al2O3substrate. The depositions were remarkable as it required only low tube-furnace vacuum of 3.9 Torr (5.2 mbar) without extra thermal source other than the heat generated by the laser itself.","PeriodicalId":110608,"journal":{"name":"2018 IEEE International Conference on Semiconductor Electronics (ICSE)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126107792","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. S. Ismail, M. H. Mamat, M. F. Malek, N. Azhar, N. H. Sulimai, R. A. Rani, A. Zoolfakar, M. Rusop
{"title":"Facile Synthesis of N-doped ZnO Nanorod Arrays: Towards Enhancing the UV-sensing Performance","authors":"A. S. Ismail, M. H. Mamat, M. F. Malek, N. Azhar, N. H. Sulimai, R. A. Rani, A. Zoolfakar, M. Rusop","doi":"10.1109/SMELEC.2018.8481321","DOIUrl":"https://doi.org/10.1109/SMELEC.2018.8481321","url":null,"abstract":"Nitrogen (N) doped zinc oxide (ZnO) nanorod arrays at different doping concentrations from 0 at.% (undoped) to 2 at. % have been prepared using sol-gel immerse method. FESEM images revealed that the average diameter increased when the concentration of N in ZnO increased. The 1-V measurement displayed that 1 at. % sample possessed the lowest resistance film and exhibit the highest UV sensing performance with sensitivity of 12.9.","PeriodicalId":110608,"journal":{"name":"2018 IEEE International Conference on Semiconductor Electronics (ICSE)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123337145","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Nurulhani Diana Rashid, D. Berhanuddin, M. Mahdi, B. Majlis, A. Zain
{"title":"Design and simulation of tapered optical fiber by enhancing the evanescent field region for sensing application","authors":"Nurulhani Diana Rashid, D. Berhanuddin, M. Mahdi, B. Majlis, A. Zain","doi":"10.1109/SMELEC.2018.8481202","DOIUrl":"https://doi.org/10.1109/SMELEC.2018.8481202","url":null,"abstract":"We report the design and simulation of the tapered optical fiber with large presence of the evanescent field. The evanescent field of the optical fiber is strongly affected by the surrounding environment which will be exploited into fabricating variety of photonic-based devices such as photodetectors, optical sensors and ultra-high Q resonators. The simulation results show that by adiabatically tapered the waist region, there is a fairly large amount of evanescent field intensity observed at the air-cladding region. The smooth transition region of the tapered fiber has also minimized the multimode interference in the waist and transition region thus reducing the energy loss and contributing to the higher output power.","PeriodicalId":110608,"journal":{"name":"2018 IEEE International Conference on Semiconductor Electronics (ICSE)","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122732002","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. A. Ahmad, S. M. Md Ali, N. Kamal, Siti Raudzah Abdul Rahman, M. Othman
{"title":"Design of Phase Frequency Detector (PFD),Charge Pump (CP) and Programmable Frequency Divider for PLL in 0.18um CMOS Technology","authors":"A. A. Ahmad, S. M. Md Ali, N. Kamal, Siti Raudzah Abdul Rahman, M. Othman","doi":"10.1109/SMELEC.2018.8481309","DOIUrl":"https://doi.org/10.1109/SMELEC.2018.8481309","url":null,"abstract":"In this paper, a Phase Frequency Detector (PFD) Charge Pump (CP) and programmable frequency divider Phase Locked Loop (PLL) for Bluetooth Low Energy (BLE) are presented. It is implemented using 180nm CMOS technology. The programmable frequency divider consists of Dual Modulus Prescaler divide by 15/16, 7-Bit Programmable Counter (P), and 6-Bit Swallow Counter (S). The divider will operate between 2.4–2.48 GHz frequency with 40 channels frequency hopping. The design has been simulated with 1.8 Vdd and consumed 3.51mW power.","PeriodicalId":110608,"journal":{"name":"2018 IEEE International Conference on Semiconductor Electronics (ICSE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129288847","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Characterization of SOI Film Thickness, Oxide Thickness and Charges with C-V Measurement","authors":"K. Joseph, T. C. Lik, Niew Soon Huat","doi":"10.1109/SMELEC.2018.8481314","DOIUrl":"https://doi.org/10.1109/SMELEC.2018.8481314","url":null,"abstract":"Capacitance-Voltage measurement is a crucial method to characterize and study the behavior of the device. In this work, the capacitance voltage characteristics of a partially depleted Silicon-On-Insulator MOSFET were analyzed and discussed. The important parameters like the gate oxide thickness, buried oxide thickness, silicon film thickness, fixed oxide charges and interface trapped charges were extracted from the capacitance voltage between the front gate and drain/source at different back gate voltage. The measured results were in good agreement with inline and XSEM result. The frequency dependency on the result is also observed and discussed in this paper.","PeriodicalId":110608,"journal":{"name":"2018 IEEE International Conference on Semiconductor Electronics (ICSE)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124201239","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
L. Theng, I. Yahya, M. A. Mohamed, Mahamad Fariz Mohamad Taib
{"title":"First Principle Study of Graphene-Carbon Nanotubes Hybrid (GCH) Structure for Advanced Nanoelectronics Devices","authors":"L. Theng, I. Yahya, M. A. Mohamed, Mahamad Fariz Mohamad Taib","doi":"10.1109/SMELEC.2018.8481215","DOIUrl":"https://doi.org/10.1109/SMELEC.2018.8481215","url":null,"abstract":"Although graphene and carbon nanotubes (CNT) exhibit remarkable electronic and mechanical properties, these two carbon allotropes face limitations due to their nanoscale size. The combination of graphene and CNT are suggested to overcome the problem of bundling and stacking in CNT and graphene which limit their performance. First principle study is carried out on the electronic properties of graphene-carbon nanotubes hybrid (GCH) structure using BIOVIA Material Studio software. Density Functional Theory (DFT) is used to calculate its band structure and density of states. The results show that when semiconducting CNT combine with graphene, its band gap is reduced compare to the pristine CNT. However, when metallic CNT is combine with graphene, the changes in band gap is depend on CNT's chirality. Chiral CNT will decrease the band gap of GCH, zigzag CNT causes not much changes in its GCH, while armchair CNT will increase the band gap of its GCH. Therefore, the result shows that it is possible to tune the band gap of GCH by combining graphene sheet with different type of CNT depending on our needs.","PeriodicalId":110608,"journal":{"name":"2018 IEEE International Conference on Semiconductor Electronics (ICSE)","volume":"143 9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126016670","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
N. A. A. Halim, S. K. Sahari, A. A. Hamzah, B. Majlis, S. Marini, L. Hasanah, M. Kashif
{"title":"Activation energy of thermal oxidation germanium oxide on germanium substrates","authors":"N. A. A. Halim, S. K. Sahari, A. A. Hamzah, B. Majlis, S. Marini, L. Hasanah, M. Kashif","doi":"10.1109/SMELEC.2018.8481204","DOIUrl":"https://doi.org/10.1109/SMELEC.2018.8481204","url":null,"abstract":"The activation energy of GeO2 was studied by determining the oxide thickness versus temperature from lower to higher oxidation temperature in the range between 450°C and 600°C. It was found that a linear relationship can be obtained between oxidation time and oxide thickness for the oxidation temperature between 450 and 575°C while for the 600°C oxidation, a linear relationship can be obtained for the shorter oxidation time. The rate of oxidation increased until 0.55 and abruptly decreased after increasing oxidation temperature to 600°C which implies that the oxygen intermixing occurs during higher oxidation (600°C) rather that diffusion mechanism that leads to the lower activation energy.","PeriodicalId":110608,"journal":{"name":"2018 IEEE International Conference on Semiconductor Electronics (ICSE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131183106","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Integration Design of Wide-Dynamic-Range MEMS Magnetometer and Oscillator","authors":"Chao Song, K. Wen","doi":"10.1109/SMELEC.2018.8481282","DOIUrl":"https://doi.org/10.1109/SMELEC.2018.8481282","url":null,"abstract":"This paper presents a Lorentz current-based MEMS magnetometer integrated with MEMS oscillator. The auto capacitance offset calibration magnetometer can achieve a tunable sensitivity from 12 to 2.94×106 T/V and eliminate the capacitance mismatch caused by process variation under 0.084fF by SAR calibrator. The natural frequency of proposed differential oscillator is around 18.8 kHz, Q-factor of 183 under the bias voltage 20 V and at 760Torr ambient pressure. The proposed biasing method of oscillator obtains a frequency tuning range of 58510 ppm, resulting in a wide-dynamic-range which is about 107.8dB. FOM of the oscillator design is 4.75×1020 Hz2Ω2. The integrated magnetometer and oscillator is implemented in 1P6M ASIC compatible CMOS MEMS process.","PeriodicalId":110608,"journal":{"name":"2018 IEEE International Conference on Semiconductor Electronics (ICSE)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114649298","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Tunable Steep Slope MoS2 Transistor","authors":"N. Bhat","doi":"10.1109/SMELEC.2018.8481317","DOIUrl":"https://doi.org/10.1109/SMELEC.2018.8481317","url":null,"abstract":"The CMOS scaling is now facing serious fundamental and technological challenges resulting in diminishing performance and economic returns. The concurrent reduction in power consumption, an important aspect of scaling, has become difficult, because of the inability to reduce supply voltage below 1 V. This is primarily because the fundamental nature of charge transport governed by Boltzmann's statistics restricts the Sub-threshold Swing (SS, abruptness between OFF to ON transitions) of FETs to the thermionic limit of 60 mV/dec at room temperature. Hence, as we cram in more transistors into the same footprint, energy dissipation and heat management have become fundamental bottlenecks. Clearly, the road ahead needs breakthroughs in new materials and device design. In this talk, I will present a new device architecture to beat the Boltzmann limit. We demonstrate, for the first time, sub-thermionic transport through tunable Schottky contacts in dual gated MoS2 FETs. two device configurations the gate tunable thermionic tunnel transistor (GT3) and dynamic Vt and adaptable transport transistor (DVAT) are expounded. The GT3 transistor has the flexibility to operate either in the sub-thermionic tunnel regime, yielding steep SS<60 mV/dec OR thermionic high mobility regime. Combining the best of both tunnelling and thermionic regimes in the same operation cycle, the DVAT transistor, the closest to an ‘ideal transistor’, registers SS~29 mV/dec (3 dec) AND high mobility (100 cm2V-1s-1). This work is envisioned to pave a new path in the development of sub-thermionic, high performance FETs operating in the sub-0.5 V ‘green computing’ regime.","PeriodicalId":110608,"journal":{"name":"2018 IEEE International Conference on Semiconductor Electronics (ICSE)","volume":"179 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116173303","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}