2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)最新文献

筛选
英文 中文
Enhanced Loop Height Optimization for Complex Configuration on QFN Device QFN器件复杂配置的增强环路高度优化
2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC) Pub Date : 2020-12-02 DOI: 10.1109/EPTC50525.2020.9315109
A. Moreno, F. R. Gomez, E. Graycochea
{"title":"Enhanced Loop Height Optimization for Complex Configuration on QFN Device","authors":"A. Moreno, F. R. Gomez, E. Graycochea","doi":"10.1109/EPTC50525.2020.9315109","DOIUrl":"https://doi.org/10.1109/EPTC50525.2020.9315109","url":null,"abstract":"Wirebonding is one important and critical assembly process in semiconductor packaging responsible for providing electrical connections between the Silicon die and the external leads of the device. The process also brings along manufacturing challenges as the device becomes critical and complex. This paper is focused on the loop height optimization of a Quad-Flat No-leads (QFN) product due to its out of specification reading of less than $10 mumathrm{m}$ versus the actual minimum specification of $20 mu mathrm{m}$. Comprehensive wire loop optimization and characterization focused on the kink height parameter was done and a wirebonding configuration solution was formulated. Ultimately, the solution prevented low loop reject of wire that could touch or short-circuit with the die. Results revealed a significant improvement in the bump loop height with average measurement of $33 mumathrm{m}$, conforming to the $20 mumathrm{m}$ minimum specification. For future works, the configuration could be employed on packages with comparable construction and requirement.","PeriodicalId":6790,"journal":{"name":"2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)","volume":"157 1","pages":"182-184"},"PeriodicalIF":0.0,"publicationDate":"2020-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87933859","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Wafer Level Back to Back Hybrid Bonding for Multiple Wafer Stacking 用于多晶圆堆叠的晶圆级背对背混合键合
2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC) Pub Date : 2020-12-02 DOI: 10.1109/EPTC50525.2020.9315154
H. Li, M. Kawano, L. Ji, H. Ji, C. S. Lim
{"title":"Wafer Level Back to Back Hybrid Bonding for Multiple Wafer Stacking","authors":"H. Li, M. Kawano, L. Ji, H. Ji, C. S. Lim","doi":"10.1109/EPTC50525.2020.9315154","DOIUrl":"https://doi.org/10.1109/EPTC50525.2020.9315154","url":null,"abstract":"This paper describes the demonstration of a 4-layer wafer stack using a combination of face-to-face and back-to-back, wafer-to-wafer hybrid bonding process. Details of process flow, process characterization and challenges in multi-layer wafer stacking are included in this paper. Wafer warpage of different pattern density is simulated with 3D finite element analysis (FEA) model. Wafer bow results match with low warpage results of simulation. 4-layer wafer was stacked together without separation. The process development and improvement carries out.","PeriodicalId":6790,"journal":{"name":"2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)","volume":"55 1","pages":"468-471"},"PeriodicalIF":0.0,"publicationDate":"2020-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84750061","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Simulation Research on Integrated Shadow Mask in Fabrication of OLED Displays OLED显示器制造中集成荫罩的仿真研究
2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC) Pub Date : 2020-12-02 DOI: 10.1109/EPTC50525.2020.9315108
Zheng Feng, Licheng Wang, Li Liu, Kun Ma, Zhiwen Chen, Sheng Liu
{"title":"Simulation Research on Integrated Shadow Mask in Fabrication of OLED Displays","authors":"Zheng Feng, Licheng Wang, Li Liu, Kun Ma, Zhiwen Chen, Sheng Liu","doi":"10.1109/EPTC50525.2020.9315108","DOIUrl":"https://doi.org/10.1109/EPTC50525.2020.9315108","url":null,"abstract":"Evaporation of organic light-emitting materials is a crucial link in the OLED display manufacturing process. Integrated shadow mask is one of the key components that determine the quality of the vapor-deposited organic light-emitting materials. It has high processing accuracy, complicated manufacturing process, and high cost. Once the mask deforms and fails, it will seriously affect the quality of OLED displays and even produce waste products. The precision of the evaporation mask will directly affect the quality of evaporation products. Among them, there are normally three major parameters, including the thickness of evaporation mask plate, the number of evaporation orifice plates and the width of support structure. In this paper, we use Comsol to simulate the deformation of evaporation mask, and analyze the influence of thickness of evaporation mask, number of evaporation orifices and width of the support structure. The simulation results are compared to reported reults of the vapor deposition mask to verify the precision and provide reliable technical support for the optimization of the vapor deposition mask structure.","PeriodicalId":6790,"journal":{"name":"2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)","volume":"27 1","pages":"194-197"},"PeriodicalIF":0.0,"publicationDate":"2020-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87332526","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Thermal Characterization of 2.5D FCBGA for GPU Application GPU用2.5D FCBGA热特性研究
2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC) Pub Date : 2020-12-02 DOI: 10.1109/EPTC50525.2020.9315035
Tang-Yuan Chen, Bing-Yuan Huang
{"title":"Thermal Characterization of 2.5D FCBGA for GPU Application","authors":"Tang-Yuan Chen, Bing-Yuan Huang","doi":"10.1109/EPTC50525.2020.9315035","DOIUrl":"https://doi.org/10.1109/EPTC50525.2020.9315035","url":null,"abstract":"2.5D Integrated Circuit package is very important for high- performance applications. The shrinkage in package size, cost reduction and improving thermal performance are driving the development of 2.5D Integrated Circuit. The development of 2.5D technology faces the challenge of thermal path and new structure. The present study applied three-dimensional finite volume methods to simulate the thermal behavior and the allocation of hot spots in the 2.5D package. The results of molding analysis revealed that the thermal resistance between molding/non-molding and expose-die packaging would influence the manufacturability and reliability of the package. In order to reduce the thermal resistance of package and the die to die integration, a design monitoring the installation ratio between package and substrate were investigated. The results of simulation indicate that the power map is non-uniform. The hot spot occurs as the ratio of die/power is over 25 %. The designs of implementing a shielding of ASIC/HBM and interconnect structure of package/substrate improve the maximum power of 2.5D FCBGA about 35~40%. The results of numerical analysis indicate that the above mentioned advance 2.5D IC structure design would lead to better thermal dissipation. The enhancements in the thermal dissipation behaviors are ascribed to the thermal path and the appropriate hot spot location layout. The 2.5D Integrated Circuit package mechanism and the design guidance for engineering application will be presented and discussed in this paper.","PeriodicalId":6790,"journal":{"name":"2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)","volume":"14 1","pages":"479-482"},"PeriodicalIF":0.0,"publicationDate":"2020-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74884142","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Dual-band one-sided directional slot array antenna for 10GHz and 24GHz application 用于10GHz和24GHz应用的双频单面定向槽阵天线
2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC) Pub Date : 2020-12-02 DOI: 10.1109/EPTC50525.2020.9315070
Y. Yamashita, H. Kanaya
{"title":"Dual-band one-sided directional slot array antenna for 10GHz and 24GHz application","authors":"Y. Yamashita, H. Kanaya","doi":"10.1109/EPTC50525.2020.9315070","DOIUrl":"https://doi.org/10.1109/EPTC50525.2020.9315070","url":null,"abstract":"This paper presents a design of one-sided directional dual band slot array antenna for both 10GHz and 24GHz application. The antenna element is composed of a top metal, a dielectric substrate, and a bottom metal layer. This antenna is divided into a part corresponding to the upper X-band 2 array and to the lower K-band 4 array antenna. The antenna element is connected to the coplanar waveguide (CPW) feed line. From the simulation and measurement result of the return loss and antenna gain are presented in this paper. The peak gain of proposed antenna is 6.32 dBi at 9.6 GHz and 10.40 dBi at 24 GHz.","PeriodicalId":6790,"journal":{"name":"2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)","volume":"5 1","pages":"251-254"},"PeriodicalIF":0.0,"publicationDate":"2020-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85780869","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Numerical analysis of a MEMS sensor's deformation behavior considering dynamic moisture conditions 动态湿度条件下MEMS传感器变形特性的数值分析
2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC) Pub Date : 2020-12-02 DOI: 10.1109/EPTC50525.2020.9315091
Mahesh Yalagach, P. Fuchs, T. Antretter, Tao Qi, Markus Weber
{"title":"Numerical analysis of a MEMS sensor's deformation behavior considering dynamic moisture conditions","authors":"Mahesh Yalagach, P. Fuchs, T. Antretter, Tao Qi, Markus Weber","doi":"10.1109/EPTC50525.2020.9315091","DOIUrl":"https://doi.org/10.1109/EPTC50525.2020.9315091","url":null,"abstract":"Micro Electro Mechanical Semiconductors (MEMS) functionalities have been continuously extended during the last years, and they are applied in a wide range of industrial sectors, including the automotive, consumer electronics, and Internet of Things (IoT) markets. These MEMS sensor packages are a multi-materials composite system. The composite materials involved in MEMS sensor packages show significant effects like thermal expansion and hygroscopic swelling when exposed to environmental loads like temperature and moisture. Due to these effects, the MEMS sensing performance is affected. To understand the effects on sensing performance and mechanical behavior, an advanced simulation approach, “hygro-thermo-mechanical simulation,” needs to be accounted for. This approach considers not only the dynamic changes in temperature and moisture loads but also generalized solubility, which is a function of both temperature and saturated mass concentration. This numerical model helps in optimizing and understanding the sensing performance of the MEMS sensor packages.","PeriodicalId":6790,"journal":{"name":"2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)","volume":"12 1","pages":"380-385"},"PeriodicalIF":0.0,"publicationDate":"2020-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83923168","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
900 MHz ISM Band RF Energy Harvester for Powering ZigBee Module 用于ZigBee模块供电的900 MHz ISM频段射频能量采集器
2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC) Pub Date : 2020-12-02 DOI: 10.1109/EPTC50525.2020.9315076
M. Mansour, Shuya Yamamoto, M. Murakami, H. Kanaya
{"title":"900 MHz ISM Band RF Energy Harvester for Powering ZigBee Module","authors":"M. Mansour, Shuya Yamamoto, M. Murakami, H. Kanaya","doi":"10.1109/EPTC50525.2020.9315076","DOIUrl":"https://doi.org/10.1109/EPTC50525.2020.9315076","url":null,"abstract":"ZigBee wireless communication is used for data transmission between two entities. The power consumption of the unit might fall below a few mW. This energy can be provided by using the RF energy harvesting to wirelessly charge a supercapacitor mounted along with the device architecture. The proposed research work offers a significant solution for the battery replacement and tedious work of the circuit maintenance. A rectenna operating at 920 MHz frequency band is used to charge the supercapacitor with high energy levels that can reach up to a few orders of mW. The harvested energy is rectified by a voltage doubler rectifier configuration. The circuit performance is evaluated, tested, and validated to show the agreement between simulation and measurement data. The system shows that the rectenna can provide at least 3 V for the sustainable operation of the ZigBee module. The connection is programmed to initialize every 5-10 seconds so the supercapacitor can re-charge back to the full capacity. The circuit is experimentally tested for continuous operation in a real environment for more than 24 hours.","PeriodicalId":6790,"journal":{"name":"2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)","volume":"74 1","pages":"156-158"},"PeriodicalIF":0.0,"publicationDate":"2020-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83217523","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Washability of Flexible Printed Circuitry for Wearable Electronics Applications 可穿戴电子应用中柔性印刷电路的可洗性
2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC) Pub Date : 2020-12-02 DOI: 10.1109/EPTC50525.2020.9315138
B. Salam, G. Soo, X. Shan, B. Lok
{"title":"Washability of Flexible Printed Circuitry for Wearable Electronics Applications","authors":"B. Salam, G. Soo, X. Shan, B. Lok","doi":"10.1109/EPTC50525.2020.9315138","DOIUrl":"https://doi.org/10.1109/EPTC50525.2020.9315138","url":null,"abstract":"Wearable electronics are predicted to be 60 billion dollars market by 2024, according to the recent 2020 International Data Corporation (IDC) news. Textile substrates are typically porous and hence the fabrication of electronic circuitry is by heat-transferred which initially was printed on a non-porous substrate such as heat transfer polymer (HTP). Such a fabrication process paved the way for developing new smart clothes. However, most of the developed smart wear clothes are still not practical as they cannot be washed. Therefore, in this study, the effect of the washing, such as water immersion and mechanical stress/bending, towards printed circuitries will be investigated. The test vehicles are silver and carbon circuitries on HTP-polyester and polyethylene terephthalate (PET)-based substrates. The test vehicle on PET serves as a reference. The test vehicles include printed heater patches. The heater patch consists of printed carbon in a rectangle shape and printed silver lines on the two sides. The resistance values of the circuitries were monitored before and after twisted and immersed in water. The results indicate that the effect of water immersion is significant. The resistive value in water could increase up to 12% and 2% for HTP and PET-based test vehicles, respectively. However, the increase in resistance is temporary.","PeriodicalId":6790,"journal":{"name":"2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)","volume":"35 1","pages":"207-209"},"PeriodicalIF":0.0,"publicationDate":"2020-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88873045","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
The Effect of Strip Argon Plasma Cleaning onto the PPF and Ag-plated Cu Leadframe Surfaces 带状氩等离子体清洗对PPF和镀银铜引线架表面的影响
2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC) Pub Date : 2020-12-02 DOI: 10.1109/EPTC50525.2020.9315017
Matthew M. Fernandez, Marty Lorgino D. Pulutan, A. Arano
{"title":"The Effect of Strip Argon Plasma Cleaning onto the PPF and Ag-plated Cu Leadframe Surfaces","authors":"Matthew M. Fernandez, Marty Lorgino D. Pulutan, A. Arano","doi":"10.1109/EPTC50525.2020.9315017","DOIUrl":"https://doi.org/10.1109/EPTC50525.2020.9315017","url":null,"abstract":"The effect of plasma power and plasma time parameters on the PPF and Ag-plated surfaces were successfully evaluated through surface characterization and leakage functional test. Surface characterization showed that the hydrophobic surface of PPF-plated and Ag-plated leadframes transformed into hydrophilic surface after application of different levels of plasma power and time which is an indication of improvement on wettability. Surface roughness showed that long exposure time can trigger further roughening of the PPF surface. Statistical analysis suggest that the plasma parameters should be kept at leg 6 (mid power, low time). Furthermore, leakage performance of the device showed that increasing the plasma time parameter affect the current leakage performance. Extreme conditions of plasma setting can result to re-deposition of unwanted elements on top of die due to over-etching. The recommended plasma parameter setting showed well-centered current distribution and zero occurrence of leakage failure.","PeriodicalId":6790,"journal":{"name":"2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)","volume":"98 1","pages":"127-129"},"PeriodicalIF":0.0,"publicationDate":"2020-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80684218","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Power Module on Copper Lead Frame with Novel Sintering Paste and SnSb solder 新型烧结浆料和SnSb焊料的铜引线框架电源模块
2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC) Pub Date : 2020-12-02 DOI: 10.1109/EPTC50525.2020.9315011
L. Wai, Kazunori Yamamoto, Simon Lim Siak Boon, T. Yue
{"title":"Power Module on Copper Lead Frame with Novel Sintering Paste and SnSb solder","authors":"L. Wai, Kazunori Yamamoto, Simon Lim Siak Boon, T. Yue","doi":"10.1109/EPTC50525.2020.9315011","DOIUrl":"https://doi.org/10.1109/EPTC50525.2020.9315011","url":null,"abstract":"Die attach and interconnect materials for power module device studied in this experiment included pressure-less sintering paste and SnSb solder. The initial evaluation on various pressure-less silver (Ag) sintering die attach pastes showed that type A paste doesn't form the void after cure, type B with void seen and type C paste has vertical vein likes void seen after oven cure. During copper clip attachment, undesired interconnect seen which caused short circuit between gate and source pads. The proper control during clip attachment was carried out, a good interconnect joint formation without short circuit between gate and source pads was achieved for both pressure-less Ag sintering paste and SnSb solder. Flux cleaning process assisted in removing flux residual on the SnSb reflowed samples.","PeriodicalId":6790,"journal":{"name":"2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)","volume":"115 1","pages":"302-306"},"PeriodicalIF":0.0,"publicationDate":"2020-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77965666","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信
小红书