2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)最新文献

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Evaluation and applications of 600V/650V enhancement-mode GaN devices 600V/650V增强型GaN器件的评价与应用
2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA) Pub Date : 2015-11-01 DOI: 10.1109/WIPDA.2015.7369318
Xiucheng Huang, Tao Liu, Bin Li, F. Lee, Qiang Li
{"title":"Evaluation and applications of 600V/650V enhancement-mode GaN devices","authors":"Xiucheng Huang, Tao Liu, Bin Li, F. Lee, Qiang Li","doi":"10.1109/WIPDA.2015.7369318","DOIUrl":"https://doi.org/10.1109/WIPDA.2015.7369318","url":null,"abstract":"This paper presents elaborate evaluation of 600V/650V enhancement mode gallium nitride (GaN) devices. The switching loss mechanism and the impact of package and driving circuit parameters are illustrated in detail. The hard-switching turn-on loss is dominant due to junction capacitor charge of the freewheeling switch. The turn-off loss is much smaller and it can be further improved by driving circuit parameters and packaging. The driving circuit taking consider of high dv/dt and di/dt immunity is discussed. A few design examples are shown to demonstrate the advantage of GaN and the impact of GaN on system design.","PeriodicalId":6538,"journal":{"name":"2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)","volume":"69 1","pages":"113-118"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86408357","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 41
Two year reliability validation of GaN power semiconductors in low voltage power electronics applications GaN功率半导体在低压电力电子应用中的两年可靠性验证
2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA) Pub Date : 2015-11-01 DOI: 10.1109/WIPDA.2015.7369268
Benjamin K. Rhea, Luke L. Jenkins, Frank T. Werner, William E. Abell, R. Dean
{"title":"Two year reliability validation of GaN power semiconductors in low voltage power electronics applications","authors":"Benjamin K. Rhea, Luke L. Jenkins, Frank T. Werner, William E. Abell, R. Dean","doi":"10.1109/WIPDA.2015.7369268","DOIUrl":"https://doi.org/10.1109/WIPDA.2015.7369268","url":null,"abstract":"This paper presents a reliability analysis of GaN HFETs under typical operating conditions. The GaN HFETs are operated in a low voltage point of load converter for two years of continuous operation. The power devices are regularly characterized to observe any component degradation, such as an increase in on-resistance or device failures. It is observed that the GaN HFETs undergo a phenomenon known as dynamic Rds(on) which is inherent to GaN HFETs. This effect is caused by a buildup of trapped electrons in the epitaxial layer over time. Over the course of two years of continuous operation, no other significant device degradation or failure has been observed. It is important to analyze reliability of GaN HFETs, as well as other WBG semiconductors, to promote industry adoption of these devices. The results presented show zero device failures and only minor performance degradation over the span of two years, and are promising for WBG semiconductor acceptance in the power industry.","PeriodicalId":6538,"journal":{"name":"2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)","volume":"10 1","pages":"206-209"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81903968","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Performance evaluation of series connected 1700V SiC MOSFET devices 串联1700V SiC MOSFET器件的性能评价
2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA) Pub Date : 2015-11-01 DOI: 10.1109/WIPDA.2015.7369327
K. Vechalapu, S. Bhattacharya, Eddy Aleoiza
{"title":"Performance evaluation of series connected 1700V SiC MOSFET devices","authors":"K. Vechalapu, S. Bhattacharya, Eddy Aleoiza","doi":"10.1109/WIPDA.2015.7369327","DOIUrl":"https://doi.org/10.1109/WIPDA.2015.7369327","url":null,"abstract":"The low voltage SiC (Silicon carbide) MOSFET (1.2 kV to 1.7 kV) increases the switching frequency limits of a power electronic converter several folds compared to low voltage Si IGBTs. Significant increase in efficiency and power density of voltage source converters can be achieved. However, for medium-voltage high-power converter applications Silicon (Si) devices (4.5 kV and 6.5 kV IGBT) are still dominant. To explore the capability of low voltage SiC devices for medium or high voltage applications, series connection of 1.7 kV/300 A SiC MOSFET modules has been investigated in this paper. A simple RC snubber method has been used for dynamic voltage sharing to offset the turn-off delays due to mismatch on device's characteristics and/or gate signals. Experimental switching characterization with different values of RC snubbers have been carried out to find the optimal RC snubber which gives minimum voltage sharing difference, snubber losses and total semiconductor losses. This paper also intends to show an optimization of the RC snubber for series connection of a limited number of 1.7kV SiC MOSFETs for 6 kV dc bus and for a generalized dc bus voltage.","PeriodicalId":6538,"journal":{"name":"2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)","volume":"61 1","pages":"184-191"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89026204","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 60
Channel mobility and threshold voltage characterization of 4H-SiC MOSFET with antimony channel implantation 掺杂锑沟道的4H-SiC MOSFET的沟道迁移率和阈值电压特性
2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA) Pub Date : 2015-11-01 DOI: 10.1109/WIPDA.2015.7369270
Yongju Zheng, T. Isaacs-smith, A. Ahyi, S. Dhar, P. Mooney
{"title":"Channel mobility and threshold voltage characterization of 4H-SiC MOSFET with antimony channel implantation","authors":"Yongju Zheng, T. Isaacs-smith, A. Ahyi, S. Dhar, P. Mooney","doi":"10.1109/WIPDA.2015.7369270","DOIUrl":"https://doi.org/10.1109/WIPDA.2015.7369270","url":null,"abstract":"In this work, we have investigated the effect of Antimony counter-doping in channel region of 4H-SiC MOSFETs with moderately doped p-body, relevant for power applications. Using this process, improved sub-threshold slope and high channel mobility have been achieved in conjunction with high threshold voltage. Our results indicate that the improvement in transport is associated with Sb donors close to the surface, which have negligible effect on interface trap density.","PeriodicalId":6538,"journal":{"name":"2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)","volume":"43 1","pages":"253-256"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81395319","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A discussion on the DC and switching performance of a gallium nitride CAVET for 1.2kV application 应用于1.2kV的氮化镓CAVET直流和开关性能的讨论
2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA) Pub Date : 2015-11-01 DOI: 10.1109/WIPDA.2015.7369308
D. Ji, S. Chowdhury
{"title":"A discussion on the DC and switching performance of a gallium nitride CAVET for 1.2kV application","authors":"D. Ji, S. Chowdhury","doi":"10.1109/WIPDA.2015.7369308","DOIUrl":"https://doi.org/10.1109/WIPDA.2015.7369308","url":null,"abstract":"A cascoded GaN Current Aperture Vertical Electron Transistor (CAVET), which incorporates a normally off low-voltage Si MOSFET at the input and a normally on high-voltage GaN CAVET at the output in a cascode form, has been simulated and analyzed using a device/circuit hybrid simulator implemented in Silvaco ATLAS. The hybrid simulator was achieved by integrating the Silvaco ATLAS based 2D drift-diffusion simulator with the SPICE based circuit simulator. This model provides a reliable method of evaluating GaN-based power transistor. A baseline of the hybrid simulator was first established using commercial cascoded GaN HEMT where a good agreement of simulated data and device specs as published on the datasheet was obtained. The hybrid simulator was then applied to compare SiC and GaN power devices using commercial MOSFET and JFET for SiC and a CAVET in GaN. A cascoded GaN CAVET has 2x faster switching time, 6x lower switching loss than standard commercial SiC MOSFET and JFET, suggesting its potential advantage over SiC devices for power converters. Another advantage of cascoded GaN CAVET is that it enables switches operating at frequencies of several hundreds of kilohertz with low power loss, which enable smaller converter size and high system efficiency.","PeriodicalId":6538,"journal":{"name":"2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)","volume":"574 1","pages":"174-179"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81511911","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Development of software to design passive filters for EMI suppression in SiC DC fed motor drives 开发用于SiC直流电机驱动中抑制电磁干扰的无源滤波器设计软件
2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA) Pub Date : 2015-11-01 DOI: 10.1109/WIPDA.2015.7369320
B. Narayanasamy, Hussam Jalanbo, F. Luo
{"title":"Development of software to design passive filters for EMI suppression in SiC DC fed motor drives","authors":"B. Narayanasamy, Hussam Jalanbo, F. Luo","doi":"10.1109/WIPDA.2015.7369320","DOIUrl":"https://doi.org/10.1109/WIPDA.2015.7369320","url":null,"abstract":"This paper proposes an EMI filter design software which can serve as an aid to the designer to quickly arrive at optimal filter sizes based on off-line measurement data or simulation results. The software covers different operating conditions-such as: different switching devices, different types of switching techniques, different load conditions and layout of the test setup. The proposed software design works for both silicon based and WBG based power converters.","PeriodicalId":6538,"journal":{"name":"2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)","volume":"61 1","pages":"230-235"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86474488","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
A SiC 8 Bit DAC at 400°C
2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA) Pub Date : 2015-11-01 DOI: 10.1109/WIPDA.2015.7369325
A. Rahman, S. Roy, R. Murphree, H. Mantooth, A. M. Francis, J. Holmes
{"title":"A SiC 8 Bit DAC at 400°C","authors":"A. Rahman, S. Roy, R. Murphree, H. Mantooth, A. M. Francis, J. Holmes","doi":"10.1109/WIPDA.2015.7369325","DOIUrl":"https://doi.org/10.1109/WIPDA.2015.7369325","url":null,"abstract":"This paper presents the first operational digital to analog converter at 400°C. The 8 bit R-2R ladder DAC was designed in the Raytheon 1.2 μm CMOS HiTSiC process. The data converter is also the first of its kind in SiC. It has been tested with a supply voltage between 12 V and 15 V, and reference voltages of 5 V to 8 V. At 400°C, the maximum measured differential non linearity (DNL) is 2 LSB (least significant bit) and the integral non linearity is 4.4 LSB.","PeriodicalId":6538,"journal":{"name":"2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)","volume":"40 1","pages":"241-246"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75946791","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
Monolithic integrated quasi-normally-off gate driver and 600 V GaN-on-Si HEMT 单片集成准常关栅极驱动器和600 V GaN-on-Si HEMT
2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA) Pub Date : 2015-11-01 DOI: 10.1109/WIPDA.2015.7369264
S. Moench, M. Costa, A. Barner, I. Kallfass, R. Reiner, B. Weiss, P. Waltereit, R. Quay, O. Ambacher
{"title":"Monolithic integrated quasi-normally-off gate driver and 600 V GaN-on-Si HEMT","authors":"S. Moench, M. Costa, A. Barner, I. Kallfass, R. Reiner, B. Weiss, P. Waltereit, R. Quay, O. Ambacher","doi":"10.1109/WIPDA.2015.7369264","DOIUrl":"https://doi.org/10.1109/WIPDA.2015.7369264","url":null,"abstract":"This work reports on a 600 V GaN-on-Si power transistor with monolithic integrated gate driver. The circuit is based on Schottky-gate depletion-mode technology and fabricated on a 2×3 mm2 chip. The push-pull gate driver stage implements a quasi-normally-off pull-up transistor, fabricated with monolithic integrated series-connected Schottky diodes for positive voltage-level shifting in the source path of a d-mode HEMT. The measured gate-source threshold voltage of the fabricated quasi-normally-off pull-up transistor is +2.7 V as compared to -2.9 V of the normally-on pull-down transistor. Pulsed-IV measurements determine an effective gate driver resistance of around 2 Ω. On-wafer measurements of the power transistor show low off-state leakage-currents up to 600 V blocking voltage with high wafer yield and 150 mΩ on-resistance. Finally, inductive-load switching measurements up to 450 V, 14.3 A show maximum switch node slew-rates during turn-on and turn-off transitions as high as 250 V/ns.","PeriodicalId":6538,"journal":{"name":"2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)","volume":"47 1","pages":"92-97"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73001882","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 25
Integrated SiC MOSFET module with ultra low parasitic inductance for noise free ultra high speed switching 集成SiC MOSFET模块,具有超低寄生电感,用于无噪声超高速开关
2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA) Pub Date : 2015-11-01 DOI: 10.1109/WIPDA.2015.7369296
Liqi Zhang, Suxuan Guo, Xuan Li, Yang Lei, Wensong Yu, A. Huang
{"title":"Integrated SiC MOSFET module with ultra low parasitic inductance for noise free ultra high speed switching","authors":"Liqi Zhang, Suxuan Guo, Xuan Li, Yang Lei, Wensong Yu, A. Huang","doi":"10.1109/WIPDA.2015.7369296","DOIUrl":"https://doi.org/10.1109/WIPDA.2015.7369296","url":null,"abstract":"A 1200V SiC MOSFET-gate driver integrated half-bridge (HB) module using direct bonded copper (DBC) substrate is designed and fabricated for noise free high frequency operation. The layout of the integrated module is carefully designed to eliminate the EMI problem under high switching speed. Due to the significantly reduced stray inductance, the external gate driver resistance can be chosen as zero to maximize the switching speed and reduce the switching loss. Double pulse switching of the standard TO-247 and the integrated module are tested to verify noise free operation of the module under high dI/dt and dV/dt conditions. A half bridge inverter utilizing the integrated module is tested at 510 kHz, 800V, 46Apk-pk. Experimental results show the proposed integrated module can be applied for ultra-high frequency applications.","PeriodicalId":6538,"journal":{"name":"2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)","volume":"76 1","pages":"224-229"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75158770","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 37
Switching and robustness analysis of 10 kV SiC BJTs 10kv SiC BJTs的开关及鲁棒性分析
2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA) Pub Date : 2015-11-01 DOI: 10.1109/WIPDA.2015.7369317
R. Singh, Stoyan Jeliazkov, B. Grummel, S. Sundaresan
{"title":"Switching and robustness analysis of 10 kV SiC BJTs","authors":"R. Singh, Stoyan Jeliazkov, B. Grummel, S. Sundaresan","doi":"10.1109/WIPDA.2015.7369317","DOIUrl":"https://doi.org/10.1109/WIPDA.2015.7369317","url":null,"abstract":"Collector-Emiter blocking voltages of 10.5 kV (91% of theoretical avalanche limit and 125 V/μm), on-resistance of 110 mΩ-cm2, which is close to the unipolar limit of 94 mΩ-cm2, and current gain as high as 75 are measured on 10 kV SiC BJTs. Monolithic Darlington-connected BJTs fabricated on the same wafer yield current gains as high as 3400, and show Si BJT-like output characteristics in the saturation region and a distinct quasi-saturation region. Switching measurements performed at a DC link voltage of 5 kV and collector current of 8 A feature a collector current rise time as low as 30 ns during turn-on and collector voltage recovery time as low as 100 ns during turn-off. Very low turn-on and turn-off switching energies of 4.2 mJ and 1.6 mJ, respectively, are extracted from the switching transients, which are 19 and 25 times smaller than the corresponding switching energies reported on 6.5 kV Si IGBTs. When turned-on to a short-circuited load at a collector bias of 4500 V, the 10 kV BJT shows a temperature-invariant, withstand time in excess of 20 μs. Leakage currents <; 1μA (system limit) are measured, even after 234 hours of operation under a DC collector bias of 5000 V at elevated temperatures.","PeriodicalId":6538,"journal":{"name":"2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)","volume":"2012 1","pages":"406-409"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73961148","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
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