Evaluation and applications of 600V/650V enhancement-mode GaN devices

Xiucheng Huang, Tao Liu, Bin Li, F. Lee, Qiang Li
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引用次数: 41

Abstract

This paper presents elaborate evaluation of 600V/650V enhancement mode gallium nitride (GaN) devices. The switching loss mechanism and the impact of package and driving circuit parameters are illustrated in detail. The hard-switching turn-on loss is dominant due to junction capacitor charge of the freewheeling switch. The turn-off loss is much smaller and it can be further improved by driving circuit parameters and packaging. The driving circuit taking consider of high dv/dt and di/dt immunity is discussed. A few design examples are shown to demonstrate the advantage of GaN and the impact of GaN on system design.
600V/650V增强型GaN器件的评价与应用
本文对600V/650V增强模式氮化镓器件进行了详细的评价。详细阐述了开关损耗机理以及封装和驱动电路参数对开关损耗的影响。由于任意开关的结电容电荷,硬开关导通损耗占主导地位。关断损耗要小得多,并且可以通过驱动电路参数和封装进一步改善。讨论了考虑高dv/dt和di/dt抗扰度的驱动电路。几个设计实例展示了氮化镓的优势和氮化镓对系统设计的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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