Microelectronics Reliability最新文献_第10页

Effect of PCB fastening method and thickness on PCB assembly vibration reliability in thermal environments

IF 1.6 4区工程技术

Microelectronics Reliability Pub Date : 2025-02-01 DOI: 10.1016/j.microrel.2024.115587

Fang Liu , Runze Gong , Zhongwei Duan , Zhen Wang , Jiacheng Zhou

{"title":"Effect of PCB fastening method and thickness on PCB assembly vibration reliability in thermal environments","authors":"Fang Liu , Runze Gong , Zhongwei Duan , Zhen Wang , Jiacheng Zhou","doi":"10.1016/j.microrel.2024.115587","DOIUrl":"10.1016/j.microrel.2024.115587","url":null,"abstract":"<div><div>The reliability of solder joints in board-level packaging has always been a research focus, but there is still insufficient research on board-level vibration reliability at service temperatures. This paper investigated the dynamic characteristics and fatigue life of printed circuit board (PCB) assemblies under different fastening methods (with or without plain washer) and board thicknesses in thermal environments. Firstly, effective finite element models were established for diverse PCB fastening methods and thicknesses at 24 °C and 60 °C, and these models were verified by modal experiments. Then, modal analysis and harmonic response analysis were conducted to investigate the effect of PCB fastening methods and thickness on the inherent characteristics of PCB assemblies. Finally, the stresses of solder joints were analyzed by isothermal random vibration simulations, and the three-band method was applied to predict the vibration fatigue life of the solder joints. The results show that the board fastening method and thickness significantly affect the inherent characteristics and vibration reliability of PCB assembly. The addition of plain washers increases the fastening area. At 24 °C and 60 °C, the increase in fastening area and board thickness cause higher natural frequency of the system, lower displacement amplitude and solder stresses, which improve the fatigue life of the solder joints under random vibration loading. The application of the plain washers and the increase in PCB thickness improve the solder joints fatigue life by 8.5 % and 66.7 %, respectively, at 24 °C, and by 6.6 % and 66.5 %, respectively, at 60 °C. In addition, as the temperature rises, the improvement effects of PCB fastening methods and thickness on the fatigue life of solder joints diminish, especially for the case with adding plain washers. This research has important guiding significance for the reliability design of PCB assemblies.</div></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"165 ","pages":"Article 115587"},"PeriodicalIF":1.6,"publicationDate":"2025-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143275809","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Analysis on thermal simulation of MOSFET based on voids under working conditions

IF 1.6 4区工程技术

Microelectronics Reliability Pub Date : 2025-02-01 DOI: 10.1016/j.microrel.2024.115585

Shiming Lyu , Xiangyu Yang , Baofan Chen , Shijian Su

{"title":"Analysis on thermal simulation of MOSFET based on voids under working conditions","authors":"Shiming Lyu , Xiangyu Yang , Baofan Chen , Shijian Su","doi":"10.1016/j.microrel.2024.115585","DOIUrl":"10.1016/j.microrel.2024.115585","url":null,"abstract":"<div><div>In automotive electronic water pumps, MOSFET is used as power conversion devices to drive water pump motors, however, the high temperature of the engine will cause the electronic water pump MOSFET to overheat and fail. In order to effectively reduce the overheating failure of MOSFET, a thermal simulation model of printed circuit board MOSFET for automotive electronic water pump controllers was established using FLUENT software. The temperature rise characteristics of MOSFET with different void rates under single and multi-void SMT states were analyzed. The analysis results indicate that the thermal resistance of MOSFET in printed circuit boards increases with the increase of void fraction, and the simulation results are verified through experiments, which are consistent with the simulation results. At the same time, when the void ratio is greater than 10 %, the heat dissipation effect of a single void is more pronounced than that of a void. The thermal analysis of printed circuit board MOSFET provides support for effectively controlling MOSFET temperature rise and reducing MOSFET thermal failure.</div></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"165 ","pages":"Article 115585"},"PeriodicalIF":1.6,"publicationDate":"2025-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143352106","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Feedback reinforced accelerated aging for improved physical unclonable function stability

IF 1.6 4区工程技术

Microelectronics Reliability Pub Date : 2025-02-01 DOI: 10.1016/j.microrel.2025.115592

Eric Hunt-Schroeder , Tian Xia

引用次数: 0

Vibration analysis of low temperature BGA and LGA solder joints at elevated test temperatures

IF 1.6 4区工程技术

Microelectronics Reliability Pub Date : 2025-02-01 DOI: 10.1016/j.microrel.2024.115586

Martin K. Anselm , Nithin Lakshminarayan , Michael Meilunas

{"title":"Vibration analysis of low temperature BGA and LGA solder joints at elevated test temperatures","authors":"Martin K. Anselm , Nithin Lakshminarayan , Michael Meilunas","doi":"10.1016/j.microrel.2024.115586","DOIUrl":"10.1016/j.microrel.2024.115586","url":null,"abstract":"<div><div>Dummy BGA and LGA components containing the low temperature solder alloy known as B37 from Nihon Superior were subjected to sinusoidal vibration testing at three environmental temperatures in order to evaluate the effect of the temperature condition on the relative reliability of their solder joints. Similar test vehicles constructed with SAC305 solder were also evaluated for general comparative purposes with the understanding that the SAC305 and B37 alloys are intended for different applications and usage environments. Significantly discernable resonance frequencies and accelerations differences were observed with respect to alloy and type of component. This was evident across the different environmental temperature vibration test conditions. The identified differences between the alloys and component types underscore the importance of considering all the factors in the B37 and SAC305 behavior under vibration. While this study successfully highlighted variations in the response of BGAs to LGAs for the B37 versus SAC305 alloys, further research is needed to identify the underlying mechanisms causing these differences, potentially involving more detailed analyses or complementary testing approaches.</div></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"165 ","pages":"Article 115586"},"PeriodicalIF":1.6,"publicationDate":"2025-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143352101","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Effect of TEOS layer on wafer warpage for wafer-to-wafer bonding

IF 1.6 4区工程技术

Microelectronics Reliability Pub Date : 2025-02-01 DOI: 10.1016/j.microrel.2025.115591

Wei Feng , Haruo Shimamoto , Katsuya Kikuchi

引用次数: 0

Assessing the reliability of SiC MOSFET through inverter-like accelerated test vs. power cycling test

IF 1.6 4区工程技术

Microelectronics Reliability Pub Date : 2025-02-01 DOI: 10.1016/j.microrel.2025.115589

Mohammad A. Abbaszada , Nanditha Gajanur , Sudip K. Mazumder

{"title":"Assessing the reliability of SiC MOSFET through inverter-like accelerated test vs. power cycling test","authors":"Mohammad A. Abbaszada , Nanditha Gajanur , Sudip K. Mazumder","doi":"10.1016/j.microrel.2025.115589","DOIUrl":"10.1016/j.microrel.2025.115589","url":null,"abstract":"<div><div>Silicon carbide (SiC) MOSFETs are known for their superior performance compared to traditional silicon devices, making them well-suited for a wide range of applications in power electronics. However, there is a lack of long-term reliability studies for SiC MOSFETs under real-world operating conditions. This article introduces an innovative inverter-like accelerated test (IAT) and compares it with the standard power cycling test (PCT) to thoroughly assess the degradation mechanisms and reliability of SiC MOSFETs. The IAT is designed to replicate the operational conditions of an inverter, providing a more realistic evaluation of the long-term performance of the SiC MOSFET. There are some differences in the principles of these two accelerated tests (ATs). The paper provides detailed insights into these differences and the methodologies used, including the test bench design and junction temperature estimation, and presents the experimental results. The findings highlight significant differences in the degradation behavior observed under IAT and PCT conditions and the lifetime evaluation, underscoring the necessity for realistic testing protocols to ensure reliable lifetime predictions for SiC MOSFETs in practical applications.</div></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"165 ","pages":"Article 115589"},"PeriodicalIF":1.6,"publicationDate":"2025-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143275509","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Effect of stress interruption on TDDB lifetime during constant voltage stressing in metal-ferroelectric-insulator-semiconductor ferroelectric devices

IF 1.6 4区工程技术

Microelectronics Reliability Pub Date : 2025-02-01 DOI: 10.1016/j.microrel.2024.115584

Tiang Teck Tan , Tian-Li Wu , Hsien-Yang Liu , Cheng-Yu Yu , Kalya Shubhakar , Nagarajan Raghavan , Kin Leong Pey

引用次数: 0

Total ionizing dose radiation effect of HfO2/TaOx-based resistive random-access memories

IF 1.6 4区工程技术

Microelectronics Reliability Pub Date : 2025-02-01 DOI: 10.1016/j.microrel.2025.115590

Xinpei Duan , Yahui Qing , Yong Wang , Ruohao Hong , Jiawei Chen , Pei Yang , Yanan Yin , Xinjie Zhou , Xingqiang Liu , Bei Jiang

引用次数: 0

Conductance variability in RRAM and its implications at the neural network level

IF 1.6 4区工程技术

Microelectronics Reliability Pub Date : 2025-02-01 DOI: 10.1016/j.microrel.2025.115594

H. Aziza , M. Fieback , S. Hamdioui , H. Xun , M. Taouil

{"title":"Conductance variability in RRAM and its implications at the neural network level","authors":"H. Aziza , M. Fieback , S. Hamdioui , H. Xun , M. Taouil","doi":"10.1016/j.microrel.2025.115594","DOIUrl":"10.1016/j.microrel.2025.115594","url":null,"abstract":"<div><div>While Resistive RRAM (RRAM) provides appealing features for artificial neural networks (NN) such as low power operation and high density, its conductance variation can pose significant challenges for synaptic weight storage. This paper reports an experimental evaluation of the conductance variations of manufactured RRAMs memory cells at the memory array level. Variability is evaluated with respect to the RRAM low resistance state (LRS) and high resistance state (HRS) conductance ratio. This ratio is selected as the parameter of interest as it guarantees the proper operation of the RRAM: the larger the ratio, the more reliable and robust the RRAM cell is in storing and retrieving data. The measurement results show that conductance ratio is significantly influenced by variability. Using these findings, the performance of an artificial neural network that uses individual RRAM cells for synaptic weight storage is evaluated in relation to conductance variability. It is shown that RRAM variability can heavily affect the network behavior, resulting in a substantial decrease in the classification accuracy during inference.</div></div>","PeriodicalId":51131,"journal":{"name":"Microelectronics Reliability","volume":"166 ","pages":"Article 115594"},"PeriodicalIF":1.6,"publicationDate":"2025-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143208162","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Interface trap charge modeling of surrounding gate-engineered tubular channel junctionless MOSFET exploring temperature induced variations

IF 1.6 4区工程技术

Microelectronics Reliability Pub Date : 2025-02-01 DOI: 10.1016/j.microrel.2024.115583

Pritha Banerjee, Jayoti Das

引用次数: 0