Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)最新文献

A synthesis methodology aimed at improving the quality of TSC devices 一种旨在提高TSC器件质量的综合方法

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) Pub Date : 1999-11-01 DOI: 10.1109/DFTVS.1999.802891

C. Bolchini, L. Pomante, D. Sciuto, F. Salice

引用次数: 2

Automatic detection of spatial signature on wafermaps in a high volume production 大批量生产中晶圆图空间特征的自动检测

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) Pub Date : 1999-11-01 DOI: 10.1109/DFTVS.1999.802870

F. Duvivier

引用次数: 15

Systematic deletion/insertion error correcting codes with random error correction capability 具有随机纠错能力的系统删除/插入纠错码

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) Pub Date : 1999-11-01 DOI: 10.1109/DFTVS.1999.802895

K. Saowapa, H. Kaneko, E. Fujiwara

引用次数: 16

Reconfiguration of two-dimensional meshes embedded in faulty hypercubes 在故障超立方体中嵌入二维网格的重构

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) Pub Date : 1999-11-01 DOI: 10.1109/DFTVS.1999.802907

S. Nakano, N. Kamiura, Y. Hata, N. Matsui

引用次数: 1

Transient and permanent fault diagnosis for FPGA-based TMR systems 基于fpga的TMR系统暂态和永久故障诊断

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) Pub Date : 1999-11-01 DOI: 10.1109/DFTVS.1999.802900

S. D'Angelo, G. Sechi, C. Metra

引用次数: 33

Implementing a self-checking neural system for photon event identification by SRAM-based FPGAs 基于sram的fpga实现光子事件识别的自检神经系统

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) Pub Date : 1999-11-01 DOI: 10.1109/DFTVS.1999.802894

M. Alderighi, S. D'Angelo, G. Sechi, V. Piuri

引用次数: 2

8-bit multiplier simulation experiments investigating the use of power supply transient signals for the detection of CMOS defects 8位乘法器仿真实验研究了利用电源瞬态信号检测CMOS缺陷

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) Pub Date : 1999-11-01 DOI: 10.1109/DFTVS.1999.802871

J. Plusquellic, Amy Germida, Zheng Yan

引用次数: 2

Design of fault-tolerant solid state mass memory 容错固态大容量存储器的设计

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) Pub Date : 1999-11-01 DOI: 10.1109/DFTVS.1999.802897

G. Cardarilli, S. Bertazzoni, M. Salmeri, A. Salsano, P. Marinucci

引用次数: 55

Design and synthesis of low power weighted random pattern generator considering peak power reduction 考虑峰值功率降低的低功率加权随机模式发生器的设计与合成

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) Pub Date : 1999-11-01 DOI: 10.1109/DFTVS.1999.802880

Xiaodong Zhang, K. Roy

引用次数: 16

Defect and fault tolerance FPGAs by shifting the configuration data 通过改变配置数据来实现fpga的缺陷和容错

Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99) Pub Date : 1999-11-01 DOI: 10.1109/DFTVS.1999.802905

A. Doumar, S. Kaneko, Hideo Ito

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引用次数: 71