{"title":"具有随机纠错能力的系统删除/插入纠错码","authors":"K. Saowapa, H. Kaneko, E. Fujiwara","doi":"10.1109/DFTVS.1999.802895","DOIUrl":null,"url":null,"abstract":"This paper presents a class of binary block codes capable of correcting single synchronization error and single reversal error with fewer check bits than the existing codes. This also shows a decoding circuit and analyzes its complexity.","PeriodicalId":448322,"journal":{"name":"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)","volume":"34 5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"Systematic deletion/insertion error correcting codes with random error correction capability\",\"authors\":\"K. Saowapa, H. Kaneko, E. Fujiwara\",\"doi\":\"10.1109/DFTVS.1999.802895\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a class of binary block codes capable of correcting single synchronization error and single reversal error with fewer check bits than the existing codes. This also shows a decoding circuit and analyzes its complexity.\",\"PeriodicalId\":448322,\"journal\":{\"name\":\"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)\",\"volume\":\"34 5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DFTVS.1999.802895\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1999.802895","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Systematic deletion/insertion error correcting codes with random error correction capability
This paper presents a class of binary block codes capable of correcting single synchronization error and single reversal error with fewer check bits than the existing codes. This also shows a decoding circuit and analyzes its complexity.