{"title":"Implementing a self-checking neural system for photon event identification by SRAM-based FPGAs","authors":"M. Alderighi, S. D'Angelo, G. Sechi, V. Piuri","doi":"10.1109/DFTVS.1999.802894","DOIUrl":null,"url":null,"abstract":"The paper presents and evaluates the design and the implementation of a self-checking neural system for photon event identification in intensified charge-coupled device detectors. The neural approach reveals more effective than classical algorithmic approaches thanks to its learning through example ability. Implementation is accomplished by SRAM-based FPGAs, which have generated increasing interest in the space community. The adoption of suitable on-line fault detection techniques is illustrated taking into account in a specific way SEU induced faults. The techniques are based on AN coding, particularly 3N coding, which constitutes a reasonable trade-off between circuit complexity and computational delay. Estimations of circuit area overhead and fault coverage are reported.","PeriodicalId":448322,"journal":{"name":"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)","volume":"83 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1999.802894","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The paper presents and evaluates the design and the implementation of a self-checking neural system for photon event identification in intensified charge-coupled device detectors. The neural approach reveals more effective than classical algorithmic approaches thanks to its learning through example ability. Implementation is accomplished by SRAM-based FPGAs, which have generated increasing interest in the space community. The adoption of suitable on-line fault detection techniques is illustrated taking into account in a specific way SEU induced faults. The techniques are based on AN coding, particularly 3N coding, which constitutes a reasonable trade-off between circuit complexity and computational delay. Estimations of circuit area overhead and fault coverage are reported.