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2005 66th ARFTG Microwave Measurement Conference (ARFTG)最新文献

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A novel measurement technique for demonstrating carbon nanotube FET operation at microwave frequencies 一种新的测量技术用于演示碳纳米管场效应管在微波频率下的工作
2005 66th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373118
A. Pesetski, J. Baumgardner, J. Murduck, Eric N. Folk, J. Przybysz, J. Adam, Hong Zhang
{"title":"A novel measurement technique for demonstrating carbon nanotube FET operation at microwave frequencies","authors":"A. Pesetski, J. Baumgardner, J. Murduck, Eric N. Folk, J. Przybysz, J. Adam, Hong Zhang","doi":"10.1109/ARFTG.2005.8373118","DOIUrl":"https://doi.org/10.1109/ARFTG.2005.8373118","url":null,"abstract":"This paper reports a novel new measurement technique developed to measure microwave frequency performance of nanoscale devices. Typically, nanoscale devices are high impedance making them difficult to measure at RF. To circumvent this problem, we have developed a new technique in which we perform a two-tone test on a device operated in compression and observe the output at the difference frequency. We use this technique to verify the operation of a carbon nanotube based Field effect transistor (FET) at frequencies up to 23 GHz.","PeriodicalId":444012,"journal":{"name":"2005 66th ARFTG Microwave Measurement Conference (ARFTG)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114675643","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Interlaboratory comparison of noise-parameter measurements on CMOS devices with 0.12 μm gate length 栅极长度为0.12 μm的CMOS器件噪声参数测量的实验室间比较
2005 66th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373127
A. Pesetski, J. Baumgardner, J. Murduck, Eric N. Folk, J. Przybysz, J. Adam, Hong Zhang, J. Verspecht, D. Barataud, J. Teyssier, J. Nebus, Choongeol Cho, P. Hale, D. I. Bergman, D. Keenan, Nazia Akil, B. Grossman, H. Arslan, Daljeet Singh, J. Randa, S. Sweeney, T. Mckay, D. Walker, D. Greenberg, J. Tao, Judah Mendez, G. A. Rezvani, J. Pekarik
{"title":"Interlaboratory comparison of noise-parameter measurements on CMOS devices with 0.12 μm gate length","authors":"A. Pesetski, J. Baumgardner, J. Murduck, Eric N. Folk, J. Przybysz, J. Adam, Hong Zhang, J. Verspecht, D. Barataud, J. Teyssier, J. Nebus, Choongeol Cho, P. Hale, D. I. Bergman, D. Keenan, Nazia Akil, B. Grossman, H. Arslan, Daljeet Singh, J. Randa, S. Sweeney, T. Mckay, D. Walker, D. Greenberg, J. Tao, Judah Mendez, G. A. Rezvani, J. Pekarik","doi":"10.1109/ARFTG.2005.8373127","DOIUrl":"https://doi.org/10.1109/ARFTG.2005.8373127","url":null,"abstract":"We present results of an interlaboratory comparison of S-parameter and noise-parameter measurements performed on 0.12 µm gate-length CMOS transistors. Copies of the same device were measured at three different laboratories (IBM, NIST, RFMD), and the results were compared. Each of the laboratories used a different measurement method, although two used similar commercial systems. Effects of different calibration reference planes are shown. The devices measured have large values of |S11|, |S22|, and |Γopt|, and have very low minimum noise figures (below 0.2 dB) over some of the frequency range. For the most part, the measurements at the different laboratories are in reasonable agreement, though there are discrepancies. It is also evident that the noise performance of the devices is better than our ability to measure it.","PeriodicalId":444012,"journal":{"name":"2005 66th ARFTG Microwave Measurement Conference (ARFTG)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129680027","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Comparison of multisine measurements from instrumentation capable of nonlinear system characterization 非线性系统表征仪器的多正弦测量比较
2005 66th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373122
K. Remley, P. Hale, D. I. Bergman, D. Keenan
{"title":"Comparison of multisine measurements from instrumentation capable of nonlinear system characterization","authors":"K. Remley, P. Hale, D. I. Bergman, D. Keenan","doi":"10.1109/ARFTG.2005.8373122","DOIUrl":"https://doi.org/10.1109/ARFTG.2005.8373122","url":null,"abstract":"We compare measurements of simple multisines using instruments capable of characterizing both magnitude and relative phase of the measured signals. The three instruments we compared reported relative phase measurements within a few degrees of each other with a standard deviation of less than a degree at microwave frequencies for both wide and narrow modulation bandwidths.","PeriodicalId":444012,"journal":{"name":"2005 66th ARFTG Microwave Measurement Conference (ARFTG)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126562791","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Measuring nonlinear devices to retrieve good system-level models 测量非线性装置以检索良好的系统级模型
2005 66th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373131
L. De Locht, G. Vandersteen, Y. Rolain, D. Rabijns
{"title":"Measuring nonlinear devices to retrieve good system-level models","authors":"L. De Locht, G. Vandersteen, Y. Rolain, D. Rabijns","doi":"10.1109/ARFTG.2005.8373131","DOIUrl":"https://doi.org/10.1109/ARFTG.2005.8373131","url":null,"abstract":"The quality of a system-level model for a non-linear component strongly depends on the used measurement approach, especially for power amplifiers. Several measurement approaches exist for all sorts of high-level models, but they often do not take into account the power spectrum of the modulation scheme used. This discrepancy is a major drawback since the output of nonlinear systems strongly depends on the power spectrum of the input. A system-level model based on the best linear approximation overcomes this disadvantage, but so far, no suggestion was made for a measurement setup. This paper clarifies a measurement approach to retrieve the components of the model based on the best linear approximation. This measurement approach uses excitation signals which closely resemble the actual excitation signal of the device. It results in good system-level models for both weakly and strongly nonlinear systems. Furthermore, this approach can be used in nearly every RF measurement facility.","PeriodicalId":444012,"journal":{"name":"2005 66th ARFTG Microwave Measurement Conference (ARFTG)","volume":"77 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121847562","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Time domain harmonic load-pull of an AlGaN/GaN HEMT AlGaN/GaN HEMT的时域谐波负载-拉力
2005 66th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373132
F. de Groote, O. Jardel, J. Verspecht, D. Barataud, J. Teyssier, R. Quéré
{"title":"Time domain harmonic load-pull of an AlGaN/GaN HEMT","authors":"F. de Groote, O. Jardel, J. Verspecht, D. Barataud, J. Teyssier, R. Quéré","doi":"10.1109/ARFTG.2005.8373132","DOIUrl":"https://doi.org/10.1109/ARFTG.2005.8373132","url":null,"abstract":"This paper describes the time domain measurements up to 2.5 Watts of an AlGaN/GaN HEMT performed on an innovative measurement setup dedicated to high power characterizations. The key characteristics of our setup are presented, allowing us to reach time domain waveforms for high power transistors under source-pull and harmonic load-pull conditions. The capability of our setup to acquire time domain waveforms versus the fundamental and first harmonic matching conditions is shown.","PeriodicalId":444012,"journal":{"name":"2005 66th ARFTG Microwave Measurement Conference (ARFTG)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125403489","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Measurement-based WiMAX transceiver design and performance evaluation 基于测量的WiMAX收发器设计与性能评估
2005 66th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373124
H. Arslan, Daljeet Singh
{"title":"Measurement-based WiMAX transceiver design and performance evaluation","authors":"H. Arslan, Daljeet Singh","doi":"10.1109/ARFTG.2005.8373124","DOIUrl":"https://doi.org/10.1109/ARFTG.2005.8373124","url":null,"abstract":"In this paper, testing and measurement capabilities for standard based WiMAX signals within a measurement de­vice (like vector signal analyzer) are introduced. Digital base­band transmitter and receiver designs and receiver algorithms are discussed. The block diagram of the standard transmitter and a proposed receiver design will be provided for measurement based performance evaluation. Within the receiver blocks, each measurement point and its impact on performance measurement will be discussed in detail. In addition, some performance mea­surement results will be provided with detailed discussions. The performances in various noise and impairment scenarios will be discussed.","PeriodicalId":444012,"journal":{"name":"2005 66th ARFTG Microwave Measurement Conference (ARFTG)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129308683","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Calibration errors when neglecting crosstalk 忽略串扰时的校准误差
2005 66th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373125
L. Hayden
{"title":"Calibration errors when neglecting crosstalk","authors":"L. Hayden","doi":"10.1109/ARFTG.2005.8373125","DOIUrl":"https://doi.org/10.1109/ARFTG.2005.8373125","url":null,"abstract":"While it is standard practice to omit isolation during Vector Network Analyzer calibration of measurement systems probing planar devices, the impact on measurement accuracy due to finite leakage between signal paths has not been quantitatively studied. In this paper a generalization of a calibration comparison method is used to determine error-bounds estimating the effect of neglecting cross-talk during calibration of a two-port VNA system.","PeriodicalId":444012,"journal":{"name":"2005 66th ARFTG Microwave Measurement Conference (ARFTG)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127048726","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
RF probing of custom ASIC's 定制专用集成电路的射频探测
2005 66th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373134
Bruce Bullard, R. McNamar, Sean McNally
{"title":"RF probing of custom ASIC's","authors":"Bruce Bullard, R. McNamar, Sean McNally","doi":"10.1109/ARFTG.2005.8373134","DOIUrl":"https://doi.org/10.1109/ARFTG.2005.8373134","url":null,"abstract":"Production testing of custom RF ASIC's is limited to a few seconds of testing devices at wafer and again at package. Recent trends towards the use of low cost highly integrated RF ASICS have clearly demonstrated the need for cost effective solutions for production wafer level testing. Wafer testing is generally limited to tests that provide the most information about functionality. When the products have high frequency functionality, the cost of the wafer probe cards increases dramatically. Solutions such as membrane probes, and coaxial ground-signal probes are expensive, but absolutely necessary for high frequency applications. If the device operation is not at too high a frequency, a standard wire tip probe card can be used to provide results that are sufficient to determine whether a device is functional. In this paper we explore the limits of low cost standard wire and shielded wire probe cards. Detailed discussion of the parasitics associated with the wire and shielded probes are discussed. Simulations and measurement results for a low cost probe card are examined. A rough estimate of the usefulness of the card versus frequency is provided.","PeriodicalId":444012,"journal":{"name":"2005 66th ARFTG Microwave Measurement Conference (ARFTG)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123925447","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Technique for assessing PNA measurement repeatability using a NIST standard 使用NIST标准评估PNA测量可重复性的技术
2005 66th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373123
Nazia Akil, B. Grossman
{"title":"Technique for assessing PNA measurement repeatability using a NIST standard","authors":"Nazia Akil, B. Grossman","doi":"10.1109/ARFTG.2005.8373123","DOIUrl":"https://doi.org/10.1109/ARFTG.2005.8373123","url":null,"abstract":"A method is demonstrated where by the use of the NIST (National Institute of Standards and Technology) reference material 8130 and NIST MultiCal® software allow the performance of modern performance network analyzers (PNA) to be evaluated and compared to a NIST benchmark TRL calibration. The analysis, presented here, is useful in the assessment of calibration repeatability. It also yields information to help improve the comparison of VNA measurement results from across various Intel laboratories.","PeriodicalId":444012,"journal":{"name":"2005 66th ARFTG Microwave Measurement Conference (ARFTG)","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121611078","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Statistical analysis of accuracy in noise figure measurements 噪声系数测量精度的统计分析
2005 66th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373130
N. Otegi, J. Collantes, M. Sayed
{"title":"Statistical analysis of accuracy in noise figure measurements","authors":"N. Otegi, J. Collantes, M. Sayed","doi":"10.1109/ARFTG.2005.8373130","DOIUrl":"https://doi.org/10.1109/ARFTG.2005.8373130","url":null,"abstract":"There is a growing trend to integrate noise figure measurement capabilities in microwave instruments originally devoted to other general purpose measurements as Vector Network Analyzers or Spectrum Analyzers. This opens up new possibilities to take into account vector corrections (at least in the case of VNA), or even to consider other techniques (such as cold-source) for computing the noise figure, different from the classical Y-factor approach used by most noise figure meters. In order to evaluate the suitability of these new options it is important to correctly analyze the benefits in terms of final accuracy that they can provide. However, errors in noise figure measurements have very different sources and nature, which sometimes do not allow straight forward conclusions on measurement accuracy. In this paper, a consistent evaluation of systematic errors and measurement uncertainty associated to different methodologies is presented. For that, the recommendations of the IEC-ISO Guide to the Expression of Uncertainty in Measurement (GUM) are followed. Some representative examples are given to illustrate the interest of the analysis.","PeriodicalId":444012,"journal":{"name":"2005 66th ARFTG Microwave Measurement Conference (ARFTG)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116814227","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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