2005 66th ARFTG Microwave Measurement Conference (ARFTG)

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2005 66th ARFTG Microwave Measurement Conference (ARFTG) - 最新文献

A novel measurement technique for demonstrating carbon nanotube FET operation at microwave frequencies

Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373118 A. Pesetski, J. Baumgardner, J. Murduck, Eric N. Folk, J. Przybysz, J. Adam, Hong Zhang

Interlaboratory comparison of noise-parameter measurements on CMOS devices with 0.12 μm gate length

Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373127 A. Pesetski, J. Baumgardner, J. Murduck, Eric N. Folk, J. Przybysz, J. Adam, Hong Zhang, J. Verspecht, D. Barataud, J. Teyssier, J. Nebus, Choongeol Cho, P. Hale, D. I. Bergman, D. Keenan, Nazia Akil, B. Grossman, H. Arslan, Daljeet Singh, J. Randa, S. Sweeney, T. Mckay, D. Walker, D. Greenberg, J. Tao, Judah Mendez, G. A. Rezvani, J. Pekarik

Comparison of multisine measurements from instrumentation capable of nonlinear system characterization

Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373122 K. Remley, P. Hale, D. I. Bergman, D. Keenan

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