{"title":"非线性系统表征仪器的多正弦测量比较","authors":"K. Remley, P. Hale, D. I. Bergman, D. Keenan","doi":"10.1109/ARFTG.2005.8373122","DOIUrl":null,"url":null,"abstract":"We compare measurements of simple multisines using instruments capable of characterizing both magnitude and relative phase of the measured signals. The three instruments we compared reported relative phase measurements within a few degrees of each other with a standard deviation of less than a degree at microwave frequencies for both wide and narrow modulation bandwidths.","PeriodicalId":444012,"journal":{"name":"2005 66th ARFTG Microwave Measurement Conference (ARFTG)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Comparison of multisine measurements from instrumentation capable of nonlinear system characterization\",\"authors\":\"K. Remley, P. Hale, D. I. Bergman, D. Keenan\",\"doi\":\"10.1109/ARFTG.2005.8373122\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We compare measurements of simple multisines using instruments capable of characterizing both magnitude and relative phase of the measured signals. The three instruments we compared reported relative phase measurements within a few degrees of each other with a standard deviation of less than a degree at microwave frequencies for both wide and narrow modulation bandwidths.\",\"PeriodicalId\":444012,\"journal\":{\"name\":\"2005 66th ARFTG Microwave Measurement Conference (ARFTG)\",\"volume\":\"61 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2005 66th ARFTG Microwave Measurement Conference (ARFTG)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2005.8373122\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 66th ARFTG Microwave Measurement Conference (ARFTG)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2005.8373122","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Comparison of multisine measurements from instrumentation capable of nonlinear system characterization
We compare measurements of simple multisines using instruments capable of characterizing both magnitude and relative phase of the measured signals. The three instruments we compared reported relative phase measurements within a few degrees of each other with a standard deviation of less than a degree at microwave frequencies for both wide and narrow modulation bandwidths.