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2005 66th ARFTG Microwave Measurement Conference (ARFTG)最新文献

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Hot S-parameter techniques: 6 = 4 + 2 热门s参数技术:6 = 4 + 2
2005 66th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373119
J. Verspecht, D. Barataud, J. Teyssier, J. Nebus
{"title":"Hot S-parameter techniques: 6 = 4 + 2","authors":"J. Verspecht, D. Barataud, J. Teyssier, J. Nebus","doi":"10.1109/ARFTG.2005.8373119","DOIUrl":"https://doi.org/10.1109/ARFTG.2005.8373119","url":null,"abstract":"An overview of several hot S-parameter techniques is presented. It is shown that different definitions are in use, causing confusion among users. Different techniques are explained in a nutshell, together with their advantages and drawbacks. It is explained that any accurate hot S-parameter approach needs 6 parameters in contradiction with the classic small signal S-parameter approach where 4 coefficients are sufficient.","PeriodicalId":444012,"journal":{"name":"2005 66th ARFTG Microwave Measurement Conference (ARFTG)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132237729","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 28
GaN FET's non-linear model constructed by adaptive multi-bias S-parameter measurements 基于自适应多偏置s参数测量的氮化镓场效应管非线性模型
2005 66th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373129
D. Xiao, D. Schreurs, C. van Niekerk, W. De Raedt, J. Derluyn, M. Germain, B. Nauwelaers, G. Borghs
{"title":"GaN FET's non-linear model constructed by adaptive multi-bias S-parameter measurements","authors":"D. Xiao, D. Schreurs, C. van Niekerk, W. De Raedt, J. Derluyn, M. Germain, B. Nauwelaers, G. Borghs","doi":"10.1109/ARFTG.2005.8373129","DOIUrl":"https://doi.org/10.1109/ARFTG.2005.8373129","url":null,"abstract":"The construction of a non-linear model of high frequency transistors requires S-parameter measurements at different bias points. For Gallium Nitride (GaN) based Field Effect Transistors (FETs) the safe operating area is wide, which means that the required number of bias points is very large. Consequently, the total measurement time increases to an impractical level. To reduce the total volume of experimental data and hence the measurement time, while still adequately capturing the non-linear device characteristics, a new adaptive measurement algorithm has been applied. This algorithm places more bias points in regions where the device characteristics changes rapidly and less bias points in regions where the device response stays constant. A comparison is made between S-parameter and Y-parameter based selection criteria. Finally, a GaN FET's non-linear model is constructed and good agreement is achieved between measurement and model results, verifying the proposed approach.","PeriodicalId":444012,"journal":{"name":"2005 66th ARFTG Microwave Measurement Conference (ARFTG)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115844802","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Design of a single chip antenna combined with coplanar matching circuit and duplexer 结合共面匹配电路和双工器的单片机天线设计
2005 66th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373128
H. Kanaya, K. Seki, K. Yoshida
{"title":"Design of a single chip antenna combined with coplanar matching circuit and duplexer","authors":"H. Kanaya, K. Seki, K. Yoshida","doi":"10.1109/ARFTG.2005.8373128","DOIUrl":"https://doi.org/10.1109/ARFTG.2005.8373128","url":null,"abstract":"We designed the on-chip antenna combined with coplanar waveguide (CPW) broadband impedance matching circuit and duplexers with BPFs. Firstly, we designed a slot antenna with a radiation resistance matched to a three-pole bandpass filter (BPF) with 10.5GHz center frequency and 8% fractional bandwidth. Next, in order to obtain the high isolation from transmitter (T<inf>x</inf>) to receiver (R<inf>x</inf>), we attached the phase control line, which can be used as impedance matching, in front of each BPF in a duplexer. Finally, we design the T<inf>x</inf>-and R<inf>x</inf>-BPF matched to the input impedance of the antenna and phase control line. In the duplexer, R<inf>x</inf> 2-pole BPF has center frequency=10.3GHz and bandwidth=40MHz, and T<inf>x</inf> BPF has center frequency=10.7GHz and bandwidth=40MHz.","PeriodicalId":444012,"journal":{"name":"2005 66th ARFTG Microwave Measurement Conference (ARFTG)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114439417","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Constructing and benchmarking a pulsed-RF, pulsed-bias S-parameter system 一个脉冲-射频、脉冲偏置s参数系统的构建与基准测试
2005 66th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373133
C. Baylis, L. Dunleavy, J. Martens
{"title":"Constructing and benchmarking a pulsed-RF, pulsed-bias S-parameter system","authors":"C. Baylis, L. Dunleavy, J. Martens","doi":"10.1109/ARFTG.2005.8373133","DOIUrl":"https://doi.org/10.1109/ARFTG.2005.8373133","url":null,"abstract":"A pulsed-bias, pulsed-RF S-parameter system has been assembled and validated through a systematic benchmarking process. The system was constructed using an Anritsu 37397C Lightning Vector Network Analyzer, along with an external switch, a digital delay generator, and a custom bias tee. A series of benchmarking tests, using passive and active DUTs, was performed to exercise and validate the system. A range of test setup conditions, including varied pulse lengths and duty cycles, were examined. A passive filter was used to explore the dynamic range and effective noise floor of the pulsed S-parameter measurement as compared to CW measurements. Finally, a Si LDMOSFET was measured and the pulsed- and continuous-bias measurement results were found to show dispersion in |S21| due to device self-heating in the continuous-bias case.","PeriodicalId":444012,"journal":{"name":"2005 66th ARFTG Microwave Measurement Conference (ARFTG)","volume":"106 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128054540","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
325 to 500 GHz vector network analysis system 325至500 GHz矢量网络分析系统
2005 66th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373120
C. Oleson, A. Denning, Y. Lau
{"title":"325 to 500 GHz vector network analysis system","authors":"C. Oleson, A. Denning, Y. Lau","doi":"10.1109/ARFTG.2005.8373120","DOIUrl":"https://doi.org/10.1109/ARFTG.2005.8373120","url":null,"abstract":"This paper describes a novel and compact WR-02.2 millimeter wave frequency extension transmission/reflection (T/R) module for use with a vector network analyzer. The WR-02.2 T/R module extends the measurement capabilities of a microwave vector network analyzer to 500 GHz. Full 2-port S-parameter measurements with 40 dB or greater system dynamic range is realized in the 325 to 500 GHz frequency range. The stimulus millimeter wave signal is generated via multipliers with an external microwave synthesizer input. The reference and test response are down-converted to an Intermediate Frequency (IF) via millimeter wave harmonic mixers. The response is shown on the microwave vector network analyzer display.","PeriodicalId":444012,"journal":{"name":"2005 66th ARFTG Microwave Measurement Conference (ARFTG)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131353310","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Uncertainty analysis for 65 GHz terminations calibrated with vector network analyzers 用矢量网络分析仪校准的65 GHz终端的不确定度分析
2005 66th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2005-12-01 DOI: 10.1109/ARFTG.2005.8373126
Y. Lee
{"title":"Uncertainty analysis for 65 GHz terminations calibrated with vector network analyzers","authors":"Y. Lee","doi":"10.1109/ARFTG.2005.8373126","DOIUrl":"https://doi.org/10.1109/ARFTG.2005.8373126","url":null,"abstract":"The conventional error analysis for the terminations was derived from the ripple techniques [1] and [2], and by using the scalar network analyzers. Since the vector network analyzers become available and affordable to more users, there is a need to adopt a new error analysis based on the international standards. A careful review of error analysis procedure based on the requirements of the ISO Guidance for Expression of Uncertainty in Measurement (GUM) was conducted for the Type N and V connector terminations.","PeriodicalId":444012,"journal":{"name":"2005 66th ARFTG Microwave Measurement Conference (ARFTG)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126670233","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
66th ARFTG conference organizers 第66届ARFTG会议组织者
2005 66th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 1900-01-01 DOI: 10.1109/arftg.2006.8361645
Mohamed Sayed, J. Burns
{"title":"66th ARFTG conference organizers","authors":"Mohamed Sayed, J. Burns","doi":"10.1109/arftg.2006.8361645","DOIUrl":"https://doi.org/10.1109/arftg.2006.8361645","url":null,"abstract":"President Brian Pugh, Quorum Systems Vice President, Publications J Gregory Burns, Northrop Grumman Secretary Nick Ridler, NPL Treasurer Ken Wong, Agilent Technologies Exhibits Joseph L. Tauritz, Universiteit Twente Education David Walker, NIST Publicity Leonard Hayden, Cascade Microtech Nominations Mohamed Sayed, MMS Standards Bill Eisenstadt, University of Florida Electronic Communications Ronald Ginley, NIST Membership Raymond W Tucker, Air Force Research Lab Technical Coordinator Tom Ruttan, Intel Workshops Dominique Schreurs, KU Leuven Awards Uwe Arz, PTB MTT-S Liaison Charles Wilker, Dupont Superconductivity","PeriodicalId":444012,"journal":{"name":"2005 66th ARFTG Microwave Measurement Conference (ARFTG)","volume":"66 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128871567","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Title page 标题页
2005 66th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 1900-01-01 DOI: 10.1109/pads.2012.44
Courtney Maruda, D. Riley
{"title":"Title page","authors":"Courtney Maruda, D. Riley","doi":"10.1109/pads.2012.44","DOIUrl":"https://doi.org/10.1109/pads.2012.44","url":null,"abstract":"","PeriodicalId":444012,"journal":{"name":"2005 66th ARFTG Microwave Measurement Conference (ARFTG)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130071734","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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