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Proceedings of the Ninth Asian Test Symposium最新文献

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Design and testing of fast and cost effective serial seeding TPGs based on one-dimensional linear hybrid cellular automata 基于一维线性混合元胞自动机的快速、低成本串行播种TPGs的设计与测试
Proceedings of the Ninth Asian Test Symposium Pub Date : 2000-12-04 DOI: 10.1109/ATS.2000.893653
A. Hlawiczka, M. Kopec
{"title":"Design and testing of fast and cost effective serial seeding TPGs based on one-dimensional linear hybrid cellular automata","authors":"A. Hlawiczka, M. Kopec","doi":"10.1109/ATS.2000.893653","DOIUrl":"https://doi.org/10.1109/ATS.2000.893653","url":null,"abstract":"The paper proposes the approach of designing CA registers that work as quick pattern generators. A new effective method of setting the initial state of such registers is presented. It is based on switching a n-cell CA register into a concatenation of p CdSR registers (Cellular Automata quasi Shift Register) each containing r cells and connected with characteristic polynomial x'. The resultant characteristic polynomial of such concatenation is p(x)=x/sup n/. Such concatenation of p registers CASR is referred as PCASR. The paper proves the possibility of setting a PCASR to any initial state by n-bit input sequence without the need of switching flip-flops into the D flip-flop mode. Moreover, it has been proven that any input sequence would be repeated at the output of a n-cell PCASR after n-clock cycle delay. Finally an effective procedure of testing PCASR is proposed.","PeriodicalId":403864,"journal":{"name":"Proceedings of the Ninth Asian Test Symposium","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122463968","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Mixed-signal SoC testing: is mixed-signal design-for-test on its way? 混合信号SoC测试:混合信号测试设计正在进行中吗?
Proceedings of the Ninth Asian Test Symposium Pub Date : 2000-12-04 DOI: 10.1109/ATS.2000.893595
C. Wey, A. Osseiran, J. Huertas, Yeon-Chen Nieu
{"title":"Mixed-signal SoC testing: is mixed-signal design-for-test on its way?","authors":"C. Wey, A. Osseiran, J. Huertas, Yeon-Chen Nieu","doi":"10.1109/ATS.2000.893595","DOIUrl":"https://doi.org/10.1109/ATS.2000.893595","url":null,"abstract":"The world market for electronic systems will reach $1 Trillion within a year and with further exponential growth over the next five years. The growth in areas such as telecommunications has increased the demand for creating single chip solutions to system. This has been achieved by integrating a number of complex sub-systems, including standard interface blocks (e.g., analog/digital converters), reused design cores (e.g., memory or microprocessors), embedded software, and new, innovative, custom designed “user blocks”, into a single chip. Today, system-on-a-chip (SoC) has become a reality. However, the complexity of SoC makes it very difficult to achieve the desire test coverage without affecting the design schedule.","PeriodicalId":403864,"journal":{"name":"Proceedings of the Ninth Asian Test Symposium","volume":"253 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117305604","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Is IDDQ testing not applicable for deep submicron VLSI in year 2011? IDDQ测试在2011年不适用于深亚微米VLSI吗?
Proceedings of the Ninth Asian Test Symposium Pub Date : 2000-12-04 DOI: 10.1109/ATS.2000.893646
Chih-Wen Lu, C. Su, Chung-Len Lee, Jwu-E Chen
{"title":"Is IDDQ testing not applicable for deep submicron VLSI in year 2011?","authors":"Chih-Wen Lu, C. Su, Chung-Len Lee, Jwu-E Chen","doi":"10.1109/ATS.2000.893646","DOIUrl":"https://doi.org/10.1109/ATS.2000.893646","url":null,"abstract":"In this work, IDDQ current for deep submicron VLSI in year 2011 is estimated with a statistical approach according to the International Technology Roadmap for Semiconductors 1999 Edition considering process variations and different input vectors. The estimated results show that the standard deviation of the IDDQ current is proportional to the square root of the circuit size and the IDDQ currents of the defect-free and the defective devices, which are of the size up to 1/spl times/10/sup 7/ gates, are still differentiable under the condition of random process deviations and input vectors. Two new IDDQ testing schemes, which detect the defective current based on the two separate IDDQ distributions, are proposed. From the study, it is concluded that IDDQ testing is still applicable for the deep submicron VLSI for the next ten years.","PeriodicalId":403864,"journal":{"name":"Proceedings of the Ninth Asian Test Symposium","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114335763","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
A case study of failure analysis and guardband determination for a 64M-bit DRAM 64m位DRAM失效分析与保护带确定案例研究
Proceedings of the Ninth Asian Test Symposium Pub Date : 2000-12-04 DOI: 10.1109/ATS.2000.893665
Chin-Te Kao, Sam Wu, Jwu E. Chen
{"title":"A case study of failure analysis and guardband determination for a 64M-bit DRAM","authors":"Chin-Te Kao, Sam Wu, Jwu E. Chen","doi":"10.1109/ATS.2000.893665","DOIUrl":"https://doi.org/10.1109/ATS.2000.893665","url":null,"abstract":"Chips with defects, which escape the test, will cause a quality problem and will hurt goodwill and decline revenue. It is important to look for the defect root causes and to derive the prevention strategy. In this paper a case study of a 64M-DRAM is used to demonstrate the approaches of failure analysis in silicon debug stage and, consequently the determination of the tests for production. The consideration of test derivation is both to enhance the yield and to improve the product quality with low test cost. The root cause, electrical modeling of defects, test selection and guardband determination are introduced. Finally, a quantitative measure is given to show the value of failure analysis for a high volume DRAM product.","PeriodicalId":403864,"journal":{"name":"Proceedings of the Ninth Asian Test Symposium","volume":"35 6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130527737","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A realistic fault model for flash memories 一个现实的闪存故障模型
Proceedings of the Ninth Asian Test Symposium Pub Date : 2000-12-04 DOI: 10.1109/ATS.2000.893637
Yea-Ling Horng, Jing-Reng Huang, Tsin-Yuan Chang
{"title":"A realistic fault model for flash memories","authors":"Yea-Ling Horng, Jing-Reng Huang, Tsin-Yuan Chang","doi":"10.1109/ATS.2000.893637","DOIUrl":"https://doi.org/10.1109/ATS.2000.893637","url":null,"abstract":"To explore all faulty behavior on NAND-type flash memory is impractical, and the defects in the SPICE model level are considered. In this paper, two SPICE models of the flash cell are developed and used for circuit-level faulty behavior simulation. The faulty behaviors can be classified to six types and applied for the fault modeling or testing of NAND-type flash memory.","PeriodicalId":403864,"journal":{"name":"Proceedings of the Ninth Asian Test Symposium","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124784408","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
A hierarchical test control architecture for core based design 基于核心设计的分层测试控制体系结构
Proceedings of the Ninth Asian Test Symposium Pub Date : 2000-12-04 DOI: 10.1109/ATS.2000.893633
Kuen-Jong Lee, Cheng-I Huang
{"title":"A hierarchical test control architecture for core based design","authors":"Kuen-Jong Lee, Cheng-I Huang","doi":"10.1109/ATS.2000.893633","DOIUrl":"https://doi.org/10.1109/ATS.2000.893633","url":null,"abstract":"Recently system-on-chip (SOC) design based on IP cores has become the trend of IC design. To prevent the testing problem from becoming the bottleneck of the core-based design, the IEEE P1500 Working Group is defining a test standard that can greatly simplify the core test problem. In this paper, we propose a new core-based test architecture that can support the IEEE P1500 cores as well as the well-accepted IEEE 1149.1 cores. Both the serial and parallel testing capabilities are provided. Moreover, a new hierarchical test control mechanism has been developed that facilitates the hierarchical test access for deeply embedded cores.","PeriodicalId":403864,"journal":{"name":"Proceedings of the Ninth Asian Test Symposium","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124154329","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 19
Detection of SRAM cell stability by lowering array supply voltage 降低阵列供电电压检测SRAM电池稳定性
Proceedings of the Ninth Asian Test Symposium Pub Date : 2000-12-04 DOI: 10.1109/ATS.2000.893636
D. Kwai, Hung-Wen Chang, H. Liao, Ching-Hua Chiao, Yung-Fa Chou
{"title":"Detection of SRAM cell stability by lowering array supply voltage","authors":"D. Kwai, Hung-Wen Chang, H. Liao, Ching-Hua Chiao, Yung-Fa Chou","doi":"10.1109/ATS.2000.893636","DOIUrl":"https://doi.org/10.1109/ATS.2000.893636","url":null,"abstract":"In this paper, we discuss a design-for-test technique for the detection of cell stability in static random access memory (SRAM). The power supply to the memory array is isolated and independently accessible from an external terminal. By lowering the array supply voltage, the cell stability is degraded, making the defective cells susceptible to noises induced by read/write operations. On-silicon characterization result using 0.18 /spl mu/m CMOS technology is reported. It shows that the weak tailing bits in the statistical distribution can manifest themselves. The implementation of the test mode is inherently low-cost and can be combined with previously proposed methods for an improved detection capability.","PeriodicalId":403864,"journal":{"name":"Proceedings of the Ninth Asian Test Symposium","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116652693","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 26
TOF: a tool for test pattern generation optimization of an FPGA application oriented test 测试模式生成优化的一个面向FPGA应用的测试工具
Proceedings of the Ninth Asian Test Symposium Pub Date : 2000-12-04 DOI: 10.1109/ATS.2000.893644
M. Renovell, J. Portal, P. Faure, J. Figueras, Y. Zorian
{"title":"TOF: a tool for test pattern generation optimization of an FPGA application oriented test","authors":"M. Renovell, J. Portal, P. Faure, J. Figueras, Y. Zorian","doi":"10.1109/ATS.2000.893644","DOIUrl":"https://doi.org/10.1109/ATS.2000.893644","url":null,"abstract":"The objective of this paper is to generate an Application-Oriented Test Procedure to be used by a FPGA user in a given application. General definitions concerning the specific problem of testing RAM-based FPGAs are first given such as the important concept of 'AC-non-redundant fault.\" Then, it is commented that a classical test pattern generation performed on the circuit netlist gives a low AC-non-redundant fault coverage and it is pointed out that test pattern generation performed on a FPGA representation is required. It is also commented that test pattern generation performed on the FPGA representation can be significantly accelerated by different techniques. A procedure called TOF is described to validate the proposed approach on benchmark circuits.","PeriodicalId":403864,"journal":{"name":"Proceedings of the Ninth Asian Test Symposium","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114899649","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Fast hierarchical test path construction for DFT-free controller-datapath circuits 无dft控制器-数据路径电路的快速分层测试路径构建
Proceedings of the Ninth Asian Test Symposium Pub Date : 2000-12-04 DOI: 10.1109/ATS.2000.893623
Y. Makris, Jamison D. Collins, A. Orailoglu
{"title":"Fast hierarchical test path construction for DFT-free controller-datapath circuits","authors":"Y. Makris, Jamison D. Collins, A. Orailoglu","doi":"10.1109/ATS.2000.893623","DOIUrl":"https://doi.org/10.1109/ATS.2000.893623","url":null,"abstract":"We discuss a hierarchical test generation method for DFT-free controller-datapath pairs. A transparency based scheme is devised for the datapath, wherein locally generated vectors are translated into global design test. The controller is examined through influence tables, used to generate valid control state sequences for testing each module through hierarchical test paths. Fault coverage levels and vector counts thus attained match closely, those of traditional test generation methodologies, while sharply reducing the corresponding computational cost.","PeriodicalId":403864,"journal":{"name":"Proceedings of the Ninth Asian Test Symposium","volume":"73 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131539757","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
An experimental analysis of spot defects in SRAMs: realistic fault models and tests sram中斑点缺陷的实验分析:现实故障模型和测试
Proceedings of the Ninth Asian Test Symposium Pub Date : 2000-12-04 DOI: 10.1109/ATS.2000.893615
S. Hamdioui, A. V. Goor
{"title":"An experimental analysis of spot defects in SRAMs: realistic fault models and tests","authors":"S. Hamdioui, A. V. Goor","doi":"10.1109/ATS.2000.893615","DOIUrl":"https://doi.org/10.1109/ATS.2000.893615","url":null,"abstract":"In this paper a complete analysis of spot defects in industrial SRAMs will be presented. All possible defects are simulated, and the resulting electrical faults are transformed into functional fault models. The existence of the usually used theoretical memory fault models will be verified and new ones will be presented. Finally, a new march test detecting all realistic faults, with a test length of 14n, will be introduced, and its fault coverage is compared with other known tests.","PeriodicalId":403864,"journal":{"name":"Proceedings of the Ninth Asian Test Symposium","volume":"442 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127799586","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 127
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