2012 IEEE International Test Conference最新文献_第3页

Improving test compression by retaining non-pivot free variables in sequential linear decompressors 通过在顺序线性减压器中保留非枢轴自由变量来改进测试压缩

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401557

Sreenivaas S. Muthyala, N. Touba

引用次数: 8

Testing strategies for a 9T sub-threshold SRAM 9T亚阈值SRAM的测试策略

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401577

Hao-Yu Yang, Chen-Wei Lin, Hung-Hsin Chen, M. Chao, Ming-Hsien Tu, S. Jou, C. Chuang

引用次数: 1

8Gbps CMOS pin electronics hardware macro with simultaneous bi-directional capability 8Gbps CMOS引脚电子硬件宏，具有同步双向能力

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401543

S. Kojima, Y. Arai, Tasuku Fujibe, T. Ataka, A. Ono, Ken-ichi Sawada, D. Watanabe

引用次数: 5

Systematic defect screening in controlled experiments using volume diagnosis 容积诊断在对照实验中的系统缺陷筛查

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401546

B. Seshadri, P. Gupta, Y. T. Lin, B. Cory

引用次数: 6

Root cause identification of an hard-to-find on-chip power supply coupling fail 难以找到的片上电源耦合故障的根本原因识别

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401563

F. Stellari, T. Cowell, P. Song, M. Sorna, Z. Deniz, J. Bulzacchelli, N. Mitra

引用次数: 2

Functional test content optimization for peak-power validation — An experimental study 峰值功率验证的功能测试内容优化-实验研究

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401586

Vinayak Kamath, Wen Chen, N. Sumikawa, Li-C. Wang

引用次数: 4

DfT architecture and ATPG for Interconnect tests of JEDEC Wide-I/O memory-on-logic die stacks JEDEC宽i /O内存逻辑芯片栈互连测试的DfT体系结构和ATPG

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401569

Sergej Deutsch, B. Keller, V. Chickermane, Subhasish Mukherjee, Navdeep Sood, S. Goel, Ji-Jan Chen, Ashok Mehta, F. Lee, E. Marinissen

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引用次数: 39

Functional test of small-delay faults using SAT and Craig interpolation 基于SAT和Craig插值的小延迟故障功能测试

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401550

M. Sauer, Stefan Kupferschmid, A. Czutro, I. Polian, S. Reddy, B. Becker

引用次数: 25

Low-cost wideband periodic signal reconstruction using incoherent undersampling and back-end cost optimization 基于非相干欠采样和后端成本优化的低成本宽带周期信号重构

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401552

Nicholas Tzou, D. Bhatta, S. Hsiao, H. Choi, A. Chatterjee

引用次数: 11

Cell-aware Production test results from a 32-nm notebook processor 32nm笔记本处理器的生产测试结果

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401533

F. Hapke, Michael Reese, J. Rivers, A. Over, V. Ravikumar, W. Redemund, Andreas Glowatz, J. Schlöffel, J. Rajski

引用次数: 57