2012 IEEE International Test Conference最新文献_第2页

A unified method for parametric fault characterization of post-bond TSVs 一种统一的键后tsv参数故障表征方法

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401566

Yu-Hsiang Lin, Shi-Yu Huang, Kun-Han Tsai, Wu-Tung Cheng, S. Sunter

引用次数: 17

Screening customer returns with multivariate test analysis 用多元检验分析筛选客户回报

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401547

N. Sumikawa, J. Tikkanen, Li-C. Wang, L. Winemberg, M. Abadir

引用次数: 42

Capacitive sensing testability in complex memory devices 复杂存储器件的电容传感可测试性

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401570

K. Parker

引用次数: 5

Spatial estimation of wafer measurement parameters using Gaussian process models 基于高斯过程模型的晶圆测量参数空间估计

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401545

Nathan Kupp, K. Huang, J. Carulli, Y. Makris

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引用次数: 27

Automated system level functional test program generation on ATE from EDA using Functional Test Abstraction 利用功能测试抽象在EDA上自动生成系统级功能测试程序

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401590

Motoo Ueda, Shinichi Ishikawa, Masaru Goishi, Satoru Kitagawa, Hiroshi Araki, Shuichi Inage

引用次数: 2

A dynamic programming solution for optimizing test delivery in multicore SOCs 在多核soc中优化测试交付的动态规划解决方案

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401535

Mukesh Agrawal, Michael Richter, K. Chakrabarty

引用次数: 15

Design validation of RTL circuits using evolutionary swarm intelligence 基于进化群智能的RTL电路设计验证

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401556

Min Li, K. Gent, M. Hsiao

{"title":"Design validation of RTL circuits using evolutionary swarm intelligence","authors":"Min Li, K. Gent, M. Hsiao","doi":"10.1109/TEST.2012.6401556","DOIUrl":"https://doi.org/10.1109/TEST.2012.6401556","url":null,"abstract":"In this paper, we present BEACON, a Branch-oriented Evolutionary Ant Colony OptimizatioN method which is a bio-inspired meta-heuristic for design validation and functional test generation. BEACON combines an evolutionary search technique with Ant Colony Optimization (ACO) for improved search capability. BEACON first cross-compiles the Verilog circuit source to a C++ base for fast simulation. Then, it profiles the code, keeping track of each branch and the number of times it has been visited in a database. Branch coverage provides a very useful metric for exploring the design, especially visiting the most critical states, including corner states, in the design. At 100% branch coverage, we can conclude that every control state described in the RTL has been visited. Thus, during execution, BEACON trims highly visited branches from the search and focuses the search on rarely occurring branches and paths. This approach gives a significant performance boost while maintaining a high level of coverage. Experimental results show that BEACON is able to achieve very high branch coverages with a fraction of computational cost. In addition, previous hard-to-reach corner states in the ITC99 benchmarks have now been reached by BEACON. New states can also be discovered from the RTL descriptions. For many circuits, one to two orders of magnitude speedups over existing methods have been achieved.","PeriodicalId":353290,"journal":{"name":"2012 IEEE International Test Conference","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125477537","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 34

Calibration of a flexible high precision Power-On Reset during production test 在生产测试期间校准灵活的高精度开机复位

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401562

G. Hilber, D. Gruber, M. Sams, T. Ostermann

引用次数: 2

On-die instrumentation to solve challenges for 28nm, 28Gbps timing variability and stressing 芯片上的仪器解决28nm、28Gbps时序变化和压力的挑战

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401536

W. Ding, M. Pan, W. Wong, Daniel Chow, Mike P. Li, Sergey Shumarayev

引用次数: 0

A fast and accurate per-cell dynamic IR-drop estimation method for at-speed scan test pattern validation 一种快速准确的逐单元动态红外降估计方法，用于高速扫描测试模式验证

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401549

Yuta Yamato, T. Yoneda, K. Hatayama, M. Inoue

引用次数: 23