2012 IEEE International Test Conference最新文献

Adaptive test selection for post-silicon timing validation: A data mining approach 后硅时间验证的自适应测试选择:一种数据挖掘方法

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401540

Ming Gao, Peter Lisherness, K. Cheng

引用次数: 2

Radic: A standard-cell-based sensor for on-chip aging and flip-flop metastability measurements Radic:一个基于标准细胞的传感器，用于芯片老化和触发器亚稳态测量

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401593

Xiaoxiao Wang, Dat Tran, S. George, L. Winemberg, N. Ahmed, Steve Palosh, Allan Dobin, M. Tehranipoor

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引用次数: 20

The DFT challenges and solutions for the ARM® Cortex™-A15 Microprocessor ARM®Cortex™-A15微处理器的DFT挑战和解决方案

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401534

T. McLaurin, F. Frederick, R. Slobodnik

引用次数: 13

DC temperature measurements for power gain monitoring in RF power amplifiers 用于射频功率放大器功率增益监测的直流温度测量

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401589

J. Altet, D. Mateo, D. Gómez, X. Perpiñà, M. Vellvehí, X. Jordà

引用次数: 14

On efficient silicon debug with flexible trace interconnection fabric 柔性走线互连结构的高效硅调试

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401539

Xiao Liu, Q. Xu

引用次数: 5

A frequency measurement BIST implementation targeting gigahertz application 一种针对千兆赫应用的频率测量BIST实现

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401588

M. Dubois, E. Foucauld, C. Mounet, S. Dia, Cedric Mayor

引用次数: 1

Algorithm for dramatically improved efficiency in ADC linearity test 显著提高ADC线性度测试效率的算法

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401561

Zhongjun Yu, Degang Chen

引用次数: 37

BS 1149.1 extensions for an online interconnect fault detection and recovery BS 1149.1扩展用于在线互连故障检测和恢复

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401583

Somayeh Sadeghi Kohan, Majid Namaki-Shoushtari, F. Javaheri, Z. Navabi

引用次数: 6

On-chip diagnosis for early-life and wear-out failures 芯片上诊断早期寿命和磨损故障

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401580

Matthew Beckler, R. D. Blanton

引用次数: 12

Driver sharing challenges for DDR4 high-volume testing with ATE 使用ATE进行DDR4大批量测试的驱动程序共享挑战

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI: 10.1109/TEST.2012.6401542

J. Moreira, Marc Moessinger, Koji Sasaki, Takayuki Nakamura

引用次数: 7