利用功能测试抽象在EDA上自动生成系统级功能测试程序

2012 IEEE International Test Conference Pub Date : 2012-11-05 DOI:10.1109/TEST.2012.6401590

Motoo Ueda, Shinichi Ishikawa, Masaru Goishi, Satoru Kitagawa, Hiroshi Araki, Shuichi Inage

{"title":"利用功能测试抽象在EDA上自动生成系统级功能测试程序","authors":"Motoo Ueda, Shinichi Ishikawa, Masaru Goishi, Satoru Kitagawa, Hiroshi Araki, Shuichi Inage","doi":"10.1109/TEST.2012.6401590","DOIUrl":null,"url":null,"abstract":"This paper introduces new capability on System on a Chip (SoC) ATE, called \"Functional Test Abstraction (FTA)\", which allows us to execute an automatically generated system level functional test program from the system level design verification environment. The device under verification and device under test can be a complex SoC which has multiple logic time domains and multiple interfaces of the same or different types.","PeriodicalId":353290,"journal":{"name":"2012 IEEE International Test Conference","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Automated system level functional test program generation on ATE from EDA using Functional Test Abstraction\",\"authors\":\"Motoo Ueda, Shinichi Ishikawa, Masaru Goishi, Satoru Kitagawa, Hiroshi Araki, Shuichi Inage\",\"doi\":\"10.1109/TEST.2012.6401590\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper introduces new capability on System on a Chip (SoC) ATE, called \\\"Functional Test Abstraction (FTA)\\\", which allows us to execute an automatically generated system level functional test program from the system level design verification environment. The device under verification and device under test can be a complex SoC which has multiple logic time domains and multiple interfaces of the same or different types.\",\"PeriodicalId\":353290,\"journal\":{\"name\":\"2012 IEEE International Test Conference\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-11-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2012.6401590\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2012.6401590","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 2

摘要

本文介绍了片上系统(SoC) ATE的新功能，称为“功能测试抽象(FTA)”，它允许我们从系统级设计验证环境中执行自动生成的系统级功能测试程序。被验证器件和被测试器件可以是一个复杂的SoC，具有多个逻辑时域和多个相同或不同类型的接口。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Automated system level functional test program generation on ATE from EDA using Functional Test Abstraction

This paper introduces new capability on System on a Chip (SoC) ATE, called "Functional Test Abstraction (FTA)", which allows us to execute an automatically generated system level functional test program from the system level design verification environment. The device under verification and device under test can be a complex SoC which has multiple logic time domains and multiple interfaces of the same or different types.

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2012 IEEE International Test Conference

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