2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits最新文献

Impact Induced Metal-Crush Failures 冲击引起的金属挤压失效

2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits Pub Date : 2007-07-11 DOI: 10.1109/IPFA.2007.4378086

I. De Wolf, F. Duflos, B. Vandevelde, P. Vercruysse, D. Vanderstraeten

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引用次数: 5

Electrothermal Transport in Carbon Nanostructures 碳纳米结构中的电热输运

2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits Pub Date : 2007-07-11 DOI: 10.1149/1.3203987

Q. Ngo, T. Yamada, K. Gleason, M. Suzuki, H. Kitsuki, A. Cassell, C. Yang

引用次数: 0

Reliability- and Process-Variation Aware Design of VLSI Circuits 超大规模集成电路的可靠性和工艺变化感知设计

2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits Pub Date : 2007-07-11 DOI: 10.1109/IPFA.2007.4378050

M. Alam, K. Kang, B. Paul, K. Roy

引用次数: 32

Optimization of PMOS-triggered SCR devices for on-chip ESD protection in a 0.18-μm CMOS technology 基于0.18 μm CMOS技术的片上ESD保护的pmos触发SCR器件的优化

2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits Pub Date : 2007-07-11 DOI: 10.1109/IPFA.2007.4378093

Shih-Hung Chen, M. Ker

引用次数: 1

Moore's Law: A CMOS Scaling Perspective 摩尔定律:CMOS缩放视角

2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits Pub Date : 2007-07-11 DOI: 10.1109/IPFA.2007.4378049

S. Tyagi

引用次数: 10

Atomic Scale Strain Measurement for Nanoelectronic Devices 纳米电子器件的原子尺度应变测量

2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits Pub Date : 2007-07-11 DOI: 10.1109/IPFA.2007.4378052

C. Tung, K. Pey, Fu Qinrong, B. Fox

引用次数: 0

Failure Analysis of a MEMS Micro-Injector Printing Head MEMS微型喷油器打印头失效分析

2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits Pub Date : 2007-07-11 DOI: 10.1109/IPFA.2007.4378068

In-Yao Lee, Tsung-Ping Hsu, W.W. Wang, Yi Chiu, H. Tang, Fan-Chung Tseng, K. Lee

引用次数: 2

Statistical Analysis of Multi-Censored Electromigration Data using the EM Algorithm 利用EM算法对多截点电迁移数据进行统计分析

2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits Pub Date : 2007-07-11 DOI: 10.1109/IPFA.2007.4378096

N. Raghavan, C. Tan

引用次数: 3

Internal Photoemission Study on Reliability of Ultra-thin Zirconium Oxide Films on Strained-Si 应变硅上超薄氧化锆薄膜可靠性的内光电发射研究

2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits Pub Date : 2007-07-11 DOI: 10.1109/IPFA.2007.4378066

M. Bera, C. Mahata, C. Maiti

引用次数: 4

Mechanism of Bias-Temperature Instability: Results from Positive Gate Stress 偏温不稳定性的机理:来自正栅应力的结果

2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits Pub Date : 2007-07-11 DOI: 10.1109/IPFA.2007.4378065

D. Ang, G. Du, S. Wang

引用次数: 2