超大规模集成电路的可靠性和工艺变化感知设计

2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits Pub Date : 2007-07-11 DOI:10.1109/IPFA.2007.4378050

M. Alam, K. Kang, B. Paul, K. Roy

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引用次数: 32

摘要

我们回顾了对可靠性和工艺变化敏感的VLSI设计的文献，发现一个令人兴奋的研究/应用领域正在迅速成为IC设计的核心主题。用不可靠的元件设计可靠的电路是一个重大的挑战，从现在开始，它可能仍然与所有电路设计相关，因此在这个领域的任何贡献都可能对集成电路的设计哲学产生持久的影响

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Reliability- and Process-Variation Aware Design of VLSI Circuits

We review the literature for reliability- and process-variation aware VLSI design to find that an exciting area of research/application is rapidly emerging as a core topic of IC design. Design of reliable circuits with unreliable component is a significant challenge that is likely to remain relevant for all circuit designs from now on, therefore any contribution in this field is likely to have lasting effect of the design philosophy of integrated circuits

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2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits

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