Reliability- and Process-Variation Aware Design of VLSI Circuits

Abstract

We review the literature for reliability- and process-variation aware VLSI design to find that an exciting area of research/application is rapidly emerging as a core topic of IC design. Design of reliable circuits with unreliable component is a significant challenge that is likely to remain relevant for all circuit designs from now on, therefore any contribution in this field is likely to have lasting effect of the design philosophy of integrated circuits