摩尔定律:CMOS缩放视角

2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits Pub Date : 2007-07-11 DOI:10.1109/IPFA.2007.4378049

S. Tyagi

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引用次数: 10

摘要

在本文中，我们回顾了摩尔定律，强调了业界领先的高性能逻辑65nm CMOS技术的显著特点，并强调了未来的挑战和克服这些挑战的方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Moore's Law: A CMOS Scaling Perspective

In this paper we presented a retrospective on Moore's law, highlighting the salient feature of industry leading 65nm CMOS technology for high performance logic, and highlighted future challenges and approaches to overcome those.

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2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits

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