Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium最新文献_第3页

The effect of defect clustering on test transparency and defect levels 缺陷聚类对测试透明度和缺陷等级的影响

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI: 10.1109/VTEST.1993.313301

A. Singh, C. M. Krishna

引用次数: 2

Classification of bridging faults in CMOS circuits: experimental results and implications for test CMOS电路中桥接故障的分类:实验结果和测试意义

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI: 10.1109/VTEST.1993.313298

S. Midkiff, S. Bollinger

引用次数: 10

On the design for testability of sequential circuits 顺序电路的可测试性设计

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI: 10.1109/VTEST.1993.313334

Xiao Sun, F. Lombardi

引用次数: 2

Error detection, fault location and reconfiguration for 2D mesh processing element arrays for digital signal processing 用于数字信号处理的二维网格处理单元阵列的错误检测、故障定位和重构

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI: 10.1109/VTEST.1993.313308

Guoning Liao

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引用次数: 1

Computer-aided failure analysis of VLSI circuits using I/sub DDQ/ testing 基于I/sub DDQ/测试的VLSI电路计算机辅助失效分析

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI: 10.1109/VTEST.1993.313300

Samir B. Naik, Wojciech Maly

引用次数: 15

Defect-tolerant cache memory design 容错缓存存储器设计

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI: 10.1109/VTEST.1993.313331

Dan Lamet, J. Frenzel

引用次数: 8

LFSR based deterministic hardware for at-speed BIST 基于LFSR的高速BIST确定性硬件

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI: 10.1109/VTEST.1993.313323

B. Vasudevan, D. Ross, M. Gala, K. Watson

引用次数: 20

A distributed BIST control scheme for complex VLSI devices 复杂VLSI器件的分布式BIST控制方案

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI: 10.1109/VTEST.1993.313316

Y. Zorian

引用次数: 606

On the check base selection problem for fast adders 关于快速加法器的校验基选择问题

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI: 10.1109/VTEST.1993.313307

U. Sparmann

引用次数: 20

Evaluation of test generation algorithms 测试生成算法的评估

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI: 10.1109/VTEST.1993.313376

Y. Min, Zhongcheng Li

引用次数: 0