{"title":"On the check base selection problem for fast adders","authors":"U. Sparmann","doi":"10.1109/VTEST.1993.313307","DOIUrl":null,"url":null,"abstract":"Considers the problem of selecting a suitable check base for on-line error detection by residue codes in fast adders. The dependency between structural properties of an adder and its set of possible error values is characterized. Based on this characterization an efficient procedure is developed for testing the appropriateness of a check base for a specific adder.<<ETX>>","PeriodicalId":283218,"journal":{"name":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1993.313307","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 20
Abstract
Considers the problem of selecting a suitable check base for on-line error detection by residue codes in fast adders. The dependency between structural properties of an adder and its set of possible error values is characterized. Based on this characterization an efficient procedure is developed for testing the appropriateness of a check base for a specific adder.<>