Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium最新文献_第6页

Quiescent current estimation based on quality requirements 基于质量要求的静态电流估计

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI: 10.1109/VTEST.1993.313311

F. Vargas, M. Nicolaidis, B. Hamdi

引用次数: 5

Partial scan testing with single clock control 部分扫描测试与单时钟控制

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI: 10.1109/VTEST.1993.313365

V. Agrawal, T. Chakraborty

引用次数: 1

Generation of testable designs from behavioral descriptions using high level synthesis tools 使用高级综合工具从行为描述生成可测试的设计

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI: 10.1109/VTEST.1993.313337

K. K. Varma, P. Vishakantaiah, J. Abraham

引用次数: 8

On parallel switch level fault simulation 对并联开关级故障进行仿真

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI: 10.1109/VTEST.1993.313375

C. A. Ryan, J. Tront

引用次数: 9

Testability preserving Boolean transforms for logic synthesis 逻辑综合中保持布尔变换可测试性

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI: 10.1109/VTEST.1993.313336

S. Kundu, A. Pramanick

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引用次数: 5

A new built-in self-test method based on prestored testing 一种基于预存储测试的内置自检方法

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI: 10.1109/VTEST.1993.313315

G. Edirisooriya, S. Edirisooriya, John P. Robinson

引用次数: 3

Automatic synthesis of DUT board circuits for testing of mixed signal ICs 用于测试混合信号集成电路的自动合成测试电路板电路

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI: 10.1109/VTEST.1993.313319

W. Kao, J. Xia

引用次数: 8

CCSTG: an efficient test pattern generator for sequential circuits CCSTG:一个有效的顺序电路测试模式发生器

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI: 10.1109/VTEST.1993.313304

Kyuchull Kim, K. Saluja

引用次数: 0