Generation of testable designs from behavioral descriptions using high level synthesis tools

K. K. Varma, P. Vishakantaiah, J. Abraham
{"title":"Generation of testable designs from behavioral descriptions using high level synthesis tools","authors":"K. K. Varma, P. Vishakantaiah, J. Abraham","doi":"10.1109/VTEST.1993.313337","DOIUrl":null,"url":null,"abstract":"Develops a synthesis-for-testability procedure wherein behavioral modeling techniques are used to generate testable designs. Knowledge about the accessibility of embedded modules is extracted from the behavioral design, analyzed, and any modification required subsequently incorporated in the behavioral design. Results show that when the resulting testable circuit is synthesized from this modified design using a high level synthesis tool, the overhead for testability is quite small, especially for large circuits.<<ETX>>","PeriodicalId":283218,"journal":{"name":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","volume":"95 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1993.313337","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

Abstract

Develops a synthesis-for-testability procedure wherein behavioral modeling techniques are used to generate testable designs. Knowledge about the accessibility of embedded modules is extracted from the behavioral design, analyzed, and any modification required subsequently incorporated in the behavioral design. Results show that when the resulting testable circuit is synthesized from this modified design using a high level synthesis tool, the overhead for testability is quite small, especially for large circuits.<>
使用高级综合工具从行为描述生成可测试的设计
开发可测试性合成程序,其中使用行为建模技术生成可测试的设计。从行为设计中提取关于嵌入式模块的可访问性的知识,进行分析,然后将所需的任何修改合并到行为设计中。结果表明,当使用高级合成工具从改进的设计合成得到的可测试电路时,可测试性的开销非常小,特别是对于大型电路。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信