{"title":"基于LFSR的高速BIST确定性硬件","authors":"B. Vasudevan, D. Ross, M. Gala, K. Watson","doi":"10.1109/VTEST.1993.313323","DOIUrl":null,"url":null,"abstract":"A deterministic test pattern generator for BIST, based on linear feedback shift registers is discussed. A method of designing the test pattern generator in order that it generates deterministic as well as pseudo random patterns is presented. One application of this method is illustrated where deterministic at-speed testing of C-testable ILAs, covering all possible single and multiple combinational faults is achieved. Response analysers are discussed including one with zero aliasing probability. The algorithms for synthesizing the small amount of BIST hardware are explained.<<ETX>>","PeriodicalId":283218,"journal":{"name":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":"{\"title\":\"LFSR based deterministic hardware for at-speed BIST\",\"authors\":\"B. Vasudevan, D. Ross, M. Gala, K. Watson\",\"doi\":\"10.1109/VTEST.1993.313323\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A deterministic test pattern generator for BIST, based on linear feedback shift registers is discussed. A method of designing the test pattern generator in order that it generates deterministic as well as pseudo random patterns is presented. One application of this method is illustrated where deterministic at-speed testing of C-testable ILAs, covering all possible single and multiple combinational faults is achieved. Response analysers are discussed including one with zero aliasing probability. The algorithms for synthesizing the small amount of BIST hardware are explained.<<ETX>>\",\"PeriodicalId\":283218,\"journal\":{\"name\":\"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium\",\"volume\":\"22 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-04-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"20\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.1993.313323\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1993.313323","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
LFSR based deterministic hardware for at-speed BIST
A deterministic test pattern generator for BIST, based on linear feedback shift registers is discussed. A method of designing the test pattern generator in order that it generates deterministic as well as pseudo random patterns is presented. One application of this method is illustrated where deterministic at-speed testing of C-testable ILAs, covering all possible single and multiple combinational faults is achieved. Response analysers are discussed including one with zero aliasing probability. The algorithms for synthesizing the small amount of BIST hardware are explained.<>
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
