Computer-aided failure analysis of VLSI circuits using I/sub DDQ/ testing

Abstract

A new approach to IC diagnosis, based on realistic defect modelling, has been recently proposed. Algorithms have been devised to generate 'good' diagnostic test sets. In this paper, the authors demonstrate that high levels of diagnostic resolution can be obtained for CMOS random logic, especially when abnormal I/sub DDQ/ current measurements are monitored in addition to circuit output voltages.<>