CMOS电路中桥接故障的分类:实验结果和测试意义

Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium Pub Date : 1993-04-06 DOI:10.1109/VTEST.1993.313298

S. Midkiff, S. Bollinger

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引用次数: 10

摘要

研究了CMOS集成电路中物理实际故障与测试生成和测试质量之间的联系。本文介绍了一组CMOS电路中确定可能桥接故障的电感故障分析实验的过程和结果。讨论了结果对物理真实故障的测试生成和故障覆盖的意义

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Classification of bridging faults in CMOS circuits: experimental results and implications for test

Investigates linkages between physically realistic faults in CMOS integrated circuits and test generation and test quality. The procedure and results for an inductive fault analysis experiment that determined likely bridging faults in a set of CMOS circuits are presented. The implications of the results on test generation for physically realistic faults and on fault coverage are discussed.<>

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Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium

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