1991, Proceedings. International Test Conference最新文献_第3页

TWO-STAGE FAULT LOCATION 两级故障定位

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519762

P. Ryan, S. Rawat, W. Fuchs

引用次数: 80

PROGRAMMING FOR PARALLEL PATTERN GENERATORS 并行模式生成器编程

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519775

M. Kanzaki, M. Ishida

引用次数: 1

REAL-TIME DATA COMPARISON FOR GIGAHERTZ DIGITAL TEST 千兆赫数字测试的实时数据比较

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519744

D. Keezer

引用次数: 17

A 20 BIT WAVEFORM SOURCE FOR A MIXED-SIGNAL AUTOMATIC TEST SYSTEM 用于混合信号自动测试系统的20位波形源

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519773

D. Rosenthal

引用次数: 0

DISTRACTIONS IN DESIGN FOR TESTABILITY AND BUILT-IN SELF-TEST 可测试性和内置自测设计中的干扰

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519787

C. Stroud

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引用次数: 1

FAULT MODELING AND TESTING OF GaAs STATIC RANDOM ACCESS MEMORIES 砷化镓静态随机存取存储器的故障建模与测试

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519731

S. Mohan, P. Mazumder

引用次数: 1

STUCK FAULT AND CURRENT TESTING COMPARISON USING CMOS CHIP TEST 用cmos芯片测试卡故障和电流测试比较

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519523

T. Storey, W. Maly, J. Andrews, M. Miske

引用次数: 89

FAST SIGNATURE COMPUTATION FOR LINEAR COMPACTORS 线性压缩器的快速签名计算

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519746

D. Lambidonis, A. Ivanov, V. Agarwal

引用次数: 12

TWO FAULT INJECTION TECHNIQUES FOR TEST OF FAULT HANDLING MECHANISMS 测试故障处理机制的两种故障注入技术

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519504

J. Karlsson, U. Gunneflo, P. Lidén, J. Torin

引用次数: 47

Low overhead built-in testable error detection and correction with excellent fault coverage 低开销内置可测试的错误检测和纠正，具有良好的故障覆盖率

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519900

M. Katoozi, Arnold Nordsiek

引用次数: 1