{"title":"FAST SIGNATURE COMPUTATION FOR LINEAR COMPACTORS","authors":"D. Lambidonis, A. Ivanov, V. Agarwal","doi":"10.1109/TEST.1991.519746","DOIUrl":null,"url":null,"abstract":"Compaction simulation time is a costly (CPU) process when performing fault simulation of BIST circuits. In this paper, we present a compaction simulation algorithm for linear compactors. Basic look-up operations are used to reduce compaction time significantly and memory requirements for the tables are small. With this algorithm, the compaction of an M-bit sequence by a k-bit linear compactor requires M + s2 7 k-bit words of memory where s, 1 and m can be any value such that T and f are integers, and where pAerr is the proportion of errors in the signature and pRSrr the proportion of errors in the CUT’S response. Both pRSTr and pAeTr range between [0,1]. However, for a large proportion of faults in a CUT, the detection probabilities are low, making pAS7? and pR,?? low as well. Simulation results demonstrating the speed of the compaction algorithm are given. + s pR.,, ) + operations and 12 x(‘ P A s r t","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519746","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12
Abstract
Compaction simulation time is a costly (CPU) process when performing fault simulation of BIST circuits. In this paper, we present a compaction simulation algorithm for linear compactors. Basic look-up operations are used to reduce compaction time significantly and memory requirements for the tables are small. With this algorithm, the compaction of an M-bit sequence by a k-bit linear compactor requires M + s2 7 k-bit words of memory where s, 1 and m can be any value such that T and f are integers, and where pAerr is the proportion of errors in the signature and pRSrr the proportion of errors in the CUT’S response. Both pRSTr and pAeTr range between [0,1]. However, for a large proportion of faults in a CUT, the detection probabilities are low, making pAS7? and pR,?? low as well. Simulation results demonstrating the speed of the compaction algorithm are given. + s pR.,, ) + operations and 12 x(‘ P A s r t
在对BIST电路进行故障仿真时,压缩仿真时间是一个昂贵的(CPU)过程。本文提出了一种线性压实机的压实仿真算法。使用基本的查找操作可以显著减少压缩时间,并且表的内存需求很小。使用该算法,k位线性压缩器压缩M位序列需要M + s2 7个k位的内存字,其中s, 1和M可以是任意值,使得T和f是整数,其中pAerr是签名中的错误比例,pRSrr是CUT响应中的错误比例。pRSTr和pAeTr的取值范围为[0,1]。然而,对于一个CUT中很大比例的故障,检测概率很低,使得pAS7?和公关,? ?也很低。仿真结果表明了压缩算法的速度。+ s pR.,,) +运算和12x (' pa ' s r t