{"title":"用于混合信号自动测试系统的20位波形源","authors":"D. Rosenthal","doi":"10.1109/TEST.1991.519773","DOIUrl":null,"url":null,"abstract":"A 20 bit waveform source capable of producing waveforms for both ac anid dc testing of up to 18 bit analog to digital converters is described. Noise shaping technoliogy is ernployed in this design.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A 20 BIT WAVEFORM SOURCE FOR A MIXED-SIGNAL AUTOMATIC TEST SYSTEM\",\"authors\":\"D. Rosenthal\",\"doi\":\"10.1109/TEST.1991.519773\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A 20 bit waveform source capable of producing waveforms for both ac anid dc testing of up to 18 bit analog to digital converters is described. Noise shaping technoliogy is ernployed in this design.\",\"PeriodicalId\":272630,\"journal\":{\"name\":\"1991, Proceedings. International Test Conference\",\"volume\":\"39 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1991, Proceedings. International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1991.519773\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519773","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 20 BIT WAVEFORM SOURCE FOR A MIXED-SIGNAL AUTOMATIC TEST SYSTEM
A 20 bit waveform source capable of producing waveforms for both ac anid dc testing of up to 18 bit analog to digital converters is described. Noise shaping technoliogy is ernployed in this design.