{"title":"A 20 BIT WAVEFORM SOURCE FOR A MIXED-SIGNAL AUTOMATIC TEST SYSTEM","authors":"D. Rosenthal","doi":"10.1109/TEST.1991.519773","DOIUrl":null,"url":null,"abstract":"A 20 bit waveform source capable of producing waveforms for both ac anid dc testing of up to 18 bit analog to digital converters is described. Noise shaping technoliogy is ernployed in this design.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519773","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A 20 bit waveform source capable of producing waveforms for both ac anid dc testing of up to 18 bit analog to digital converters is described. Noise shaping technoliogy is ernployed in this design.