1991, Proceedings. International Test Conference最新文献_第10页

CONCURRENT ERROR DETECTION IN LINEAR ANALOG AND SWITCHED-CAPACITOR STATE VARIABLE SYSTEMS USING CONT 基于控制的线性模拟和开关电容状态变量系统并发误差检测

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519721

A. Chatterjee

引用次数: 11

Minimal Test Sets for Combinational Circuits 组合电路的最小测试集

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519511

G. Tromp

引用次数: 66

Test Propagation Through Modules and Circuits 通过模块和电路测试传播

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519740

B. Murray, J. Hayes

引用次数: 29

CONCURRENT ERROR DETECTION FOR RESTRICTED FAULT SETS IN SEQUENTIAL CIRCUITS AND MICROPROGRAMMED CONT 顺序电路和微程序控制中限制故障集的并发错误检测

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519758

Lawrence P. Holmquist, L. Kinney

引用次数: 2

Looking for Functional Fault Equivalence 寻找功能故障等价

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519751

A. Lioy

引用次数: 10

THE EFFECT OF DIFFERENT TEST SETS ON QUALITY LEVEL PREDICTION: WHEN IS 80% BETTER THAN 90%? 不同测试集对质量水平预测的影响:何时80%优于90%?

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519695

P. Maxwell, R. Aitken, V. Johansen, I. Chiang

引用次数: 182

A CONCURRENT TEST ARCHITECTURE FOR MASSIVELY-PARALLEL COMPUTERS AND ITS ERROR DETECTION CAPABILITY 面向大规模并行计算机的并发测试体系结构及其错误检测能力

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519741

M. Hâncu, K. Iwasaki, Yuji Sato, M. Sugie

引用次数: 2

STATISTICAL PRODUCT MONITORING: A POWERFUL TOOL FOR QUALITY IMPROVEMENT 统计产品监控:质量改进的有力工具

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519706

Barbara Cole, G. Herzog, P. Ngo, S. Hinkle, Peter Sherry

引用次数: 3

THE BEHAVIOR AND TESTING IMPLICATIONS OF CMOS IC LOGIC GATE OPEN CIRCUITS cmos IC逻辑门开路电路的性能及测试意义

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519522

C. Henderson, J. Soden, C. Hawkins

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引用次数: 94

Built-in-self-test considerations in a high-performance, general-purpose processor 高性能通用处理器中的内置自检注意事项

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519489

S. Sarma

引用次数: 0