1991, Proceedings. International Test Conference最新文献_第10页

ON THE INTEGRATION OF DESIGN AND MANUFACTURING FOR IMPROVED TESTABILITY 设计与制造一体化以提高可测试性

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519516

R. Makki, K. Daneshvar, F. Tranjan, Richard Greene

引用次数: 0

ON TEST GENERATION FOR I/sub DDQ/ TESTING OF BRIDGING FAULTS IN CMOS CIRCUITS CMOS电路中I/sub DDQ/桥接故障测试的测试生成

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519723

S. Bollinger, S. Midkiff

引用次数: 32

The enVision Timing Resolver enVision定时解析器

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519767

D. Organ

引用次数: 3

CURRENT VS. LOGIC TESTING OF GATE OXIDE SHORT, FLOATING GATE AND BRIDGING FAILURES IN CMOS cmos中栅极氧化物短路、浮栅和桥接故障的电流与逻辑测试

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519713

R. Rodríguez-Montañés, J. Segura, V. Champac, J. Figueras, J. A. Rubio

引用次数: 101

THE BEHAVIOR AND TESTING IMPLICATIONS OF CMOS IC LOGIC GATE OPEN CIRCUITS cmos IC逻辑门开路电路的性能及测试意义

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519522

C. Henderson, J. Soden, C. Hawkins

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引用次数: 94

Built-in-self-test considerations in a high-performance, general-purpose processor 高性能通用处理器中的内置自检注意事项

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519489

S. Sarma

引用次数: 0

A DENSELY INTEGRATED HIGH PERFORMANCE CMOS TESTER 密集集成的高性能cmos测试仪

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519703

Gary J. Lesmeister

引用次数: 0

THE EFFECT OF DIFFERENT TEST SETS ON QUALITY LEVEL PREDICTION: WHEN IS 80% BETTER THAN 90%? 不同测试集对质量水平预测的影响:何时80%优于90%?

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519695

P. Maxwell, R. Aitken, V. Johansen, I. Chiang

引用次数: 182

A CONCURRENT TEST ARCHITECTURE FOR MASSIVELY-PARALLEL COMPUTERS AND ITS ERROR DETECTION CAPABILITY 面向大规模并行计算机的并发测试体系结构及其错误检测能力

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519741

M. Hâncu, K. Iwasaki, Yuji Sato, M. Sugie

引用次数: 2

AN ADDRESS MASKABLE PARALLEL TESTING FOR ULTRA HIGH DENSITY DRAMS 一种用于超高密度dram的地址屏蔽并行测试

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI: 10.1109/TEST.1991.519718

Y. Morooka, S. Mori, H. Miyamoto, M. Yamada

引用次数: 9