不同测试集对质量水平预测的影响:何时80%优于90%?

1991, Proceedings. International Test Conference Pub Date : 1991-10-26 DOI:10.1109/TEST.1991.519695

P. Maxwell, R. Aitken, V. Johansen, I. Chiang

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引用次数: 182

摘要

本文讨论了将滞留故障覆盖率作为确定质量水平的一种手段。通过功能测试和扫描测试对零件数据进行了分析，并与现有的三种理论进行了比较。结果表明，对功能测试的质量水平进行合理的预测是可能的，但扫描测试产生的质量水平明显低于预期，缺陷的明显聚类导致故障覆盖率低于99%的质量水平非常好。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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THE EFFECT OF DIFFERENT TEST SETS ON QUALITY LEVEL PREDICTION: WHEN IS 80% BETTER THAN 90%?

This paper discusses the use of stuck-at fault coverage as a means of determining quality levels. Data from a part tested with both functional and scan tests is analyzed and compared to three existing theories. It is shown that reasonable predictions of quality level are possible for the functional tests, but that scan tests produce significantly worse quality levels than predicted, Apparent clustering of defects resulted in very good quality levels for fault coverages less than 99%.

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来源期刊

1991, Proceedings. International Test Conference

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