{"title":"顺序电路和微程序控制中限制故障集的并发错误检测","authors":"Lawrence P. Holmquist, L. Kinney","doi":"10.1109/TEST.1991.519758","DOIUrl":null,"url":null,"abstract":"A methodology is developed using convolutional codes for on-line detection of sequencing errors in sequential circuits induced by any given set of transient faults. Key outputs are added to the machine. In the casc of microprogrammed control units, key bits are appended to each microinstruction. The keys are chosen such that all sequences of key outputs are code sequences in a convolutional code. Using an error-detecting decoder for the code, all transient sequencing errors resulting from faults in the fault set can be detected with latency not exceeding the latency distance of the convolutional code.","PeriodicalId":272630,"journal":{"name":"1991, Proceedings. International Test Conference","volume":"91 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"CONCURRENT ERROR DETECTION FOR RESTRICTED FAULT SETS IN SEQUENTIAL CIRCUITS AND MICROPROGRAMMED CONT\",\"authors\":\"Lawrence P. Holmquist, L. Kinney\",\"doi\":\"10.1109/TEST.1991.519758\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A methodology is developed using convolutional codes for on-line detection of sequencing errors in sequential circuits induced by any given set of transient faults. Key outputs are added to the machine. In the casc of microprogrammed control units, key bits are appended to each microinstruction. The keys are chosen such that all sequences of key outputs are code sequences in a convolutional code. Using an error-detecting decoder for the code, all transient sequencing errors resulting from faults in the fault set can be detected with latency not exceeding the latency distance of the convolutional code.\",\"PeriodicalId\":272630,\"journal\":{\"name\":\"1991, Proceedings. International Test Conference\",\"volume\":\"91 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1991, Proceedings. International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1991.519758\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991, Proceedings. International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1991.519758","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
CONCURRENT ERROR DETECTION FOR RESTRICTED FAULT SETS IN SEQUENTIAL CIRCUITS AND MICROPROGRAMMED CONT
A methodology is developed using convolutional codes for on-line detection of sequencing errors in sequential circuits induced by any given set of transient faults. Key outputs are added to the machine. In the casc of microprogrammed control units, key bits are appended to each microinstruction. The keys are chosen such that all sequences of key outputs are code sequences in a convolutional code. Using an error-detecting decoder for the code, all transient sequencing errors resulting from faults in the fault set can be detected with latency not exceeding the latency distance of the convolutional code.