STATISTICAL PRODUCT MONITORING: A POWERFUL TOOL FOR QUALITY IMPROVEMENT

Abstract

As the quality of integrated circuits has improved Statistical Product Monitoring, an over the last several years to 100 DPPM or less, it is no longer practical-for high volume users of low innovative test strategy, based on variables DPPM devices to rely on direct product testing to data collection, environmental stress control the quality of devices going into their products. This - paper reviews the use of screening, and statistical process control Statistical Product Monitoring (SPM) of significant component electrical parameters, to techniques, permits the development of develop a component quality strategy. The role of improved quality and reliability programs. While existing quality and reliability SPM in supplier qualification, selection, and continuous supplier monitoring is discussed. Practical examples from an on-line SPM system programs are used to determine the initial will be presented.