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2009 73rd ARFTG Microwave Measurement Conference最新文献

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Pulsed multi-tone measurements for time domain load pull characterizations of power transistors 功率晶体管时域负载拉特性的脉冲多音测量
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278072
F. de Groote, P. Roblin, Y. Ko, Chieh-Kai Yang, S. Doo, M. Bossche, J. Teyssier
{"title":"Pulsed multi-tone measurements for time domain load pull characterizations of power transistors","authors":"F. de Groote, P. Roblin, Y. Ko, Chieh-Kai Yang, S. Doo, M. Bossche, J. Teyssier","doi":"10.1109/ARFTG.2009.5278072","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278072","url":null,"abstract":"Real-time active load-pull (RTALP) characterization of power transistors with a large signal network analyzer (LSNA) has the benefit of greatly accelerating the design of power amplifiers. However RTALP has been so far limited to devices operating under CW excitations and constant biasing and was therefore mostly applicable to transistors with small memory effects. In TDMA communication or radar systems, amplifiers are excited by pulsed or modulated RF signals and operate under pulsed biasing. For such applications the measurement of modulated/pulsed RF signals under pulsed biasing/RF conditions is required for a more realistic understanding of the behavior of transistors with memory effects. This paper demonstrates that under appropriate conditions it is possible to effectively combine these two excitation modes while performing large-signal measurement by sub-sampling down-conversion with a LSNA. In this demonstration, the acquisition of CW two-tone and three-tone excitations is performed using multiple-recording with pulse duty rate of 1.5% and 0.15%. The pulse-recorded measurements for the three-tone excitation are found to be consistent with CW measurements (100% duty rate). This preliminary work indicates that either intermodulation or real-time active load-pull measurements under pulsed operation can be readily realized for RF samplers with sufficiently short settling time while operating under pulsed RF modulation.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124870789","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
Non-linear effects and the use of network analyzer time domain 非线性效应和时域网络分析仪的使用
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278075
J. Martens
{"title":"Non-linear effects and the use of network analyzer time domain","authors":"J. Martens","doi":"10.1109/ARFTG.2009.5278075","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278075","url":null,"abstract":"While normally considered a tool for evaluating passive networks, vector network analyzer time domain can sometimes be of interest for active and semi-linear device analysis. The identification of sequential match compression in a multi-stage structure and the analysis of bias network-related delay anomalies are among the diagnostics available. The approach is not without its hazards, however, as defect shielding effects become more complicated and the VNA's own compression behavior can be critical. The effects of these behaviors will be analyzed semi-quantitatively and a number of example measurements will be presented.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"201 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133902976","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Second-order error correction of a calibrated two-port vector network analyzer 校正后的双端口矢量网络分析仪的二阶误差校正
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278080
R. Judaschke, G. Wubbeler, C. Elster
{"title":"Second-order error correction of a calibrated two-port vector network analyzer","authors":"R. Judaschke, G. Wubbeler, C. Elster","doi":"10.1109/ARFTG.2009.5278080","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278080","url":null,"abstract":"A technique for second-order correction of the system error parameters of a calibrated two-port vector network analyzer (VNA) is described. The method is based on the determination of the complex-valued residual directivity, source match, and reflection tracking by one single reflection measurement at both ports employing a high precision airline terminated by a short. From one additional measurement of the through connection applying partly corrected system error parameters, the second-order corrected transmission tracking and the load match in both directions are calculated. Thus, a complete set of second-order corrected error model parameters is determined resulting in an accuracy enhancement. Furthermore, the differences between first- and second-order error parameters give a measure for the quality of the VNA calibration performed beforehand. Measurement results for a 10-dB attenuator are given and compared with data resulting from reference attenuation measurements.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"73 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127247336","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Multi-line TRL calibration compared to a general de-embedding method 多线TRL校准与一般去嵌入方法比较
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278070
M. Ferndahl, K. Andersson, C. Fager
{"title":"Multi-line TRL calibration compared to a general de-embedding method","authors":"M. Ferndahl, K. Andersson, C. Fager","doi":"10.1109/ARFTG.2009.5278070","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278070","url":null,"abstract":"A direct comparison between a newly proposed general equivalent-circuit-based de-embedding method and a multi-line TRL calibration is presented. It is shown that the de-embedding method yields corrected/ intrinsic S-parameters with good accuracy when compared to the calibration, even up to 100 GHz hence, validating the de-embedding method. Furthermore, in the de-embedding, different equivalent-circuit models with varying complexity for the embedding network are compared and evaluated.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115522949","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Practical applications of nonlinear measurements 非线性测量的实际应用
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278060
K. Remley
{"title":"Practical applications of nonlinear measurements","authors":"K. Remley","doi":"10.1109/ARFTG.2009.5278060","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278060","url":null,"abstract":"We contrast linear, VNA-based measurements, involving ratios of the magnitude and phase of individual frequency components, to measurements of nonlinear devices and circuits, where the relative phase between frequency components and the actual impedance in which a device is embedded are important. The architectures and calibration techniques for several types of instruments designed to satisfy these requirements are presented and compared. Examples of the use of these instruments for measurement and model development of nonlinear circuits are presented.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132146597","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Improved permittivity measurement of dielectric substrates by use of the TE111 mode of a split-cylinder cavity 利用分柱腔的TE111模式改进介电基片的介电常数测量
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278066
M. Janezic, U. Arz, S. Begley, P. Bartley
{"title":"Improved permittivity measurement of dielectric substrates by use of the TE111 mode of a split-cylinder cavity","authors":"M. Janezic, U. Arz, S. Begley, P. Bartley","doi":"10.1109/ARFTG.2009.5278066","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278066","url":null,"abstract":"We use the split-cylinder cavity's TE111 resonant mode, in addition to the higher-order TE0np modes, to extend the frequency range over which one can nondestructively measure the permittivity of dielectric substrates. In addition to the frequency range of the split-cylinder resonator, we also demonstrate that measurements performed with the TE111 mode allow us to calculate the frequency of the higher-order TE0np resonant modes, thus reducing mode-identification errors. We compare relative permittivity measurements of several low-loss dielectric substrates using both the TE111 and the higher-order TE0np modes and employ the Monte Carlo method to calculate the measurement uncertainties.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114150109","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Traceability chart for vector network analyzers from 70 kHz to 70 GHz 从70千赫到70千兆赫矢量网络分析仪的可追溯性图表
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278065
Y. Lee
{"title":"Traceability chart for vector network analyzers from 70 kHz to 70 GHz","authors":"Y. Lee","doi":"10.1109/ARFTG.2009.5278065","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278065","url":null,"abstract":"Metrological traceability is defined as the property of a measurement result whereby the result can be related to a reference through a documented unbroken chain of calibrations, each contributing to the measurement uncertainty.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115499433","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Nonlinear validation of arbitrary load X-parameter and measurement-based device models 任意载荷x参数和基于测量的器件模型的非线性验证
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278063
D. Gunyan, J. Horn, Jianjun Xu, D. Root
{"title":"Nonlinear validation of arbitrary load X-parameter and measurement-based device models","authors":"D. Gunyan, J. Horn, Jianjun Xu, D. Root","doi":"10.1109/ARFTG.2009.5278063","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278063","url":null,"abstract":"X-parameters are the mathematically correct supersets of S-parameters valid for nonlinear (and linear) components under large-signal (and small-signal) conditions. This paper compares a PHD model generated from arbitrary load-dependent measured X-parameters and a measurement-based non-quasi-static device model and validates them against tuned-load measurements. CW, IMD, and ACPR swept-power measurements are compared. The models agree on the simulated device behavior and compare well to validation measurements..","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123150735","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 19
Bursts of Pulses for time domain large signal measurements 用于时域大信号测量的脉冲爆发
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278067
J. Faraj, G. Callet, F. de Groote, J. Verspecht, R. Quéré, J. Teyssier
{"title":"Bursts of Pulses for time domain large signal measurements","authors":"J. Faraj, G. Callet, F. de Groote, J. Verspecht, R. Quéré, J. Teyssier","doi":"10.1109/ARFTG.2009.5278067","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278067","url":null,"abstract":"An enhanced pulsed mode for RF measurements based on synchronized repetitive signals is proposed, with the unique capability to manage repetitive sets of pulses and consequently to investigate the pulse-to-pulse behavior of high power active devices. This new technology is applied to a sampler-based NVNA (Nonlinear Vector Network Analyzers), without any dynamical losses. Burst of Pulses measurements of high power AlGaN/GaN transistors are performed in a multi-harmonic passive load-pull environment. Time domain waveforms and S21 pulse-to-pulse phase within the burst are acquired and discussed.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130493485","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
Traceability to national standards for S-parameter measurements of waveguide devices from 110 GHz to 170 GHz 110 GHz至170 GHz波导器件s参数测量的国家标准可追溯性
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278079
R. Clarke, R. Pollard, N. Ridler, M. Salter, Alan Wilson
{"title":"Traceability to national standards for S-parameter measurements of waveguide devices from 110 GHz to 170 GHz","authors":"R. Clarke, R. Pollard, N. Ridler, M. Salter, Alan Wilson","doi":"10.1109/ARFTG.2009.5278079","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278079","url":null,"abstract":"This paper describes a new facility that has been introduced recently to provide high precision traceable scattering coefficient measurements of waveguide devices in the frequency range 110 GHz to 170 GHz (i.e. in waveguide size WR-06). The facility comprises measurement instrumentation situated at the University of Leeds and associated primary reference standards provided by the National Physical Laboratory. The instrumentation consists of a Vector Network Analyzer (VNA) and the standards are precision sections of waveguide that are used to calibrate the VNA. Traceability to national standards and the International System of units (SI) is achieved via precision dimensional measurements of the waveguide sections. Typical measurements, with uncertainties, are given to illustrate the current state-of-the-art for traceable measurements of this type.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130385900","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
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