{"title":"Non-linear effects and the use of network analyzer time domain","authors":"J. Martens","doi":"10.1109/ARFTG.2009.5278075","DOIUrl":null,"url":null,"abstract":"While normally considered a tool for evaluating passive networks, vector network analyzer time domain can sometimes be of interest for active and semi-linear device analysis. The identification of sequential match compression in a multi-stage structure and the analysis of bias network-related delay anomalies are among the diagnostics available. The approach is not without its hazards, however, as defect shielding effects become more complicated and the VNA's own compression behavior can be critical. The effects of these behaviors will be analyzed semi-quantitatively and a number of example measurements will be presented.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"201 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 73rd ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2009.5278075","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
While normally considered a tool for evaluating passive networks, vector network analyzer time domain can sometimes be of interest for active and semi-linear device analysis. The identification of sequential match compression in a multi-stage structure and the analysis of bias network-related delay anomalies are among the diagnostics available. The approach is not without its hazards, however, as defect shielding effects become more complicated and the VNA's own compression behavior can be critical. The effects of these behaviors will be analyzed semi-quantitatively and a number of example measurements will be presented.