{"title":"非线性测量的实际应用","authors":"K. Remley","doi":"10.1109/ARFTG.2009.5278060","DOIUrl":null,"url":null,"abstract":"We contrast linear, VNA-based measurements, involving ratios of the magnitude and phase of individual frequency components, to measurements of nonlinear devices and circuits, where the relative phase between frequency components and the actual impedance in which a device is embedded are important. The architectures and calibration techniques for several types of instruments designed to satisfy these requirements are presented and compared. Examples of the use of these instruments for measurement and model development of nonlinear circuits are presented.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"76 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Practical applications of nonlinear measurements\",\"authors\":\"K. Remley\",\"doi\":\"10.1109/ARFTG.2009.5278060\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We contrast linear, VNA-based measurements, involving ratios of the magnitude and phase of individual frequency components, to measurements of nonlinear devices and circuits, where the relative phase between frequency components and the actual impedance in which a device is embedded are important. The architectures and calibration techniques for several types of instruments designed to satisfy these requirements are presented and compared. Examples of the use of these instruments for measurement and model development of nonlinear circuits are presented.\",\"PeriodicalId\":253006,\"journal\":{\"name\":\"2009 73rd ARFTG Microwave Measurement Conference\",\"volume\":\"76 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-06-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 73rd ARFTG Microwave Measurement Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2009.5278060\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 73rd ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2009.5278060","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
We contrast linear, VNA-based measurements, involving ratios of the magnitude and phase of individual frequency components, to measurements of nonlinear devices and circuits, where the relative phase between frequency components and the actual impedance in which a device is embedded are important. The architectures and calibration techniques for several types of instruments designed to satisfy these requirements are presented and compared. Examples of the use of these instruments for measurement and model development of nonlinear circuits are presented.
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