2009 73rd ARFTG Microwave Measurement Conference最新文献

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Modeling the baseband output envelope of a Microwave detector 对微波探测器的基带输出包络线进行建模
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278071
L. Gommé, Y. Rolain, J. Schoukens, R. Pintelon
{"title":"Modeling the baseband output envelope of a Microwave detector","authors":"L. Gommé, Y. Rolain, J. Schoukens, R. Pintelon","doi":"10.1109/ARFTG.2009.5278071","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278071","url":null,"abstract":"The current state-of-the-art for the calibration of wave spectra containing spectral lines that lie on a harmonic grid (f0, 2f0…) relies on the well-established step recovery diode method [1]. The challenge in narrow band modulated measurements resides in the calibration of the instrument's phase distortion for such signals. A crystal detector (HP 420C, [2,3]) is studied as a candidate reference element for the phase calibration of the Large-Signal network analyzer (LSNA) for modulated excitations as the detector translates the envelope of the RF-signal to IF frequencies. A realistic crystal detector itself will introduce phase distortion, hence the identification and validation of a parametric black-box model of the detector was undertaken. In this work a nonlinear feedback model for a crystal detector is constructed: the model contains a low-pass filter in the feedforward path and a Wiener system in the feedback loop. In the first part of the paper the model extraction is discussed. The model is estimated from baseband data and needs to be validated for use with high frequency signals: the model needs to be extrapolated to RF frequencies. Therefore the physical representation of the model structure is translated into its differential equation in section 4. By means of this equation the low frequency output envelope is computed for RF input signals and compared to the measured envelope in section 5.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125445918","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A reformulation of TRL and LRM for S-parameters s参数下TRL和LRM的重新表述
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278083
J. Stenarson, K. Yhland
{"title":"A reformulation of TRL and LRM for S-parameters","authors":"J. Stenarson, K. Yhland","doi":"10.1109/ARFTG.2009.5278083","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278083","url":null,"abstract":"This paper derives the TRL and LRM calibration algorithms using S-parameters instead of the traditional T-parameters. The advantage of this approach is that they do not need separate solutions. Instead LRM becomes an integral part of the TRL algorithm. The expression for the transmission coefficient of the line standard has the surprising property that in many cases the transmission coefficient is obtained directly without a need for a root choice.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"72 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122709244","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
A mixed-signal approach for high-speed fully controlled multidimensional load-pull parameters sweep 高速全控多维载荷-拉力参数扫描的混合信号方法
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278074
M. Squillante, M. Marchetti, M. Spirito, L. D. de Vreede
{"title":"A mixed-signal approach for high-speed fully controlled multidimensional load-pull parameters sweep","authors":"M. Squillante, M. Marchetti, M. Spirito, L. D. de Vreede","doi":"10.1109/ARFTG.2009.5278074","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278074","url":null,"abstract":"A mixed-signal approach for “real-time”, fully-controlled, load-pull parameters sweeps is presented. The proposed approach permits high-speed sweeping of any combination of parameters, e.g. input power and fundamental and/or harmonic source or load termination, enabling at the same time full control of all other source and load terminations provided to the device-under-test. Using this method, a very efficient tool is created for high-speed large-signal device characterization, which can mimic realistic circuit conditions not only for single-tone signals, but also for wide-band complex modulated signals. The capabilities of the realized system are demonstrated by characterizing a NXP Gen 6 LDMOS device.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121287368","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
Applying the calibration comparison technique for verification of transmission line standards on silicon up to 110 GHz 应用校准比对技术对高达110 GHz的硅上传输线标准进行验证
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278064
A. Rumiantsev, P. Corson, S. Sweeney, U. Arz
{"title":"Applying the calibration comparison technique for verification of transmission line standards on silicon up to 110 GHz","authors":"A. Rumiantsev, P. Corson, S. Sweeney, U. Arz","doi":"10.1109/ARFTG.2009.5278064","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278064","url":null,"abstract":"This paper will present the results of extracting the electrical characteristics of planar lines using the calibration comparison method for standards realized in IBM's advanced 0.13 µm CMOS process. For the first time, this method is applied to characterizing the customized standards on silicon up to 110 GHz. Additionally, this paper considers the influences of the reference benchmark calibration standards, included with GaAs reference material RM8130, on the characterization accuracy of silicon wafer-embedded lines at mm-wave frequencies.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"20 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114031374","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 27
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