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VNA Traceability Tool VNA追溯工具
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278059
M. Horibe, M. Shida, K. Komiyama
{"title":"VNA Traceability Tool","authors":"M. Horibe, M. Shida, K. Komiyama","doi":"10.1109/ARFTG.2009.5278059","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278059","url":null,"abstract":"This paper describes the development of a traceability tool for measurements using a vector network analyzer (VNA). This useful tool for one port devices was developed via residual uncertainty evaluations, i.e. post-calibrations, using complex matrix mathematics and conventional software and using three “known” standard devices (TKD) previously calibrated by the National Metrology Institute of Japan (NMIJ). In the procedure the measurement of the TKDs yields three measurands which together with the calibration values of the TKDs, yield residuals (i.e. residual directivity, residual matching and residual tracking) via complex matrix methods in the traceability tool. When applied to a device under test (DUT) the residuals of the resulting measurements are determined and then adjusted. The measurement uncertainties of the DUT are also calculated. With a view to installing the “VNA Traceability Tool” in Japanese industries the NMIJ has validated it in various situations. For example in one configuration open, short and load were used as TKDs and in another three different reflection values (three types of mismatch terminations) were used.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"118 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133008287","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Recommendations for waveguide sizes at submillimeter wavelengths 亚毫米波波导尺寸的建议
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278078
N. Ridler
{"title":"Recommendations for waveguide sizes at submillimeter wavelengths","authors":"N. Ridler","doi":"10.1109/ARFTG.2009.5278078","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278078","url":null,"abstract":"This paper gives recommendations for specifying sizes of rectangular waveguides for use at submillimeter wavelengths (i.e. at frequencies above 300 GHz). The proposed sizes are compatible with both existing waveguide sizes used at millimeter-wave frequencies (to 300 GHz) and the International System of units (SI). Waveguide sizes are developed in detail to 1.1 THz, then these are extended to cover the entire submillimeter-wave band (to 3.3 THz).","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130151831","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Impact of waveguide aperture dimensions and misalignment on the calibrated performance of a network analyzer from 140 to 325GHz 140 ~ 325GHz范围内波导孔径尺寸和不对准对网络分析仪标定性能的影响
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278062
L. B. Lok, S. Singh, A. Wilson, K. Elgaid
{"title":"Impact of waveguide aperture dimensions and misalignment on the calibrated performance of a network analyzer from 140 to 325GHz","authors":"L. B. Lok, S. Singh, A. Wilson, K. Elgaid","doi":"10.1109/ARFTG.2009.5278062","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278062","url":null,"abstract":"We present experimental results from studying the impact of waveguide aperture dimensions and misalignment on the calibrated electrical performance of a vector network analyzer from 140 to 325GHz. It is shown that the calibrated transmission response is not adversely affected by waveguide irregularities or aperture misalignment. In contrast, we observed that the calibrated reflection response is much more sensitive to these mechanical imperfections. Our initial results suggest that waveguide misalignment may have a greater impact on the calibration accuracy of network analyzers operating beyond 140GHz.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"97 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124182219","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
A Nonlinear smooth algorithm for measurements curve of group delay 群延迟测量曲线的非线性光滑算法
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278082
Rui Zhang, Feng Zhou, Long-qing Guo, Nan Wang, Chu Wen-hua
{"title":"A Nonlinear smooth algorithm for measurements curve of group delay","authors":"Rui Zhang, Feng Zhou, Long-qing Guo, Nan Wang, Chu Wen-hua","doi":"10.1109/ARFTG.2009.5278082","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278082","url":null,"abstract":"A new algorithm for smoothing measurement curve is advanced; compare with traditional smoothing algorithm base on rectangular window, the new algorithm can achieve higher degree of smoothness, at the same time distortion caused by smoothness is less, experiment based on measurement curve of filter's group delay proved this method is of better performance.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130716385","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Two-tier L-L de-embedding method for S-parameters measurements of devices mounted in test fixture 测试夹具上安装设备s参数测量的两层L-L去嵌入方法
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278073
J. E. Zuniga-Juarez, J. Reynoso‐Hernández, J. R. Loo-Yau
{"title":"Two-tier L-L de-embedding method for S-parameters measurements of devices mounted in test fixture","authors":"J. E. Zuniga-Juarez, J. Reynoso‐Hernández, J. R. Loo-Yau","doi":"10.1109/ARFTG.2009.5278073","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278073","url":null,"abstract":"By using an indirect method for determining the characteristic impedance of uniform transmission lines embedded in coaxial connectors, a novel two tier L-L de-embedding method is presented. The proposed de-embedding method is suitable for S parameters characterization of GaN HEMTs packaged transistors mounted on a symmetrical and reciprocal test fixture. In addition, the new technique does not presents the limitation exhibited by the Thru-Reflect-Line (TRL) in the low frequency range nor the limitation exhibited by the Thru-Reflect-Match (TRM) in the high frequency range. To validate the new two tier L-L de-embedding method, the S-parameters of a packaged GaN HEMT de-embedded with TRL are used. The good agreement between the DUT S-parameters obtained with both techniques, L-L and the TRL, validates the proposed L-L de-embedding method.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134638316","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
A method for estimating the complex residual errors of a VNA in one-port measurements 一种估计单端口VNA复杂残差的方法
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278068
Jeong-Hwan Kim, Jin-Seob Kang, Dae-Chan Kim
{"title":"A method for estimating the complex residual errors of a VNA in one-port measurements","authors":"Jeong-Hwan Kim, Jin-Seob Kang, Dae-Chan Kim","doi":"10.1109/ARFTG.2009.5278068","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278068","url":null,"abstract":"This paper presents a method using multiple air lines for estimating the complex residual errors of a VNA (Vector Network Analyzer) being calibrated by an ‘OSL’ (Open-Short-Load) technique, which is widely used for one-port measurements. It uses a simple circle fit algorithm, together with some techniques to be used for improving the accuracy in finding the center and radius of a circle in the complex (reflection coefficient) plane from measured calibration data.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"432 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132524214","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Design of inline power sensors and performance evaluation 嵌入式功率传感器的设计与性能评估
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278069
Y. Lee, M. Neumann
{"title":"Design of inline power sensors and performance evaluation","authors":"Y. Lee, M. Neumann","doi":"10.1109/ARFTG.2009.5278069","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278069","url":null,"abstract":"An inline power sensor is used to measure the forward power passing from an RF source to load. It can be used to measure power under operating conditions such as during the installation, maintenance, and monitoring of base station transmitters. This paper is to report an overview of the characterization of key components of Anritsu Company's MA24104A Inline High Power Sensor. The characterization method is based on recommended international standards. A brief description of the architecture and operational principle of the sensor will be presented. Finally, uncertainty budgets based on the measurement model for the inline power measurement are calculated.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127623568","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Wave distorsion in multiplying, switching or sampling mixers 在倍增、切换或采样混频器中的波畸变
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278081
Y. Rolain, J. Dunsmore, J. Schoukens, W. van Moer, G. Vandersteen
{"title":"Wave distorsion in multiplying, switching or sampling mixers","authors":"Y. Rolain, J. Dunsmore, J. Schoukens, W. van Moer, G. Vandersteen","doi":"10.1109/ARFTG.2009.5278081","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278081","url":null,"abstract":"Conceptually, engineers tend to replace mixers by multipliers, controlled switches or samplers. It is clear that these models lead to very different signal processing operations and therefore are in general incompatible. In the special case that the mixers are used as frequency translation devices and one is interested in the first lower or upper conversion band only, the equivalence between these models is shown for general multiple tone input signals. Distortion of the shape of the converted temporal waveforms is shown to occur. Fortunately, this distortion does not jeopardize the measurement results obtained by mixing or sampling waveform measurement front ends as the envelope of the modulated signal is shown to be insensitive to the type of distortion at hand.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"88 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127034222","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
On the High Frequency de-embedding& modeling of FET devices FET器件高频去嵌入及建模研究
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278076
I. Angelov, K. Kanaya, S. Goto, M. Abbasi
{"title":"On the High Frequency de-embedding& modeling of FET devices","authors":"I. Angelov, K. Kanaya, S. Goto, M. Abbasi","doi":"10.1109/ARFTG.2009.5278076","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278076","url":null,"abstract":"At millimetre wave frequencies, de-embedding techniques start to fail due to larger uncertainty in measurements. In this paper, various pads-transistor transitions are being analysed and measured. The usage of measurement versus simulation based characterisation of the embedding layout is evaluated. Applying suggested measuring, modelling extraction procedure, results up to 220 GHz are demonstrated.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"279 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134029030","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
A general purpose microwave power amplifier characterization setup and its phase calibration 一种通用微波功率放大器的特性设置及其相位校准
2009 73rd ARFTG Microwave Measurement Conference Pub Date : 2009-06-12 DOI: 10.1109/ARFTG.2009.5278077
Yilong Shen, J. Gajadharsing, J. Tauritz
{"title":"A general purpose microwave power amplifier characterization setup and its phase calibration","authors":"Yilong Shen, J. Gajadharsing, J. Tauritz","doi":"10.1109/ARFTG.2009.5278077","DOIUrl":"https://doi.org/10.1109/ARFTG.2009.5278077","url":null,"abstract":"A test setup similar in working principle to that of a commercial VSG&VSA combination is presented for the dynamic characterization of microwave power amplifiers (PAs). Features and performance of the setup are discussed. The paper also considers calibration of the phase measurement of such time domain systems based on the concept of nonlinear phase distortion.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114659729","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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