{"title":"利用分柱腔的TE111模式改进介电基片的介电常数测量","authors":"M. Janezic, U. Arz, S. Begley, P. Bartley","doi":"10.1109/ARFTG.2009.5278066","DOIUrl":null,"url":null,"abstract":"We use the split-cylinder cavity's TE111 resonant mode, in addition to the higher-order TE0np modes, to extend the frequency range over which one can nondestructively measure the permittivity of dielectric substrates. In addition to the frequency range of the split-cylinder resonator, we also demonstrate that measurements performed with the TE111 mode allow us to calculate the frequency of the higher-order TE0np resonant modes, thus reducing mode-identification errors. We compare relative permittivity measurements of several low-loss dielectric substrates using both the TE111 and the higher-order TE0np modes and employ the Monte Carlo method to calculate the measurement uncertainties.","PeriodicalId":253006,"journal":{"name":"2009 73rd ARFTG Microwave Measurement Conference","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Improved permittivity measurement of dielectric substrates by use of the TE111 mode of a split-cylinder cavity\",\"authors\":\"M. Janezic, U. Arz, S. Begley, P. Bartley\",\"doi\":\"10.1109/ARFTG.2009.5278066\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We use the split-cylinder cavity's TE111 resonant mode, in addition to the higher-order TE0np modes, to extend the frequency range over which one can nondestructively measure the permittivity of dielectric substrates. In addition to the frequency range of the split-cylinder resonator, we also demonstrate that measurements performed with the TE111 mode allow us to calculate the frequency of the higher-order TE0np resonant modes, thus reducing mode-identification errors. We compare relative permittivity measurements of several low-loss dielectric substrates using both the TE111 and the higher-order TE0np modes and employ the Monte Carlo method to calculate the measurement uncertainties.\",\"PeriodicalId\":253006,\"journal\":{\"name\":\"2009 73rd ARFTG Microwave Measurement Conference\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-06-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 73rd ARFTG Microwave Measurement Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2009.5278066\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 73rd ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2009.5278066","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Improved permittivity measurement of dielectric substrates by use of the TE111 mode of a split-cylinder cavity
We use the split-cylinder cavity's TE111 resonant mode, in addition to the higher-order TE0np modes, to extend the frequency range over which one can nondestructively measure the permittivity of dielectric substrates. In addition to the frequency range of the split-cylinder resonator, we also demonstrate that measurements performed with the TE111 mode allow us to calculate the frequency of the higher-order TE0np resonant modes, thus reducing mode-identification errors. We compare relative permittivity measurements of several low-loss dielectric substrates using both the TE111 and the higher-order TE0np modes and employ the Monte Carlo method to calculate the measurement uncertainties.
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